Method of recovering lithium from batteries
    2.
    发明授权
    Method of recovering lithium from batteries 失效
    从电池中回收锂的方法

    公开(公告)号:US6120927A

    公开(公告)日:2000-09-19

    申请号:US270683

    申请日:1999-03-16

    IPC分类号: C22B7/00 C22B26/12 H01M10/54

    摘要: Disclosed is a method of recovering lithium from a battery containing lithium such as a lithium ion secondary battery. The lithium-containing member of the battery is dissolved with an acidic liquid, and an alkaline material is added to the obtained lithium solution to transform a transition metal which may be dissolved in the lithium solution into a metal hydroxide precipitation, whereby the metal hydroxide precipitate is separated from the lithium solution. The lithium solution is then dried to obtain a solid containing the lithium, and the lithium is eluted from the solid with a non-aqueous solvent. Retrieving lithium from the lithium eluate is accomplished by use of a cation exchanger.

    摘要翻译: 公开了从含有锂的电池如锂离子二次电池中回收锂的方法。 电池用含锂成分用酸性液体溶解,向所得锂溶液中添加碱性物质,将可溶解于锂溶液中的过渡金属转变为金属氢氧化物析出物,由此金属氢氧化物析出 与锂溶液分离。 然后将锂溶液干燥以获得含有锂的固体,并且用非水溶剂从固体中洗脱锂。 从锂洗脱液中回收锂可以通过使用阳离子交换器来实现。

    Impurity concentrator and analyzer
    3.
    发明授权
    Impurity concentrator and analyzer 失效
    杂质浓缩器和分析仪

    公开(公告)号:US5746829A

    公开(公告)日:1998-05-05

    申请号:US711968

    申请日:1996-09-10

    摘要: The invention provides a method for concentrating impurity contained in a semiconductor crystal sample 11 by irradiating repeatedly a specified position of the semiconductor crystal sample 11 with a laser beam having a specified intensity by means of a laser oscillator 13. Then the invention provides a method for analyzing impurity contained in the impurity concentrated area of the semiconductor crystal sample 11 in high sensitivity by means of a specified physical analyzing means. According to demand, a method of the invention concentrates impurity by means of a laser beam after forming an insulating film such as an oxide film and the like transparent to the laser beam on the surface of the semiconductor crystal sample. At the same time, the invention provides a concentrator and an analyzer to be used for these concentrating method and analyzing method.

    摘要翻译: 本发明提供一种通过利用激光振荡器13用具有特定强度的激光束反复照射半导体晶体样品11的指定位置来浓缩包含在半导体晶体样品11中的杂质的方法。本发明提供了一种用于 通过特定的物理分析装置以高灵敏度分析半导体晶体样品11的杂质浓缩区域中所含的杂质。 根据需要,本发明的方法在半导体晶体样品的表面上形成对激光束透明的氧化物膜等绝缘膜之后,通过激光束浓缩杂质。 同时,本发明提供了一种用于这些浓缩方法和分析方法的浓缩器和分析器。