System for evaluating and reporting semiconductor test processes
    2.
    发明授权
    System for evaluating and reporting semiconductor test processes 失效
    用于评估和报告半导体测试过程的系统

    公开(公告)号:US6070131A

    公开(公告)日:2000-05-30

    申请号:US937626

    申请日:1997-09-26

    IPC分类号: G01N37/00 G05B15/00 G06F19/00

    摘要: A system is disclosed for evaluating relevant data across independent test sequences and providing a consumable output to give a tester an accurate account of the test data. A method for reporting the results of the test processes includes several steps. First, repair, trending, characterization, timing and engineering data for two separate test sequences are read. Next, the data is compared. Also, an analytical report of the test data comparisons is assembled and output.

    摘要翻译: 公开了一种用于在独立测试序列之间评估相关数据并提供消耗品输出以给测试者准确记录测试数据的系统。 报告测试过程结果的方法包括几个步骤。 首先,阅读两个单独的测试序列的修复,趋势,表征,时序和工程数据。 接下来,比较数据。 此外,组装并输出测试数据比较的分析报告。

    Board sport simulator and training device

    公开(公告)号:US20060217250A1

    公开(公告)日:2006-09-28

    申请号:US11373231

    申请日:2006-03-10

    申请人: Mike Pearson

    发明人: Mike Pearson

    IPC分类号: A63B22/16

    CPC分类号: A63B69/0093 A63B22/14

    摘要: A balance board-training device made up of a training board, a pivoting device permanently connected to the underside of the training board and a rolling device that is configured and positioned so as to be able to roll across the underside of said training board. In use a rider stands on the upper side of the board or deck. As the rider moves, the one portion of the device pivots upon the dome shaped pivoting mechanism and the other end of the device moves and is able to move both side to side, as well as in a rising and falling motion as the rolling device of the present invention moves beneath the board.

    System for evaluating and reporting semiconductor test processes
    4.
    发明授权
    System for evaluating and reporting semiconductor test processes 有权
    用于评估和报告半导体测试过程的系统

    公开(公告)号:US06256593B1

    公开(公告)日:2001-07-03

    申请号:US09513273

    申请日:2000-02-24

    IPC分类号: G01N3700

    摘要: A system is disclosed for evaluating relevant data across independent test sequences and providing a consumable output to give a tester an accurate account of the test data. A method for reporting the results of the test processes includes several steps. First, repair, trending, characterization, timing and engineering data for two separate test sequences are read. Next, the data is compared. Also, an analytical report of the test data comparisons is assembled and output.

    摘要翻译: 公开了一种用于在独立测试序列之间评估相关数据并提供消耗品输出以给测试者准确记录测试数据的系统。 报告测试过程结果的方法包括几个步骤。 首先,阅读两个单独的测试序列的修复,趋势,表征,时序和工程数据。 接下来,比较数据。 此外,组装并输出测试数据比较的分析报告。

    Method and apparatus for memory array compressed data testing
    5.
    发明授权
    Method and apparatus for memory array compressed data testing 失效
    存储器阵列压缩数据测试的方法和装置

    公开(公告)号:US5935263A

    公开(公告)日:1999-08-10

    申请号:US886195

    申请日:1997-07-01

    摘要: A memory device includes an output data path that transfers data from an I/O circuit coupled to a memory array to an output tri-state buffer. A comparing circuit compares data from the I/O circuit to a desired data pattern. If the data does not match the desired pattern, the comparing circuit outputs an error signal that is input to the output buffer. When the output buffer receives the error signal, the output buffer is disabled and outputs a tri-state condition on a data bus. Since the error signal corresponds to more than one data bit, the tri-state condition of the output buffer is held for more than one tick of the data clock, rather than only a single tick. Consequently, the tri-state condition remains on the bus for sufficiently long that a test system can detect the tri-state condition even at very high clock frequencies.

    摘要翻译: 存储器件包括将数据从耦合到存储器阵列的I / O电路传送到输出三态缓冲器的输出数据路径。 比较电路将来自I / O电路的数据与期望的数据模式进行比较。 如果数据与所需模式不匹配,则比较电路输出输入到输出缓冲器的错误信号。 当输出缓冲器接收到错误信号时,输出缓冲器被禁止,并在数据总线上输出三态条件。 由于误差信号对应于多个数据位,所以输出缓冲器的三态条件保持数据时钟的多于一个刻度,而不是仅一个刻度。 因此,三态条件保持在总线上足够长,使得测试系统即使在非常高的时钟频率也可以检测三态条件。