公开(公告)号：US5541789A

公开(公告)日：1996-07-30

申请号：US450148

申请日：1995-05-26

申请人： Hirotsugu Fukuoka ,  Hiroshi Fukui ,  Mitsuo Suda ,  Yutaka Sugita ,  Kanji Kawakami

发明人： Hirotsugu Fukuoka ,  Hiroshi Fukui ,  Mitsuo Suda ,  Yutaka Sugita ,  Kanji Kawakami

IPC分类号： G11B21/21 ,  G11B5/60 ,  G11B5/48

CPC分类号： G11B5/6005

摘要： A magnetic recording device includes a magnetic disk for storing information, a magnetic head for writing and reading information relative to the magnetic disk, a device for rotating the magnetic disk relative to the magnetic head in such a manner that speed of said magnetic disk relative to the magnetic head is 6 to 40 m/s at an innermost track of the magnetic disk, and a device for applying a load to the magnetic head so that a gap between the magnetic disk and the magnetic head disposed in opposed relation to the magnetic disk can be kept to not more than 0.1 .mu.m.

摘要翻译： 磁记录装置包括用于存储信息的磁盘，用于写入和读取相对于磁盘的信息的磁头，用于使磁盘相对于磁头旋转的装置，使得所述磁盘的速度相对于 磁头在磁盘的最内侧轨道上为6〜40m / s，以及用于向磁头施加负荷使得与磁盘相对设置的磁盘与磁头之间的间隙的装置 可以保持在不超过0.1亩。

公开(公告)号：US5461517A

公开(公告)日：1995-10-24

申请号：US183943

申请日：1994-01-21

申请人： Mitsuo Suda ,  Kazuo Shiiki ,  Masanori Tanabe ,  Shinji Narishige ,  Eiji Nakanishi ,  Kouichi Shimizu ,  Norifumi Miyamoto ,  Hirotsugu Fukuoka

发明人： Mitsuo Suda ,  Kazuo Shiiki ,  Masanori Tanabe ,  Shinji Narishige ,  Eiji Nakanishi ,  Kouichi Shimizu ,  Norifumi Miyamoto ,  Hirotsugu Fukuoka

IPC分类号： G11B5/00 ,  G11B5/012 ,  G11B5/02 ,  G11B5/09 ,  G11B5/31 ,  G11B5/39 ,  G11B19/04 ,  G11B5/03

CPC分类号： G11B19/04 ,  G11B5/012 ,  G11B5/02 ,  G11B2005/0008 ,  G11B5/3113

摘要： In a magnetic disk device having a composite head with an induction type of recording head adjacent a magneto-resistance effect type of reproducing head, a read error relief is provided to relieve read errors caused by Barkhausen Noise or Base Line Shift phenomenon inherent to the magneto-resistance effect type of reproducing head. Upon occurrence of a read error, a re-try function is first executed, and a track offset function is executed for relief of the read error. However, if the read error is not relieved after the offset operation and the re-try operation have been performed a predetermined number of times, then a pseudo write-in and/or read current control operation is performed together with the offset operation and/or re-try operation for a predetermined number of times. The control operation varies the magnetic domain structure in the head magnetic film (MR film). The variation of magnetic field and/or read current in the head magnetic film causes the magnetic domain structure of the head magnetic film to be varied, so that the Barkhausen Noise or the Base Line Shift phenomenon are extinguished.

摘要翻译： 在具有与磁阻效应类型的再现头相邻的具有感应型记录头的复合头的磁盘装置中，提供读取误差缓解以减轻由Barkhausen噪声或基本线移位现象引起的读取误差 电阻效应类型的再现头。 在发生读取错误时，首先执行重试功能，并且执行磁道偏移功能以减轻读取错误。 然而，如果在偏移操作和重试操作已经执行了预定次数之后读取错误不被解除，则伪写入和/或读取电流控制操作与偏移操作和/ 或重新尝试操作预定次数。 控制操作改变磁头磁性膜（MR膜）中的磁畴结构。 头磁性膜中的磁场和/或读取电流的变化导致磁头磁性膜的磁畴结构发生变化，从而使巴克豪森噪声或基线偏移现象消失。

公开(公告)号：US4861398A

公开(公告)日：1989-08-29

申请号：US123278

申请日：1987-11-20

申请人： Hirotsugu Fukuoka ,  Kanji Kawakami ,  Makoto Aihara ,  Mitsuo Suda ,  Kouji Takeshita ,  Yukihiro Isono

发明人： Hirotsugu Fukuoka ,  Kanji Kawakami ,  Makoto Aihara ,  Mitsuo Suda ,  Kouji Takeshita ,  Yukihiro Isono

IPC分类号： G11B5/31 ,  G11B5/455

CPC分类号： G11B5/3166 ,  G11B5/455 ,  Y10T29/49036 ,  Y10T29/49044 ,  Y10T29/49046

摘要： DC bias currents are applied to a conducting wire of a thin film magnetic head to be inspected. When the DC bias currents (I.sub.0, I.sub.1, I.sub.2) are supplied to the conducting wire, the impedances (Z.sub.0, Z.sub.1, Z.sub.2) corresponding to the DC bias currents are measured. When a ratio (.vertline.Z.sub.1 -Z.sub.0 .vertline./.vertline.Z.sub.2 -Z.sub.0 .vertline.) corresponding to an overwrite characteristic (OW) reaches to a predetermined value by lapping tip portions of an upper magnetic layer and a lower magnetic layer of the magnetic head, the lapping process of the magnetic head is finished.

摘要翻译： 将直流偏置电流施加到待检查的薄膜磁头的导线上。 当直流偏置电流（I0，I1，I2）被提供给导线时，测量对应于直流偏置电流的阻抗（Z0，Z1，Z2）。 当通过研磨磁头的上部磁性层和下部磁性层的尖端部分而将与覆盖特性（OW）相对应的比率（| Z1-Z0 | / | Z2-Z0））达到预定值时，研磨 磁头的处理完成。