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公开(公告)号：US20160097726A1
公开(公告)日：2016-04-07
申请号：US14712205
申请日：2015-05-14
申请人： Myoung-ki AHN , Jin-woo AHN , Tae-yong JO , Hyeong-min AHN , Tae-hyoung LEE
发明人： Myoung-ki AHN , Jin-woo AHN , Tae-yong JO , Hyeong-min AHN , Tae-hyoung LEE
IPC分类号： G01N21/88
CPC分类号： G01N21/8806 , G01N21/95 , G01N2021/9513
摘要： A panel inspecting apparatus and method may accurately inspect image quality of a curved portion of a panel with relatively small inspecting cost and time, and the panel inspecting apparatus may have a relatively simple structure. The panel inspecting apparatus includes a support on which a panel is disposed, a mirror corresponding to a curved area of the panel, a lens configured to receive an image from the panel and an image reflected by the mirror and focus the images, and an image sensor configured to capture the images transferred via the lens.
摘要翻译： 面板检查装置和方法可以以相对较小的检查成本和时间精确地检查面板的弯曲部分的图像质量，并且面板检查装置可以具有相对简单的结构。 面板检查装置包括其上设置有面板的支撑件，对应于面板的弯曲区域的镜子，被配置为从面板接收图像的镜头和由镜子反射并且对图像进行聚焦的图像，以及图像 传感器被配置为捕获通过镜头传送的图像。
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公开(公告)号：US20130070334A1
公开(公告)日：2013-03-21
申请号：US13608404
申请日：2012-09-10
申请人： Kwang Soo KIM , Chang Hoon CHOI , In Ho SEO , Hyun Jae LEE , Myoung Ki AHN , Byeong Hwan JEON , Sung Jin LEE
发明人： Kwang Soo KIM , Chang Hoon CHOI , In Ho SEO , Hyun Jae LEE , Myoung Ki AHN , Byeong Hwan JEON , Sung Jin LEE
CPC分类号： G02B21/245 , G02B7/38 , G02B27/106 , G02B27/14
摘要： A focusing device for an optical microscope may include a light emitting unit configured to emit laser light having a specific wavelength, a wedge mirror configured to enable the emitted laser light to be incident on a plurality of locations of a surface of a specimen, first and second light receiving units configured to detect an amount of laser light reflected from the surface of the specimen, a spatial filter configured to eliminate out-of-focus light from light beams reflected from the surface of the specimen and to detect an amount of in-focus light, and a control unit configured to generate a control signal used to carry out focus adjustment of the optical microscope using a plurality of light-amount information detected by the first and second light receiving units and the spatial filter.
摘要翻译： 用于光学显微镜的聚焦装置可以包括被配置为发射具有特定波长的激光的发光单元，配置成使得发射的激光能够入射到样品表面的多个位置的楔形镜，首先和 第二光接收单元，被配置为检测从所述检体的表面反射的激光的量;空间滤波器，被配置为消除从所述样本的表面反射的光束的离焦光， 以及控制单元，被配置为使用由第一和第二光接收单元和空间滤波器检测的多个光量信息产生用于执行光学显微镜的焦点调整的控制信号。
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公开(公告)号：US08873138B2
公开(公告)日：2014-10-28
申请号：US13608404
申请日：2012-09-10
申请人： Kwang Soo Kim , Chang Hoon Choi , In Ho Seo , Hyun Jae Lee , Myoung Ki Ahn , Byeong Hwan Jeon , Sung Jin Lee
发明人： Kwang Soo Kim , Chang Hoon Choi , In Ho Seo , Hyun Jae Lee , Myoung Ki Ahn , Byeong Hwan Jeon , Sung Jin Lee
CPC分类号： G02B21/245 , G02B7/38 , G02B27/106 , G02B27/14
摘要： A focusing device for an optical microscope may include a light emitting unit configured to emit laser light having a specific wavelength, a wedge mirror configured to enable the emitted laser light to be incident on a plurality of locations of a surface of a specimen, first and second light receiving units configured to detect an amount of laser light reflected from the surface of the specimen, a spatial filter configured to eliminate out-of-focus light from light beams reflected from the surface of the specimen and to detect an amount of in-focus light, and a control unit configured to generate a control signal used to carry out focus adjustment of the optical microscope using a plurality of light-amount information detected by the first and second light receiving units and the spatial filter.
摘要翻译： 用于光学显微镜的聚焦装置可以包括被配置为发射具有特定波长的激光的发光单元，配置成使得发射的激光能够入射到样品表面的多个位置的楔形镜，首先和 第二光接收单元，被配置为检测从所述检体的表面反射的激光的量;空间滤波器，被配置为消除从所述样本的表面反射的光束的离焦光， 以及控制单元，被配置为使用由第一和第二光接收单元和空间滤波器检测的多个光量信息产生用于执行光学显微镜的焦点调整的控制信号。
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公开(公告)号：US09759665B2
公开(公告)日：2017-09-12
申请号：US14712205
申请日：2015-05-14
申请人： Myoung-ki Ahn , Jin-woo Ahn , Tae-yong Jo , Hyeong-min Ahn , Tae-hyoung Lee
发明人： Myoung-ki Ahn , Jin-woo Ahn , Tae-yong Jo , Hyeong-min Ahn , Tae-hyoung Lee
CPC分类号： G01N21/8806 , G01N21/95 , G01N2021/9513
摘要： A panel inspecting apparatus and method may accurately inspect image quality of a curved portion of a panel with relatively small inspecting cost and time, and the panel inspecting apparatus may have a relatively simple structure. The panel inspecting apparatus includes a support on which a panel is disposed, a mirror corresponding to a curved area of the panel, a lens configured to receive an image from the panel and an image reflected by the mirror and focus the images, and an image sensor configured to capture the images transferred via the lens.
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