Method and apparatus for checking pattern
    1.
    发明授权
    Method and apparatus for checking pattern 失效
    检查图案的方法和装置

    公开(公告)号:US5048094A

    公开(公告)日:1991-09-10

    申请号:US426574

    申请日:1989-10-24

    摘要: A pattern formed on an object under check such as a mask, printed substrate, etc., is scanned by a CCD camera, and check pattern data for one scanning line obtained from the CCD camera is divided into a plurality of pixel groups and stored in shift register groups. The check pattern data is compared with a master pattern data representing the external shape of a master pattern to calculate an inclination of the check pattern (pattern to be checked) with respect to the master pattern. The order of reading addresses of the shift register groups is changed in accordance with the inclination so that the check pattern data matches the master pattern data. Thereafter, the check pattern data is compared with the master pattern data to detect a defect in the check pattern to thereby avoid erroneous judgment due to an angular deviation between the check pattern and the master pattern.

    摘要翻译: 通过CCD照相机扫描在诸如掩模,印刷基板等的检查下形成的图案上的图案,并且将从CCD照相机获得的一条扫描线的图案数据分成多个像素组并存储在 移位寄存器组。 将检查图案数据与表示主图案的外部形状的主图案数据进行比较,以计算相对于主图案的检查图案(待检查图案)的倾斜度。 根据倾斜度改变移位寄存器组的读取地址的顺序,使得检查图案数据与主图案数据一致。 此后,将检查图案数据与主图案数据进行比较以检测检查图案中的缺陷,从而避免由于检查图案和主图案之间的角度偏差引起的错误判断。