公开(公告)号：US08314725B2

公开(公告)日：2012-11-20

申请号：US12883125

申请日：2010-09-15

Applicant: Paola Zepeda ,  David E. Duarte ,  Gregory F. Taylor ,  Atul Maheshwari

Inventor： Paola Zepeda ,  David E. Duarte ,  Gregory F. Taylor ,  Atul Maheshwari

IPC: H03M1/10

CPC classification number: H03M1/109 ,  H03M1/12

Abstract: In one embodiment, an analog-to-digital conversion in an integrated circuit is evaluated by an on-die testing circuit. For example, the on-die test circuit 370 can characterize one or both of the linearity and monotonicity of the digital-to-analog conversion. The value of a conversion output for a digital input code may be compared to the value of a prior conversion output of a prior step to provide digital difference values for each step of a sweep of digital input codes. Digital difference values may be compared to one or more predetermined limits to provide one or more pass/fail tests on-board the die. Other embodiments are described and claimed.

Abstract translation: 在一个实施例中，通过片上测试电路来评估集成电路中的模数转换。 例如，片上测试电路370可以表征数模转换的线性度和单调性之一或两者。 数字输入代码的转换输出的值可以与先前步骤的先前转换输出的值进行比较，以为扫描数字输入代码的每个步骤提供数字差值。 可以将数字差值与一个或多个预定限制进行比较，以在芯片上提供一个或多个通过/失败测试。 描述和要求保护其他实施例。

公开(公告)号：US20120062401A1

公开(公告)日：2012-03-15

申请号：US12883125

申请日：2010-09-15

Applicant: Paola ZEPEDA ,  David E. DUARTE ,  Gregory F. TAYLOR ,  Atul MAHESHWARI

Inventor： Paola ZEPEDA ,  David E. DUARTE ,  Gregory F. TAYLOR ,  Atul MAHESHWARI

IPC: H03M1/10

CPC classification number: H03M1/109 ,  H03M1/12

Abstract: In one embodiment, an analog-to-digital conversion in an integrated circuit is evaluated by an on-die testing circuit. For example, the on-die test circuit 370 can characterize one or both of the linearity and monotonicity of the digital-to-analog conversion. The value of a conversion output for a digital input code may be compared to the value of a prior conversion output of a prior step to provide digital difference values for each step of a sweep of digital input codes. Digital difference values may be compared to one or more predetermined limits to provide one or more pass/fail tests on-board the die. Other embodiments are described and claimed.

Abstract translation: 在一个实施例中，通过片上测试电路来评估集成电路中的模数转换。 例如，片上测试电路370可以表征数模转换的线性度和单调性之一或两者。 数字输入代码的转换输出的值可以与先前步骤的先前转换输出的值进行比较，以为扫描数字输入代码的每个步骤提供数字差值。 可以将数字差值与一个或多个预定限制进行比较，以在芯片上提供一个或多个通过/失败测试。 描述和要求保护其他实施例。