公开(公告)号：US5119408A

公开(公告)日：1992-06-02

申请号：US607337

申请日：1990-10-31

申请人： Francis H. Little ,  Andrew J. Galish ,  Ralph G. Isaacs

发明人： Francis H. Little ,  Andrew J. Galish ,  Ralph G. Isaacs

IPC分类号： G01N23/04

CPC分类号： G01N23/046 ,  G01N2223/419

摘要： A method for inspecting a component having dimensions larger than a fan beam angle of an x-ray inspection system includes the steps of: providing an x-ray beam having a selected fan angle in a source focal point; positioning a portion of the component substantially completely within the x-ray beam; rotating the component 360 degrees around a component inspection rotational axis; collecting the attenuated x-ray beam that passes through the component during rotation; generating a multiplicity of electrical signals responsive to the collected x-ray beam; incrementally moving the component inspection rotational axis about the x-ray source focal point to position another portion of the component within the x-ray beam; and repeating the steps of rotating the part 360 degrees about a component inspection rotational axis and incrementally moving the part inspection rotational axis about the x-ray source focal point until the entire component has passed through the fan beam.

摘要翻译： 一种用于检查尺寸大于X射线检查系统的扇形束角度的部件的方法包括以下步骤：在源焦点中提供具有选定的扇角的X射线束; 将部件的一部分基本上完全定位在X射线束内; 围绕部件检查旋转轴线旋转部件360度; 收集在旋转期间通过部件的衰减的X射线束; 响应于所收集的x射线束产生多个电信号; 围绕X射线源焦点递增地移动部件检查旋转轴线以将部件的另一部分定位在X射线束内; 并且重复以围绕零件检查旋转轴线旋转部件360度并逐渐移动围绕x射线源焦点的零件检查旋转轴直到整个部件已经通过风扇光束的步骤。

公开(公告)号：US4803639A

公开(公告)日：1989-02-07

申请号：US832511

申请日：1986-02-25

申请人： Douglas S. Steele ,  Larry C. Howington ,  James W. Schuler ,  Joseph J. Sostarich ,  Charles R. Wojciechowski ,  Theodore W. Sippel ,  Joseph M. Portaz ,  Ralph G. Isaacs ,  Henry J. Scudder, III ,  Thomas G. Kincaid ,  Kristina H. V. Hedengren ,  Rudolph A. A. Koegl ,  John P. Keaveney ,  Joseph Czechowski, III ,  John R. Brehm ,  James M. Brown, Jr. ,  David W. Oliver ,  George E. Williams ,  Richard D. Miller

发明人： Douglas S. Steele ,  Larry C. Howington ,  James W. Schuler ,  Joseph J. Sostarich ,  Charles R. Wojciechowski ,  Theodore W. Sippel ,  Joseph M. Portaz ,  Ralph G. Isaacs ,  Henry J. Scudder, III ,  Thomas G. Kincaid ,  Kristina H. V. Hedengren ,  Rudolph A. A. Koegl ,  John P. Keaveney ,  Joseph Czechowski, III ,  John R. Brehm ,  James M. Brown, Jr. ,  David W. Oliver ,  George E. Williams ,  Richard D. Miller

IPC分类号： G01N23/04 ,  G01N23/18 ,  G06T7/00 ,  G06F15/20 ,  G01N23/02

CPC分类号： G06T7/0004 ,  G01N23/18 ,  G06T2207/10121 ,  G06T2207/30164

摘要： An X-ray inspection system for manually or automatically performing digital fluoroscopy inspections and/or computed tomography inspections by X-ray examination of manufactured parts incorporates a computer system which automatically analyzes the inspected parts for flaws. The system includes apparatus for automatically positioning the parts in an X-ray machine for obtaining fluoroscopy and tomography views of the part and for acquiring data from the inspections at production rates. The system automatically identifies the location of rejectable flaws in the parts during the fluoroscopy scanning and subsequently identifies those locations for obtaining tomography scans, if the identified flaw location is questionable. The system can automatically reject parts containing flaws identified during the fluoroscopy inspections. This system operates in a real-time environment by providing analysis of one part while a subsequent part is being subjected to X-ray examination. The data obtained during each examination is archived and stored for tracking the part in further manufacturing processes.

摘要翻译： 用于手动或自动执行数字荧光透视检查和/或通过对制造部件进行X射线检查的计算机断层摄影检查的X射线检查系统包括自动分析被检查部分的缺陷的计算机系统。 该系统包括用于在X射线机中自动定位部件以获得该部件的透视和断层摄影视图并用于以生产率从检查中获取数据的装置。 如果识别出的缺陷位置是有问题的，系统将自动识别在荧光透视扫描期间部件中可排除缺陷的位置，并随后识别用于获取层析成像扫描的位置。 该系统可以自动排除在荧光检查检查期间识别的缺陷的部件。 该系统通过对后续部分进行X射线检查的一部分进行分析，在实时环境中运行。 在每次检查期间获得的数据被存档和存储，用于在进一步的制造过程中跟踪部件。

公开(公告)号：US6041132A

公开(公告)日：2000-03-21

申请号：US902565

申请日：1997-07-29

申请人： Ralph G. Isaacs ,  Joseph M. Portaz

发明人： Ralph G. Isaacs ,  Joseph M. Portaz

IPC分类号： G01N23/04 ,  G01N23/18 ,  G06T1/00 ,  G06T11/00 ,  G06K9/00 ,  A61B6/00

CPC分类号： G06T7/001 ,  G01N23/046 ,  G06T11/008 ,  G01N2223/419 ,  G06T2207/10072 ,  G06T2207/30164

摘要： A method of computed tomographic inspection which uses a Euclidian reference ply model having a corresponding Non-Euclidian ply model which includes reference model plies to extract intensity data from Euclidian slice data (typically having a pixel format) derived from multiple slice X-ray scans using an X-ray scanning system such as the CT system. The multiple slice data is analyzed to determine intensity values for points corresponding to a subject ply of a corresponding reference model ply. The reference model may be a predetermined model such as a mathematically described CAD model file or based on such a CAD model. A preferred method of the present invention includes a transformation of the CAD model data to register the CAD model data to multiple slice data of a standardized object to generate the reference model. Intensity values preferably gray scale pixel values are assigned to points on the reference ply model from the slice data and displayed as a Non-Euclidian image on a monitor.

摘要翻译： 一种使用具有对应的非欧几里德层模型的欧几里德参考层模型的计算机断层摄影检查的方法，该模型包括参考模型层，以从多个切片X射线扫描导出的欧几里得切片数据（通常具有像素格式）提取强度数据， 诸如CT系统的X射线扫描系统。 分析多个切片数据以确定对应于相应参考模型层的主体层的点的强度值。 参考模型可以是诸如数学描述的CAD模型文件或基于这样的CAD模型的预定模型。 本发明的优选方法包括CAD模型数据的变换以将CAD模型数据注册到标准化对象的多个切片数据以生成参考模型。 强度值优选地，灰度像素值从切片数据分配给参考层模型上的点，并在监视器上显示为非欧几里德图像。