Method of applying multi-layer structure onto a curved substrate
    1.
    发明授权
    Method of applying multi-layer structure onto a curved substrate 有权
    将多层结构施加到弯曲基板上的方法

    公开(公告)号:US08262843B2

    公开(公告)日:2012-09-11

    申请号:US12635787

    申请日:2009-12-11

    Applicant: Romain Fayolle

    Inventor: Romain Fayolle

    Abstract: A curved multi-layer structure (10) is formed from individual films (1, 2) that are initially flat. The films are firmly bonded to each other along respective facing surfaces. A heat treatment is applied to one or both of the films (1, 2) of the structure so as to cause respective contractions or elongations that are different for the two films at standard use temperatures. A difference between said contractions or elongations causes the curvature of the multi-layer structure. The structure thus has a permanent curved shape, without contact between compression-forming instruments and a useful part of the multi-layer structure being necessary. The multi-layer structure can then be applied onto a curved substrate without causing any tears or ripples.

    Abstract translation: 弯曲的多层结构(10)由初始平坦的单个薄膜(1,2)形成。 膜沿相应的相对表面彼此牢固地结合。 对结构的一个或两个膜(1,2)进行热处理,以便在标准使用温度下引起两个膜的各自的收缩或伸长率不同。 所述收缩或伸长之间的差异导致多层结构的曲率。 因此,该结构具有永久的弯曲形状,在压缩成形设备之间没有接触,并且需要多层结构的有用部分。 然后可以将多层结构施加到弯曲的基底上而不引起任何眼泪或波纹。

    Surface strain measuring device
    2.
    发明授权
    Surface strain measuring device 有权
    表面应变测量装置

    公开(公告)号:US07460216B2

    公开(公告)日:2008-12-02

    申请号:US11596725

    申请日:2005-11-23

    CPC classification number: G01B11/162

    Abstract: The device enables strains of at least one surface (1) of a sample (2) to be measured versus temperature. Strains in a direction perpendicular to a predetermined plane, for example the plane of the surface (1), are measured by composite images. Strains in said plane are measured by image correlation. The measurements by image correlation and by composite images use a common visible light detection camera (3). The sample (2) is arranged in an enclosure (6) transparent at least locally to visible light (L). At least one infrared emitter (9) enables an infrared light to be created in a spectral band for a large part not detected by the camera (3).

    Abstract translation: 该装置使样品(2)的至少一个表面(1)的应变能够相对于温度进行测量。 通过合成图像来测量与预定平面垂直的方向,例如表面(1)的平面。 通过图像相关度来测量所述平面中的菌株。 通过图像相关和合成图像的测量使用公共的可见光检测相机(3)。 样品(2)布置在至少局部可见光(L)透明的外壳(6)中。 至少一个红外发射器(9)使得能够在光谱带中创建红外光,而不能由相机(3)检测到大部分红外光。

    Spectacle Lens including a Base Lens and a Thin Structure
    3.
    发明申请
    Spectacle Lens including a Base Lens and a Thin Structure 审中-公开
    眼镜镜片包括基座镜片和薄型结构

    公开(公告)号:US20140036222A1

    公开(公告)日:2014-02-06

    申请号:US13995077

    申请日:2011-11-29

    CPC classification number: G02C5/00 G02C7/101 G02C9/00 G02C13/001

    Abstract: A spectacle lens comprising a base lens (1) and a thin structure (2) that are assembled with each other with an intermediate spacer (30). The spacer is situated along a peripheral edge (12) of the base lens, and a separation space that is determined by said spacer between said base lens and said thin structure contains a gaseous medium during use of the spectacle lens by a wearer. Assembly of the spectacle base lens with the thin structure may be permanent or removable.

    Abstract translation: 一种眼镜镜片,包括用中间隔片(30)彼此组装的基础镜片(1)和薄型结构(2)。 间隔件沿着基底透镜的周边边缘(12)定位,并且由所述基座透镜和所述薄结构之间的所述间隔件确定的分隔空间在佩戴者使用眼镜镜片期间包含气体介质。 具有薄结构的眼镜基座镜片的装配可以是永久的或可移除的。

    METHOD OF APPLYING MULTI-LAYER STRUCTURE ONTO A CURVED SUBSTRATE
    4.
    发明申请
    METHOD OF APPLYING MULTI-LAYER STRUCTURE ONTO A CURVED SUBSTRATE 有权
    将多层结构应用于弯曲基板的方法

    公开(公告)号:US20100218874A1

    公开(公告)日:2010-09-02

    申请号:US12635787

    申请日:2009-12-11

    Applicant: Romain Fayolle

    Inventor: Romain Fayolle

    Abstract: A curved multi-layer structure (10) is formed from individual films (1, 2) that are initially flat. The films are firmly bonded to each other along respective facing surfaces. A heat treatment is applied to one or both of the films (1, 2) of the structure so as to cause respective contractions or elongations that are different for the two films at standard use temperatures. A difference between said contractions or elongations causes the curvature of the multi-layer structure. The structure thus has a permanent curved shape, without contact between compression-forming instruments and a useful part of the multi-layer structure being necessary. The multi-layer structure can then be applied onto a curved substrate without causing any tears or ripples.

    Abstract translation: 弯曲的多层结构(10)由初始平坦的单个薄膜(1,2)形成。 膜沿相应的相对表面彼此牢固地结合。 对结构的一个或两个膜(1,2)进行热处理,以便在标准使用温度下引起两个膜的各自的收缩或伸长率不同。 所述收缩或伸长之间的差异导致多层结构的曲率。 因此,该结构具有永久的弯曲形状,在压缩成形设备之间没有接触,并且需要多层结构的有用部分。 然后可以将多层结构施加到弯曲的基底上而不引起任何眼泪或波纹。

    Surface Strain Measuring Device
    5.
    发明申请
    Surface Strain Measuring Device 有权
    表面应变测量装置

    公开(公告)号:US20080055583A1

    公开(公告)日:2008-03-06

    申请号:US11596725

    申请日:2005-11-23

    CPC classification number: G01B11/162

    Abstract: The device enables strains of at least one surface (1) of a sample (2) to be measured versus temperature. Strains in a direction perpendicular to a predetermined plane, for example the plane of the surface (1), are measured by composite images. Strains in said plane are measured by image correlation. The measurements by image correlation and by composite images use a common visible light detection camera (3). The sample (2) is arranged in an enclosure (6) transparent at least locally to visible light (L). At least one infrared emitter (9) enables an infrared light to be created in a spectral band for a large part not detected by the camera (3).

    Abstract translation: 该装置使样品(2)的至少一个表面(1)的应变能够相对于温度进行测量。 通过合成图像来测量与预定平面垂直的方向,例如表面(1)的平面。 通过图像相关度来测量所述平面中的菌株。 通过图像相关和合成图像的测量使用公共的可见光检测相机(3)。 样品(2)布置在至少局部可见光(L)透明的外壳(6)中。 至少一个红外发射器(9)使得能够在光谱带中创建不被照相机(3)检测到的大部分的红外光。

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