公开(公告)号：US07781732B2

公开(公告)日：2010-08-24

申请号：US11797621

申请日：2007-05-04

Applicant: Pranab Sabitru Naik ,  Christopher David Beling ,  Stevenson H. Y. Fung

Inventor： Pranab Sabitru Naik ,  Christopher David Beling ,  Stevenson H. Y. Fung

IPC: H01J49/00 ,  B01D59/44

CPC classification number: H01J37/256 ,  H01J2237/06391

Abstract: Disclosed is a fully automated system capable of producing high quality real-time S-parameter images. It is a useful and versatile tool in Material Science and Solid State Technology for determining the location of subsurface defect types and concentrations on bulk-materials as well as thin-films. The system is also useful in locating top surface metallizations and structures in solid state devices. This imaging system operates by scanning the sample surface with either a small positron source (22Na) or a focused positron beam. The system also possesses another two major parts, namely electronic instrumentation and stand-alone imaging software. In the system, the processing time and use of system resources are constantly monitored and optimized for producing high resolution S-parameter image of the sample in real time with a general purpose personal computer. The system software possesses special features with its embedded specialized algorithms and techniques that provide the user with adequate freedom for analyzing various aspects of the image in order to obtain a clear inference of the defect profile while at the same time keeping automatic track on the instrumentation and hardware settings. The system is useful for semiconductor and metal samples, giving excellent quality images of the subsurface defect profile and has applications for biological samples.

Abstract translation: 公开了一种能够产生高质量实时S参数图像的全自动系统。 它是材料科学和固态技术中有用和通用的工具，用于确定散装材料以及薄膜上地下缺陷类型和浓度的位置。 该系统还可用于固定固态器件中的顶表面金属化和结构。 该成像系统通过用小正电子源（22Na）或聚焦正电子束扫描样品表面来操作。 该系统还具有电子仪器和独立成像软件两个主要部分。 在系统中，不断监控和优化系统资源的处理时间和使用情况，以便用通用个人计算机实时生成样本的高分辨率S参数图像。 系统软件具有其嵌入式专用算法和技术的特殊功能，为用户提供了足够的自由度来分析图像的各个方面，以便获得缺陷轮廓的清晰推断，同时保持对仪器的自动跟踪， 硬件设置。 该系统对于半导体和金属样品是有用的，提供了优质的地下缺陷图像，并且具有生物样品的应用。

公开(公告)号：US3718119A

公开(公告)日：1973-02-27

申请号：US3718119D

申请日：1971-11-26

Applicant: STEVENSON H

Inventor： STEVENSON H

IPC: A01K1/015 ,  A01K1/035 ,  A01J1/00

CPC classification number: A01K1/015 ,  A01K1/035

Abstract: An enclosure structure for animals, such as livestock and poultry, which does not require removal of body waste material from the enclosure having a floor structure comprising a bed of loosely packed inert particulate material, such as sand, with an upper aerated layer containing aerobic bacteria and a lower water-permeated layer containing anaerobic bacteria; wherein the aerobic bacteria initially act on the body waste material deposited on the floor of the enclosure to decompose the waste substantially into products which filter down into the lower layer of the bed where the anaerobic bacterial substantially decompose the products. Means are provided for controlling the depth of the water in the bed and for aerating the upper layer of the bed.

Abstract translation: 用于动物（例如家畜和家禽）的封闭结构，其不需要从具有包括松散包装的惰性颗粒材料（例如沙子）的床的地板结构的外壳中除去身体废物，具有包含需氧细菌的上充气层 和含有厌氧菌的较低透水层; 其中所述需氧细菌最初作用于沉积在所述外壳的地板上的身体废物材料，以将废物基本上分解成过滤到床的下层的产物，其中厌氧细菌基本上分解产物。 提供了用于控制床中的水的深度并用于使床的上层通气的装置。

公开(公告)号：US07420166B2

公开(公告)日：2008-09-02

申请号：US10890723

申请日：2004-07-14

Applicant: Pranab Sabitru Naik ,  Christopher David Beling ,  Stevenson H. Y. Fung

Inventor： Pranab Sabitru Naik ,  Christopher David Beling ,  Stevenson H. Y. Fung

IPC: G01N23/00

CPC classification number: H01J37/256 ,  H01J2237/06391

Abstract: Disclosed is a fully automated system capable of producing high quality real-time S-parameter images. It is a useful and versatile tool in Material Science and Solid State Technology for determining the location of subsurface defect types and concentrations in bulk-materials as well as thin-films. The system is also useful in locating top surface metallizations and structures in solid state devices. This imaging system operates by scanning the sample surface with either a small positron source (22Na) or a focused positron beam. The system also possesses another two major parts, namely electronic instrumentation and stand-alone imaging software. In the system, the processing time and use of system resources are constantly monitored and optimized for producing high resolution S-parameter image of the sample in real time with a general purpose personal computer. The system software possesses special features with its embedded specialized algorithms and techniques that provide the user with adequate freedom for analyzing various aspects of the image in order to obtain a clear inference of the defect profile while at the same time keeping automatic track on the instrumentation and hardware settings. The system is useful for semiconductor and metal samples, giving excellent quality images of the subsurface defect profile and has applications for biological samples.

Abstract translation: 公开了一种能够产生高质量实时S参数图像的全自动系统。 它是材料科学和固态技术中有用和通用的工具，用于确定散装材料以及薄膜中地下缺陷类型和浓度的位置。 该系统还可用于固定固态器件中的顶表面金属化和结构。 该成像系统通过用小的正电子源（Na +）或聚焦的正电子束扫描样品表面来进行操作。 该系统还具有电子仪器和独立成像软件两个主要部分。 在系统中，不断监控和优化系统资源的处理时间和使用情况，以便用通用个人计算机实时生成样本的高分辨率S参数图像。 系统软件具有其嵌入式专用算法和技术的特殊功能，为用户提供了足够的自由度来分析图像的各个方面，以便获得缺陷轮廓的清晰推断，同时保持对仪器的自动跟踪， 硬件设置。 该系统对于半导体和金属样品是有用的，提供了优质的地下缺陷图像，并且具有生物样品的应用。

公开(公告)号：US08053724B2

公开(公告)日：2011-11-08

申请号：US12816218

申请日：2010-06-15

Applicant: Pranab Sabitru Naik ,  Christopher David Beling ,  Stevenson H. Y. Fung

Inventor： Pranab Sabitru Naik ,  Christopher David Beling ,  Stevenson H. Y. Fung

IPC: H01J37/256 ,  G01N23/22

CPC classification number: H01J37/256 ,  H01J2237/06391

Abstract: An instrumentation setup is provided to process electronic signals in a positron imager functioning in two different modes of operations for scanning both bulk and thin film materials. According to one part of an implementation, an instrumentation setup comprises an XY-rastering stepper motor apparatus coupled with LVDTs (Linear Variable Differential Transformers), and nuclear signal processing and high speed data acquisition sections. Imaging of bulk material samples may be enabled by scanning a positron point source across a surface of samples. In another part of the irnplenientation, the instrumentation setup may comprise an electromagnetic deflection control arrangement in conjunction with a guided monoenergetic positron beam together with nuclear signal processing and data acquisition arrangements. This part of the implementation may scan and produce images for thin film samples. The instrumentation setup is capable of producing high quality real-time S-parameter images.

Abstract translation: 提供了一种仪器设置来处理正电子成像器中的电子信号，该正电子成像器在两种不同的操作模式中工作，用于扫描体薄膜材料和薄膜材料。 根据实施方案的一部分，仪器设置包括与LVDT（线性可变差分变压器）耦合的XY扫描步进电机装置，以及核信号处理和高速数据采集部分。 散装材料样品的成像可以通过在样品表面上扫描正电子点源来实现。 在不平衡的另一部分中，仪器设置可以包括结合导向的单能正电子束和核信号处理和数据采集装置的电磁偏转控制装置。 这部分实现可以扫描和产生薄膜样品的图像。 仪器设置能够产生高质量的实时S参数图像。