公开(公告)号：US08673621B2

公开(公告)日：2014-03-18

申请号：US11673732

申请日：2007-02-12

Applicant: Joon Won Park ,  Yu Jin Jung ,  Bong Jin Hong ,  Saul Tendler ,  Stephanie Allen

Inventor： Joon Won Park ,  Yu Jin Jung ,  Bong Jin Hong ,  Saul Tendler ,  Stephanie Allen

IPC: C12M1/00 ,  C12M1/34 ,  C12M3/00 ,  C12Q1/68 ,  C07H21/02 ,  C07H21/04

CPC classification number: C12Q1/6827 ,  B82Y35/00 ,  C12Q1/6834 ,  G01Q60/42 ,  Y10T436/143333

Abstract: The present patent application describes a cantilever for atomic force microscopy (AFM), which includes a cantilever body having a fixed end and a free end, the free end having a surface region being chemically modified by a dendron in which a plurality of termini of the branched region of the dendron are bound to the surface, and a terminus of the linear region of the dendron is functionalized.

Abstract translation: 本专利申请描述了一种用于原子力显微镜（AFM）的悬臂，其包括具有固定端和自由端的悬臂体，所述自由端具有通过树枝状化学修饰的表面区域，其中多个末端 枝状突起的分支区域与表面结合，并且树突的线性区域的末端被官能化。

公开(公告)号：US20140315319A1

公开(公告)日：2014-10-23

申请号：US14215367

申请日：2014-03-17

Applicant: Joon Won PARK ,  Yu Jin JUNG ,  Bong Jin HONG ,  Saul TENDLER ,  Stephanie ALLEN

Inventor： Joon Won PARK ,  Yu Jin JUNG ,  Bong Jin HONG ,  Saul TENDLER ,  Stephanie ALLEN

IPC: C12Q1/68

CPC classification number: C12Q1/6827 ,  B82Y35/00 ,  C12Q1/6834 ,  G01Q60/42 ,  Y10T436/143333

Abstract: The present patent application describes a cantilever for atomic force microscopy (AFM), which includes a cantilever body having a fixed end and a free end, the free end having a surface region being chemically modified by a dendron in which a plurality of termini of the branched region of the dendron are bound to the surface, and a terminus of the linear region of the dendron is functionalized.

Abstract translation: 本专利申请描述了一种用于原子力显微镜（AFM）的悬臂，其包括具有固定端和自由端的悬臂体，所述自由端具有通过树枝状化学修饰的表面区域，其中多个末端 枝状突起的分支区域与表面结合，并且树突的线性区域的末端被官能化。