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    ATOMIC FORCE MICROSCOPE AS AN ANALYZING TOOL FOR BIOCHIP
    9.
    发明申请
    ATOMIC FORCE MICROSCOPE AS AN ANALYZING TOOL FOR BIOCHIP 审中-公开
    原子力显微镜作为生物技术分析工具

    公开(公告)号：US20100261615A9

    公开(公告)日：2010-10-14

    申请号：US12140226

    申请日：2008-06-16

    申请人： Joon Won Park ,  Bong Jin Hong ,  Sung Hong Kwon

    发明人： Joon Won Park ,  Bong Jin Hong ,  Sung Hong Kwon

    IPC分类号： C40B30/10 ,  C40B60/12

    CPC分类号： G01N33/6845 ,  G01Q60/42

    摘要： The present application discloses a method for detecting a presence of target ligand in a fluid medium which includes the steps of: (i) contacting the fluid medium with a solid substrate that includes an array of dendrons on its surface, wherein each of the dendron includes a central atom, a probe that is attached to the central atom optionally through a linker, and a base portion attached to the central atom and having a plurality of termini that are attached to the surface of the solid support; and (ii) determining the presence of a probe-target ligand complex by measuring binding force between the bound ligand and detection molecule tethered to the tip of an atomic force microscope (“AFM”), which detection molecule has affinity for the ligand, wherein measurement of an increase in force between the probe-target ligand complex and the detection molecule by AFM indicates the presence of the probe-target ligand complex.

    摘要翻译： 本申请公开了一种用于检测流体介质中目标配体存在的方法，其包括以下步骤：（i）使流体介质与其表面上包含一系列树突的固体基质接触，其中每个树枝包括 中心原子，任选地通过连接体连接到中心原子上的探针和连接到中心原子上并具有连接到固体载体的表面上的多个末端的基部; 和（ii）通过测量结合的配体和与原子力显微镜（“AFM”）的末端连接的检测分子之间的结合力来确定探针 - 靶配体复合物的存在，该检测分子对配体具有亲和性，其中 通过AFM测量探针 - 靶配体复合物和检测分子之间的力的增加表明探针 - 靶配体复合物的存在。