摘要:
A time-domain pulsed spectroscopy apparatus which has a pulsed laser light source; a splitting unit to split pulsed laser light; a pulsed-light emitting unit; a detector; a sample holder; and a sample-unit entrance and exit optical systems; wherein the time-domain pulsed spectroscopy apparatus further comprises: at least one optical-path-length varying unit for setting a photometric range; at least one optical delay unit for the wave form signal measurement; and, at least one gate member to pass or block the pulsed light to a reflector.
摘要:
It is an object to provide a time-domain pulsed spectroscopy apparatus in which time-domain pulsed spectroscopy of multiple samples, states thereof, and so on can be carried out easily and in a short period of time. A time-domain pulsed spectroscopy apparatus of the present invention comprises a pulsed laser light source; a splitting unit configured to split pulsed laser light from the pulsed laser light source into excitation pulsed laser light and detection pulsed laser light; a pulsed-light emitting unit; a detector; a sample holder configured to hold the sample; and sample-unit entrance and exit optical systems configured to guide the pulsed light from the pulsed-light emitting unit to the sample and to guide to the detector pulsed light reflected from or transmitted through the sample due to the irradiation; wherein the time-domain pulsed spectroscopy apparatus further comprises: at least one optical-path-length varying unit for setting a photometric range, disposed in an incident-side optical path from the splitting unit to the pulsed-light emitting unit and/or in a detection-side optical path from the splitting unit to the detector; and at least one optical delay unit for the wave form signal measurement, disposed in the incident-side optical path from the splitting unit to the pulsed-light emitting unit and/or in the detection-side optical path from the splitting unit to the detector.
摘要:
A continuous drive type Michelson interferometer system for use in Fourier spectroscopy, having a main Michelson interferometer for obtaining the interferogram of a sample, an auxiliary Michelson interferometer for detecting the moving speed of a movable mirror of said main Michelson interferometer, and a control section for controlling the driving speed of said movable mirror. In said control section, the AC output signal of a photodetector is converted into a voltage corresponding to the frequency of the signal, said voltage is compared with a preset voltage by a voltage difference detection means, the phase of said AC output of said photodetector is compared with a phase of a reference signal by a phase comparison means, and said driving speed is controlled by both the outputs of said voltage difference detection means and said phase comparison means.
摘要:
A time-domain pulsed spectroscopy apparatus which has a pulsed laser light source; a splitting unit to split pulsed laser light; a pulsed-light emitting unit; a detector; a sample holder; and a sample-unit entrance and exit optical systems; wherein the time-domain pulsed spectroscopy apparatus further comprises: at least one optical-path-length varying unit for setting a photometric range; at least one optical delay unit for the wave form signal measurement; and, at least one gate member to pass or block the pulsed light to a reflector.
摘要:
There is provided an infrared light emitting device that is capable of polarizing emission light without causing loss of the emission light and having a simple configuration. Included are a photoconductive layer 22 which generates optical carriers upon being irradiated with pulsed excitation light; a pair of first antenna electrodes 21a for emitting infrared light, which are formed on the photoconductive layer 22 with a gap 32 disposed between tips thereof; a pair of second antenna electrodes 21b for emitting infrared light, which are formed on the photoconductive layer 22 and which are disposed with the gap 32 between tips thereof and having an angle with respect to the first antenna electrodes 21a; and a control unit for independently applying voltages to the first antenna electrodes 21a and the second antenna electrodes 21b. The voltage applied to the first antenna electrodes 21a and the voltage applied to the second antenna electrodes 21b may be selectively applied at different times or may be simultaneously applied with different phases.
摘要:
There is provided an infrared light emitting device that is capable of polarizing emission light without causing loss of the emission light and having a simple configuration. Included are a photoconductive layer 22 which generates optical carriers upon being irradiated with pulsed excitation light; a pair of first antenna electrodes 21a for emitting infrared light, which are formed on the photoconductive layer 22 with a gap 32 disposed between tips thereof; a pair of second antenna electrodes 21b for emitting infrared light, which are formed on the photoconductive layer 22 and which are disposed with the gap 32 between tips thereof and having an angle with respect to the first antenna electrodes 21a; and a control unit for independently applying voltages to the first antenna electrodes 21a and the second antenna electrodes 21b. The voltage applied to the first antenna electrodes 21a and the voltage applied to the second antenna electrodes 21b may be selectively applied at different times or may be simultaneously applied with different phases.
摘要:
An apparatus for and a method of evaluating a multilayer thin film of the present invention. An interference light beam in a predetermined wave number region is projected as a parallel beam onto a multilayer thin film sample and the interference light beam reflected by the sample is detected to find an interferogram. The interferogram is subject to Fourier transform, filtering and reverse Fourier transform so that a spatialgram is provided. Thereby the variation in incident angle of the light beam incident on the sample and in incident surface is reduced, and the spatialgram can be provided with accurate information of the multilayer thin film.
摘要:
A time-domain pulsed spectroscopy apparatus which has a pulsed laser light source; a splitting unit to split pulsed laser light; a pulsed-light emitting unit; a detector; a sample holder; and a sample-unit entrance and exit optical systems; wherein the time-domain pulsed spectroscopy apparatus further comprises: at least one optical-path-length varying unit for setting a photometric range; at least one optical delay unit for the wave form signal measurement; and, at least one gate member to pass or block the pulsed light to a reflector.
摘要:
An apparatus for measuring the thickness of a semiconductor layer includes a light source emitting light; an interferometer producing modulated interference light by modulating the light from the light source; an optical system including a light transmission member for introducing the modulated interference light into a measurement sample including at least one film on a substrate; a light detecting element for detecting the modulated interference light reflected from the film and producing an output signal in response; an extracting element for extracting a film interference component having a waveform from the output signal; and an element for calculating the thickness of the film from the waveform of the output signal component. The light detecting element includes a plurality of photodetectors having respective photometric wavenumber ranges that overlap. Thereby, a wavenumber range that is the sum of the respective wavenumber ranges of the respective components is obtained and an optical measurement can be realized over a wide wavenumber range that could not be measured with a single photodetector.