Abstract:
A semiconductor device includes a semiconductor substrate having a first surface and a second surface. A main region and a sensing region are formed on the first surface side of the semiconductor substrate. A RC-IGBT is formed in the main region and a sensing element for passing electric currents proportional to electric currents flowing through the RC-IGBT is formed in the sensing region. A collector region and a cathode region of the sensing element are formed on the second surface side of the semiconductor substrate. The collector region is located directly below the sensing region in a thickness direction of the semiconductor substrate. The cathode region is not located directly below the sensing region in the thickness direction.
Abstract:
The principal surface of a p-type SiC substrate (1) is formed of a face intersecting (0001) Si-face at 10 to 16°. An n+ source region (2) and an n+ drain region (3) are formed in a surface layer portion at the principal surface of the p-type SiC substrate (1) so as to be separated from each other. A gate electrode (5) is formed on a gate oxide film (4) on the principal surface of the p-type SiC substrate (1).
Abstract:
In a method for manufacturing a silicon carbide semiconductor device including a gate oxide film formed on a surface channel layer, the gate oxide film is formed by a thermal oxidation treatment that is performed at conditions under which a recrystallization reaction between silicon dioxide (SiO2) and carbon (C) occurs to produce silicon carbide (SiC) with a Gibbs free energy G3 being negative. The recrystallization reaction is expressed by a chemical formula of SiO2+3C→SiC+2CO+G3. Accordingly, residual carbon can be reduced at an interface between the gate oxide film and the surface channel layer.
Abstract:
A semiconductor device includes a spaced-channel IGBT and an antiparallel diode that are formed in a same semiconductor substrate. The IGBT includes a base layer and insulated gate trenches by which the base layer is divided into a body region connected to an emitter and a floating region disconnected from the emitter. The IGBT is formed in a cell region of an IGBT region, and the diode is formed in a diode region. A boundary region of the IGBT region is located between the cell region and the diode region. A spacing between adjacent gate trenches in the boundary region is less than a spacing between adjacent gate trenches between which the floating region is located in the cell region.
Abstract:
A voltage control oscillator that is provided to suitably receive digital broadcasting and is produced at low costs includes: a resonance circuit that includes variable capacitors, each having a capacitance controlling terminal, that are provided parallel to each other and are connected to an inductor, the circuit resonating at a resonant frequency that varies depending upon a sum of (i) an inductance of the inductor and (ii) capacitances of the variable capacitors; and at least one switch to determine what should be connected to at least one of said capacitance controlling terminals.
Abstract:
A vertical type power MOSFET made of silicon carbide includes a surface channel layer doped with nitrogen as dopant with a concentration equal to or less than 1.times.10.sup.15 cm.sup.-3. Accordingly, when a gate oxide film is formed on the surface channel layer, an amount of silicon nitride produced in the gate oxide film and at the interface between the gate oxide film and the surface channel layer becomes extremely small. As a result, carrier traps are prevented from being produced by silicon nitride, resulting in stable FET characteristics and high reliability to the gate oxide film.
Abstract translation:由碳化硅制成的垂直型功率MOSFET包括掺杂有氮作为掺杂剂的表面沟道层,其浓度等于或小于1×10 15 cm -3。 因此,当在表面沟道层上形成栅极氧化膜时,在栅极氧化膜中产生的氮化硅的量和栅氧化膜与表面沟道层之间的界面变得非常小。 结果,阻止了由氮化硅产生载流子阱,从而导致稳定的FET特性和对栅氧化膜的高可靠性。
Abstract:
A semiconductor device includes a semiconductor substrate having a first surface and a second surface. A main region and a sensing region are formed on the first surface side of the semiconductor substrate. A RC-IGBT is formed in the main region and a sensing element for passing electric currents proportional to electric currents flowing through the RC-IGBT is formed in the sensing region. A collector region and a cathode region of the sensing element are formed on the second surface side of the semiconductor substrate. The collector region is located directly below the sensing region in a thickness direction of the semiconductor substrate. The cathode region is not located directly below the sensing region in the thickness direction.
Abstract:
A reception apparatus is provided with a semiconductor integrated circuit device and a UHF-fixed band-pass filter provided in a stage preceding the semiconductor integrated circuit device. The semiconductor integrated circuit device includes a frequency converter, a to-be-frequency-converted-signal transmission line through which a to-be-frequency-converted signal is fed to the frequency converter, a local-oscillation-signal transmission line through which a local oscillation signal is fed to the frequency converter and an unnecessary-signal attenuation circuit, provided in the to-be-frequency-converted-signal transmission line, that attenuates an unnecessary signal included in signals transmitted through the to-be-frequency-converted-signal transmission line.
Abstract:
A semiconductor device includes a spaced-channel IGBT and an antiparalell diode that are formed in a same semiconductor substrate. The IGBT includes a base layer and insulated gate trenches by which the base layer is divided into a body region connected to an emitter and a floating region disconnected from the emitter. The IGBT is formed in a cell region of an IGBT region, and the diode is formed in a diode region. A boundary region of the IGBT region is located between the cell region and the diode region. A spacing between adjacent gate trenches in the boundary region is less than a spacing between adjacent gate trenches between which the floating region is located in the cell region.
Abstract:
Dispersing directions of oscillation frequency variable ranges of all voltage controlled oscillators provided in an integrated circuit are uniformed, and not only a range covering a frequency regardless of whether a dispersion occurs or not, but also a range covering the frequency only in a case where the dispersion occurs is used as the frequency variable range of the voltage controlled oscillator, and the frequency variable ranges of the voltage controlled oscillators are set so as to be successive with respect to each other, so that a small number of voltage controlled oscillators can cover a wide frequency variable range. Thus, the integrated circuit having voltage controlled oscillators therein is miniaturized.