Wafer indexing system using a grid pattern and coding and orientation
marks in each grid cell
    1.
    发明授权
    Wafer indexing system using a grid pattern and coding and orientation marks in each grid cell 失效
    晶圆索引系统使用网格图案和编码方向标记在每个网格单元格中

    公开(公告)号:US4134066A

    公开(公告)日:1979-01-09

    申请号:US780877

    申请日:1977-03-24

    摘要: A wafer indexing and mapping system is useful for precisely locating artifacts, defects, and fabricated structural components on a wafer. A permanent micrometer grid pattern is applied to the backside of the wafer, for example, a transparent bubble wafer. The grid pattern forms an array of uniform size cells, for example, 40 unit cells wide by 40 unit cells long. Each unit cell is divided into smaller units on each side. Each cell contains a coding or indexing system to identify the row and column of the cell in the grid pattern. The grid pattern contains orientation bars which identify orientation with respect to particular wafer reference lines. The simultaneous viewing of the wafer and the grid pattern permits an accurate permanent mapping of the artifacts, defects, and fabricated structural components on the wafer, as well as on the individual small chips formed by dicing the wafer.

    摘要翻译: 晶片索引和映射系统可用于精确定位晶片上的假象,缺陷和制造的结构元件。 将永久微米栅格图案施加到晶片的背面,例如透明气泡晶片。 网格图案形成均匀尺寸单元的阵列,例如,40个单元宽,40个单元长。 每个单元电池在每一侧分为较小的单元。 每个单元格包含一个编码或索引系统,用于标识网格图案中单元格的行和列。 栅格图案包含标识相对于特定晶片参考线的取向的取向条。 晶片和网格图案的同时观看允许晶片上的假象,缺陷和制造的结构部件以及通过切割晶片形成的各个小芯片的精确永久映射。