公开(公告)号：US09255861B2

公开(公告)日：2016-02-09

申请号：US12947351

申请日：2010-11-16

申请人： Haruyoshi Uchiyama ,  Yousuke Harima

发明人： Haruyoshi Uchiyama ,  Yousuke Harima

IPC分类号： G01N21/00 ,  G01M11/00

CPC分类号： G01M11/335 ,  G01M11/337

摘要： The invention is to provide an optical loss measuring method and an optical loss measuring apparatus capable of efficiently measuring an optical loss occurring to a target for measurement. The other optical loss measurement method comprising the steps of inputting light outputted from a light source to a target for measurement to thereby measure an output level of the target for measurement with the use of an optical power meter, maintaining the output level of the light source at a predetermined fixed value, and finding the optical loss occurring to the target for measurement on the basis of the output level of the light source maintained at the fixed value for use as the reference value.

摘要翻译： 本发明提供一种光损耗测量方法和光损耗测量装置，其能够有效地测量测量目标产生的光学损耗。 另一种光损耗测量方法包括以下步骤：将从光源输出的光输入到测量目标，从而使用光功率计测量测量目标的输出电平，保持光源的输出电平 以预定的固定值，基于保持在固定值的光源的输出电平作为基准值，求出发生在测量目标上的光损耗。

公开(公告)号：US08786843B2

公开(公告)日：2014-07-22

申请号：US13411866

申请日：2012-03-05

申请人： David Zhi Chen

发明人： David Zhi Chen

IPC分类号： G01N21/00

CPC分类号： G01M11/335 ,  G01M11/337

摘要： Methods and devices provide for transmitting a series of optical signals within a range of an O-band through a U-band into a device under test comprising one or more passive optical components; measuring powers of the optical signals that propagated through the device under test; calculating wavelength-dependent insertion loss values based on the measured power of the optical signals; measuring powers of reflected portions of the optical signals that propagated through the device under test; and calculating wavelength-dependent return loss values based on the measured powers of the reflected portion of the optical signal.

摘要翻译： 方法和装置提供将O波段范围内的一系列光信号通过U波段传输到被测器件中，包括一个或多个无源光学部件; 测量通过被测器件传播的光信号的功率; 基于光信号的测量功率计算与波长相关的插入损耗值; 测量通过被测器件传播的光信号的反射部分的功率; 以及基于所测量的光信号的反射部分的功率来计算波长相关的返回损耗值。

公开(公告)号：US20090213453A1

公开(公告)日：2009-08-27

申请号：US12427694

申请日：2009-04-21

申请人： X. Steve Yao

发明人： X. Steve Yao

IPC分类号： G02F1/29

CPC分类号： G01M11/337

摘要： Devices and techniques that use a polarization controller and a feedback control to the polarization controller to systematically control the polarization of light output from the polarization controller in measuring the polarization dependent loss (PDL) of an optical device or material that receives the light from the polarization controller or the degree of polarization (DOP) of a light beam directed into the polarization controller.

摘要翻译： 使用偏振控制器和对偏振控制器的反馈控制的装置和技术，用于系统地控制从偏振控制器输出的光的偏振，以测量接收来自偏振的光的光学装置或材料的偏振相关损耗（PDL） 控制器或引导到偏振控制器的光束的偏振度（DOP）。

公开(公告)号：US07466425B2

公开(公告)日：2008-12-16

申请号：US11112457

申请日：2005-04-22

申请人： Bogdan Szafraniec

发明人： Bogdan Szafraniec

IPC分类号： G01B11/02 ,  G01N21/00

CPC分类号： G01M11/337 ,  G01J9/04 ,  G01J2009/0261

摘要： A method for characterizing a device under test includes propagating multiple optical signals through the device under test and combining the multiple optical signals with a reference optical signal. The multiple optical signals are mixed with the reference optical signal and a relative perturbation between the multiple optical signals from the mixing of the multiple optical signals with the reference optical signal is determined. In another embodiment a modulated optical signal is provided from a local oscillator and the modulated optical signal is combined with the input optical signal. The modulated optical signal is mixed with the input signal to provide a mixed signal and at least one polarization-resolved parameter of the input optical signal is extracted from the mixed signal.

摘要翻译： 用于表征被测器件的方法包括通过被测器件传播多个光信号，并将多个光信号与参考光信号组合。 多个光信号与参考光信号混合，并且确定来自多个光信号与参考光信号的混合的多个光信号之间的相对扰动。 在另一个实施例中，调制的光信号由本地振荡器提供，并且调制的光信号与输入的光信号组合。 调制的光信号与输入信号混合以提供混合信号，并且从混合信号中提取输入光信号的至少一个偏振解析参数。

公开(公告)号：US20070002321A1

公开(公告)日：2007-01-04

申请号：US11427985

申请日：2006-06-30

申请人： Eric Desfonds ,  Kirill Pimenov

发明人： Eric Desfonds ,  Kirill Pimenov

IPC分类号： G01J4/00

CPC分类号： G01J4/04 ,  G01M11/337 ,  H04Q2213/1301

摘要： The present invention relates to a method for determining a polarization dependent characteristic of an optical or opto-electronic device. Using the Mueller matrix data, a matrix M corresponding to a difference between a first and a second transmission spectrum is determined. The first and the second transmission spectrum correspond to a first Stokes vector and a second Stokes vector, respectively, with the second Stokes vector being opposite to the first Stokes vector. Eigenvalues of the matrix M are then determined and the first Stokes vector is determined by selecting the largest eigenvalue of the matrix M and determining a corresponding eigenvector. The second Stokes vector is then determined as a vector opposite to the first Stokes vector. Finally, the data indicative of the polarization dependent characteristic of the device are determined using the first and the second Stokes vector and the Mueller matrix data. This method is highly beneficial by providing highly accurate data related to polarization dependent parameters while simultaneously providing a nearly instantaneous result with minimum computational effort.

摘要翻译： 本发明涉及一种用于确定光学或光电子器件的偏振相关特性的方法。 使用Mueller矩阵数据，确定与第一和第二透射光谱之间的差对应的矩阵M. 第一和第二透射光谱分别对应于第一斯托克斯矢量和第二斯托克斯矢量，第二斯托克斯矢量与第一斯托克斯矢量相反。 然后确定矩阵M的特征值，并且通过选择矩阵M的最大特征值并确定对应的特征向量来确定第一斯托克斯向量。 然后将第二斯托克斯矢量确定为与第一斯托克斯矢量相反的向量。 最后，使用第一和第二斯托克斯矢量和米勒矩阵数据确定指示设备的偏振相关特性的数据。 该方法通过提供与偏振相关参数相关的高精度数据而非常有益，同时以最小的计算量提供几乎瞬时的结果。

公开(公告)号：US06959126B1

公开(公告)日：2005-10-25

申请号：US10072682

申请日：2002-02-08

申请人： Rob Lofland ,  Kevin White ,  Kaushal K. Agrawal ,  Peter Hunt

发明人： Rob Lofland ,  Kevin White ,  Kaushal K. Agrawal ,  Peter Hunt

IPC分类号： G01M11/00 ,  G02B6/26 ,  G02B6/42

CPC分类号： G01M11/337 ,  G01M11/335

摘要： A technique is disclosed for performing testing of an optical device under test (DUT). According to a specific embodiment, the DUT includes a plurality of DUT optical input ports and a plurality of DUT optical output ports. The testing may be performed by an optical switching testing system (OSTS) which includes a plurality of OSTS output ports optically connected to a plurality of DUT input ports, and a plurality of OSTS input ports optically connected to a plurality of DUT output ports. Components of the OSTS are configured in order to perform a specific test on the DUT. A first test scenario is configured at the DUT. At least one optical test signal is transmitted to at least one DUT input port. Test results may then be obtained by monitoring at least one DUT output port for the presence or absence of light. The test results are then analyzed for specific characteristics. According to a specific embodiment, the OSTS of the present invention may be adapted to automatically perform a plurality of testing operations on a selected plurality of different optical paths associated with the DUT. Such testing operations may include, for example, transmitting a plurality of optical test signals to a plurality of DUT input ports during a given test scenario, and/or monitoring a plurality of DUT output ports for test results during a given test scenario. According to a specific embodiment, the optical switch testing system of the present invention may be used to measure and verify selected characteristics associated with a device under test (DUT) or a system under test (SUT). Such characteristics may include, for example, optical cross talk, insertion loss, polarization dependent loss, path switching time, data integrity, optical path verification, optical path stability, etc.

摘要翻译： 公开了一种用于对待测光学器件（DUT）进行测试的技术。 根据具体实施例，DUT包括多个DUT光输入端口和多个DUT光输出端口。 测试可以由光切换测试系统（OSTS）执行，该光切换测试系统包括多个与多个DUT输入端口光学连接的OSTS输出端口，以及多个OSTS输入端口，其光耦合到多个DUT输出端口。 配置OSTS的组件以便对DUT进行特定测试。 在DUT上配置了第一个测试场景。 至少一个光学测试信号被发送到至少一个DUT输入端口。 然后可以通过监视至少一个DUT输出端口以获得光的存在或不存在来获得测试结果。 然后分析测试结果的具体特征。 根据具体实施例，本发明的OSTS可以适于在与DUT相关联的所选择的多个不同光路上自动执行多个测试操作。 这样的测试操作可以包括例如在给定测试场景期间向多个DUT输入端口发送多个光学测试信号，和/或在给定测试场景期间监视多个DUT输出端口以用于测试结果。 根据具体实施例，本发明的光开关测试系统可用于测量和验证与被测设备（DUT）或被测系统（SUT）相关的选定特性。 这种特征可以包括例如光串扰，插入损耗，偏振相关损耗，路径切换时间，数据完整性，光路验证，光路稳定性等。

公开(公告)号：US06943891B2

公开(公告)日：2005-09-13

申请号：US10098284

申请日：2002-03-15

申请人： Gregory D. VanWiggeren

发明人： Gregory D. VanWiggeren

IPC分类号： G01M11/02 ,  G01M11/00 ,  G01B9/02

CPC分类号： G01M11/337 ,  G01M11/331 ,  G01M11/336

摘要： Systems, methods, computer-readable media for determining optical characteristics, such as polarization mode dispersion and/or polarization dependent loss, of device under test (DUTs) are provided. In this regard, one such system includes a response analyzer that receives data corresponding to responses of a DUT to optical signals. The response analyzer computes fast and slow group delays corresponding to at least some of the optical signals, each of the fast and slow group delays being attributable to one of a first and a second principle state of polarization. The response analyzer then assigns each of the fast and slow group delays to a correct one of the first and second principle states of polarization for at least some of the optical signals.

摘要翻译： 提供了用于确定被测器件（DUT）的光学特性（例如偏振模色散和/或偏振相关损耗）的系统，方法，计算机可读介质。 在这方面，一个这样的系统包括响应分析器，其将对应于DUT的响应的数据接收到光信号。 响应分析器计算对应于至少一些光信号的快速和慢速组延迟，快速和慢速组延迟中的每一个归因于第一和第二原理偏振状态之一。 响应分析器然后将快速和慢速组延迟中的每一个分配给至少一些光信号的第一和第二主要极化状态中的正确的一个。

公开(公告)号：US20050174562A1

公开(公告)日：2005-08-11

申请号：US10503285

申请日：2002-07-16

申请人： Gregor Cedilnik

发明人： Gregor Cedilnik

IPC分类号： G01M11/00 ,  G01N21/00

CPC分类号： G01M11/337

摘要： Determining a measuring uncertainty and/or maximum measuring error of a polarization dependent loss—PDL—tester for determining a PDL value of a device under test—DUT—is provided by using the PDL tester for determining a value of PDL of a verification element having an actual value of PDL greater than a maximum value of a specified measuring range, wherein the PDL tester has an expected measuring uncertainty and/or expected maximum measuring error. The measuring uncertainty and/or maximum measuring error of the tester is then derived from the determined value of PDL of the verification element in conjunction with the actual value of PDL of the verification element.

摘要翻译： 通过使用PDL测试仪确定用于确定被测器件的PDL值的偏振相关损耗PDL测试仪的测量不确定度和/或最大测量误差，以确定具有 PDL的实际值大于指定测量范围的最大值，其中PDL测试仪具有预期的测量不确定性和/或预期的最大测量误差。 然后从验证元件的PDL的确定值结合验证元件的PDL的实际值导出测试器的测量不确定性和/或最大测量误差。

公开(公告)号：US06917750B2

公开(公告)日：2005-07-12

申请号：US10447518

申请日：2003-05-29

申请人： David B. Stegall ,  Dwayne L. LaBrake

发明人： David B. Stegall ,  Dwayne L. LaBrake

IPC分类号： G01M11/00 ,  G02B6/00

CPC分类号： G01M11/336 ,  G01M11/335 ,  G01M11/337

摘要： The invention relates to systems and methods for characterizing optical devices, and particularly to one that characterizes optical devices such as fiber Bragg gratings. In one embodiment, a system and method include the use of two light sources and four detectors to detect light transmitted through an optical device both before and after the light has been transmitted in each direction through the device.

摘要翻译： 本发明涉及用于表征光学器件的系统和方法，特别涉及表征诸如光纤布拉格光栅的光学器件的系统和方法。 在一个实施例中，系统和方法包括使用两个光源和四个检测器来检测在光已经通过设备的每个方向上传输之前和之后透过光学设备的光。

公开(公告)号：US20040240833A1

公开(公告)日：2004-12-02

申请号：US10447518

申请日：2003-05-29

申请人： 3M Innovative Properties Company

发明人： David B. Stegall ,  Dwayne L. LaBrake

IPC分类号： G02B006/00

CPC分类号： G01M11/336 ,  G01M11/335 ,  G01M11/337

摘要： The invention relates to systems and methods for characterizing optical devices, and particularly to one that characterizes optical devices such as fiber Bragg gratings. In one embodiment, a system and method include the use of two light sources and four detectors to detect light transmitted through an optical device both before and after the light has been transmitted in each direction through the device.

摘要翻译： 本发明涉及用于表征光学器件的系统和方法，特别涉及表征诸如光纤布拉格光栅的光学器件的系统和方法。 在一个实施例中，系统和方法包括使用两个光源和四个检测器来检测在光已经通过设备的每个方向上传输之前和之后透过光学设备的光。