摘要:
An apparatus, system, and method are disclosed for detecting the formation of a short between a magnetoresistive (“MR”) head and a head substrate. The apparatus is presented with a logic unit containing a plurality of modules configured to functionally execute the necessary steps of generating a baseline electric potential level between a head substrate and ground, monitoring the level of the electric potential between the head substrate and ground, and detecting the formation of a short circuit between the MR head and the head substrate by detecting a change in the electric potential level monitored by the monitoring module from the baseline level to a predetermined threshold level. Beneficially, such an apparatus, system, and method would reduce read errors on the magnetic tape storage system, the time and resources required to recover from such errors, and allow for preventative measures to obviate contamination short related failures of tape drive systems.
摘要:
An apparatus, system, and method are disclosed for detecting the formation of a short between a magnetoresistive (“MR”) head and a head substrate. The apparatus is presented with a logic unit containing a plurality of modules configured to functionally execute the necessary steps of generating a baseline electric potential level between a head substrate and ground, monitoring the level of the electric potential between the head substrate and ground, and detecting the formation of a short circuit between the MR head and the head substrate by detecting a change in the electric potential level monitored by the monitoring module from the baseline level to a predetermined threshold level. Beneficially, such an apparatus, system, and method would reduce read errors on the magnetic tape storage system, the time and resources required to recover from such errors, and allow for preventative measures to obviate contamination short related failures of tape drive systems.
摘要:
A system for protecting an electronic device from an electrical event such as electrostatic discharge and other spurious events according to one embodiment of the present invention includes first and second leads adapted for passing an electric current through an electronic device, a first diode protection mechanism coupled to the leads such that the first diode protection mechanism is connected in parallel with the electronic device when the leads are coupled to the electronic device, and a second diode protection mechanism coupled in series with the electronic device when the leads are coupled to the electronic device.
摘要:
An apparatus, system, and method are disclosed for dynamically controlling a recording head substrate bias voltage. The apparatus includes a midpoint module and a substrate module. The midpoint module calculates a midpoint voltage of a plurality of data read elements and servo read elements contained in the head. The substrate module calculates a substrate bias voltage. The apparatus, system, and method dynamically control the substrate bias voltage post-assembly, minimizing certain head degradations and extending the life of associated head readers.
摘要:
A system for protecting an electronic device from an electrical event such as electrostatic discharge and other spurious events according to one embodiment of the present invention includes first and second leads adapted for passing an electric current through an electronic device, a first diode protection mechanism coupled to the leads such that the first diode protection mechanism is connected in parallel with the electronic device when the leads are coupled to the electronic device, and a second diode protection mechanism coupled in series with the electronic device when the leads are coupled to the electronic device.
摘要:
An apparatus, system, and method are disclosed for dynamically controlling a recording head substrate bias voltage. The apparatus includes a midpoint module and a substrate module. The midpoint module calculates a midpoint voltage of a plurality of data read elements and servo read elements contained in the head. The substrate module calculates a substrate bias voltage. The apparatus, system, and method dynamically control the substrate bias voltage post-assembly, minimizing certain head degradations and extending the life of associated head readers.