公开(公告)号：US07201325B1

公开(公告)日：2007-04-10

申请号：US09601111

申请日：1999-01-14

Applicant: Pascal Cooreman ,  Stephane Rayon ,  Bertrand Gomez

Inventor： Pascal Cooreman ,  Stephane Rayon ,  Bertrand Gomez

IPC: G06K19/06

CPC classification number: G06K19/07

Abstract: The invention relates to cards with a microprocessor and contacts. The invention lies in the fact that a communication device of the asynchronous type is disposed between the contacts and the microprocessor so as to relieve the microprocessor of the communication tasks and thus allow better use of the central unit of the microprocessor and the associated memories. This device includes an analysis circuit, a circuit for checking the integrity of the series of pulses, a circuit for determining the characters in the series of pulses and pluralities of registers which are connected with the microprocessor.

Abstract translation: 本发明涉及具有微处理器和触点的卡。 本发明的目的在于，将异步类型的通信设备设置在触点和微处理器之间，以便缓解微处理器的通信任务，从而更好地利用微处理器的中央单元和相关联的存储器。 该装置包括分析电路，用于检查一系列脉冲的完整性的电路，用于确定与微处理器连接的一系列脉冲和多个寄存器中的字符的电路。

公开(公告)号：US06585164B1

公开(公告)日：2003-07-01

申请号：US09601120

申请日：2000-07-27

Applicant: Pascal Cooreman ,  Stephane Rayon ,  Bertrand Gomez

Inventor： Pascal Cooreman ,  Stephane Rayon ,  Bertrand Gomez

IPC: G06K1906

CPC classification number: G07F7/1008 ,  G06K7/0008 ,  G06Q20/341 ,  G07F7/084

Abstract: A memory card fitted with contacts contains a memory and its access circuits. The memory access circuits are modified to allow recording or reading the memory via electric signals supplied by a terminal according to an asynchronous-type communication protocol with integrity check of the codes transmitted. The signals received on the contacts are analysed by an analysis circuit, then switched to address and data registers by a switch circuit. The analysis circuit and a control circuit transmit messages and codes to the terminal via a transmission circuit.

Abstract translation: 装有触点的存储卡包含存储器及其存取电路。 存储器访问电路被修改为允许根据异步型通信协议通过终端提供的电信号来记录或读取存储器，该异步型通信协议具有所发送代码的完整性检查。 通过分析电路对接点上接收到的信号进行分析，然后通过开关电路切换到地址和数据寄存器。 分析电路和控制电路通过传输电路向终端发送消息和代码。

公开(公告)号：US07704757B2

公开(公告)日：2010-04-27

申请号：US10276509

申请日：2001-03-13

Applicant: Francis Dell'Ova ,  Frank Lhermet ,  Dominique Poirot ,  Stephane Rayon ,  Bertrand Gomez ,  Nicole Lessoile ,  Pierre Rizzo

Inventor： Francis Dell'Ova ,  Frank Lhermet ,  Dominique Poirot ,  Stephane Rayon ,  Bertrand Gomez ,  Nicole Lessoile ,  Pierre Rizzo

IPC: H01L21/00 ,  G06F19/00

CPC classification number: H01L22/14 ,  H01L22/20 ,  H01L23/66 ,  H01L2924/0002 ,  H01L2924/00

Abstract: A method is provided for manufacturing an integrated electronic component arranged on a substrate wafer. According to the method, at least one metallization step is performed, and a value of an electrical parameter of the integrated electronic component is determined after the at least one metallization step. A subsequent metallization step is performed after determining the value of the electrical parameter. The subsequent metallization step is performed using an adjustment mask chosen from n predefined masks based on a desired value of the electrical parameter, so as to obtain the desired value of the electrical parameter of the integrated electronic component after manufacturing. In one preferred embodiment, a series of electrical tests is performed on the wafer using test equipment, and the value of the electrical parameter is determined using the same test equipment as is used to perform the series of electrical tests.

Abstract translation: 提供一种用于制造布置在基板晶片上的集成电子部件的方法。 根据该方法，执行至少一个金属化步骤，并且在至少一个金属化步骤之后确定集成电子部件的电参数的值。 在确定电参数的值之后执行随后的金属化步骤。 随后的金属化步骤使用基于电参数的期望值从n个预定义掩模中选择的调整掩模来执行，以便在制造之后获得集成电子部件的电参数的期望值。 在一个优选实施例中，使用测试设备对晶片进行一系列电测试，并且使用与用于执行一系列电测试的相同的测试设备来确定电参数的值。