Optical coupling for testing integrated circuits

    公开(公告)号:US06985219B2

    公开(公告)日:2006-01-10

    申请号:US09746618

    申请日:2000-12-21

    CPC classification number: G01R31/311 G01R31/31905

    Abstract: A method and system of testing integrated circuits (IC) via optical coupling. The optical system includes an optical fiber, fixture and focussing element. In addition, channels are provided in the fixture mounted on the integrated circuit to accommodate the optical system. The fixture acts as a heat sink. As such, one or more photosensitive elements/targets on the integrated circuit are probed using light that is brought to a focus on each target site. The light causes latching of data into the integrated circuit (which is operating under influence of a test program) and formation of a test pattern output from the integrated circuit that is used to confirm proper functioning of the IC.

    Differential pulsed laser beam probing of integrated circuits
    2.
    发明授权
    Differential pulsed laser beam probing of integrated circuits 有权
    差分脉冲激光束探测集成电路

    公开(公告)号:US06252222B1

    公开(公告)日:2001-06-26

    申请号:US09483463

    申请日:2000-01-13

    CPC classification number: G01R31/308

    Abstract: A laser beam is used to probe an integrated circuit device under test. A single laser provides a single laser pulse which is divided into two pulses, both of which are incident upon the device under test. After the two pulses interact with the device under test, the two pulses are separated and detected by two photo detectors. The electrical signals output by the photo detectors are then subtracted, which cancels out any common mode noise induced on both pulses including noise due to mechanical vibration of the device under test and also any noise from the laser. The difference signal can be used to reproduce a time varying signal in the device under test.

    Abstract translation: 激光束用于探测被测集成电路器件。 单个激光器提供单个激光脉冲,其被分成两个脉冲,两个脉冲都入射在被测器件上。 在两个脉冲与被测器件相互作用之后,两个脉冲被两个光电检测器分离并检测。 然后减去由光电检测器输出的电信号,这消除了由于被测器件的机械振动引起的包括噪声在内的两种脉冲引起的任何共模噪声,以及来自激光器的任何噪声。 差分信号可用于在被测器件中再现时变信号。

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