Method of detecting defects of a structure
    2.
    发明授权
    Method of detecting defects of a structure 失效
    检测结构缺陷的方法

    公开(公告)号:US5816703A

    公开(公告)日:1998-10-06

    申请号:US688849

    申请日:1996-07-31

    IPC分类号: G01N25/72 G01N33/38

    CPC分类号: G01N33/383 G01N25/72

    摘要: A method of detecting a defect on the surface of a structure using an infrared radiometric thermometer. It is determined that there is a lifting defect at a region of the surface if the region has a temperature difference of 0.3.degree. C. or more in comparison with a surrounding region and has an area of 200 cm.sup.2 or more. The temperature of the surface of the structure is obtained using the infrared radiometric thermometer in a period of time from 19:00 p.m. on a day when it is clear at least in the daytime to 4:30 a.m. on the next day.

    摘要翻译: 使用红外辐射温度计检测结构表面上的缺陷的方法。 如果该区域与周围区域相比具有0.3℃以上的温度差,并且面积为200cm 2以上,则确定在表面的区域存在起重缺陷。 在第二天至少在白天至凌晨4:30清楚的一天中,使用红外辐射温度计在一天中的时间段内获得结构表面的温度。