Liquid filling device
    1.
    发明授权
    Liquid filling device 失效
    液体灌装装置

    公开(公告)号:US4665957A

    公开(公告)日:1987-05-19

    申请号:US795670

    申请日:1985-10-17

    IPC分类号: B67C3/06 B67C3/26 B67C3/32

    CPC分类号: B67C3/2614

    摘要: A counterpressure liquid filling device for a container (1) comprises a gas discharge passage (9a) for discharging the pressurized gas of the container (1) into the atmosphere, the gas discharge passage (9a) being branched into a first branch discharge conduit (12), one end of which is communicated with the neck of the container (1), and a second branch discharge passage (13), one end of which is communicated with the container at a position where the quantity of the liquid to be filled is determined, the other ends of both the first branch discharge conduit (12) and the second branch discharge passage (13) being communicated with a valve operating chamber (11). A gas flow control valve (10) is housed in the valve operating chamber (11). The first branch discharge conduit (12) and the second branch discharge conduit (13) are in communication with mutually opposite sides of the gas flow control valve (10), while the liquid is being filled, but, when the liquid surface has reached the position of quantity determination, the gas flow control valve seals the gas discharge passage (9a). Thus it is possible not only to block the entry of the liquid into the second branch discharge conduit (13), but also to fill the container (1) with the precisely selected quantity of the liquid.

    摘要翻译: PCT No.PCT / JP85 / 00080 Sec。 371日期1985年10月17日第 102(e)1985年10月17日PCT 1985年2月22日PCT PCT。 第WO85 / 03693号公报 1985年8月29日,用于容器(1)的反压液体填充装置包括用于将容器(1)的加压气体排放到大气中的气体排出通道(9a),气体排出通道(9a) 进入第一分支排出管道(12),其一端与容器(1)的颈部连通,以及第二分支排出通道(13),第一分支排出通道(13)的一端与容器连通, 确定要填充的液体的量,第一分支排出管道(12)和第二分支排出通道(13)的另一端与阀操作室(11)连通。 气体流量控制阀(10)容纳在阀操作室(11)中。 当液体被填充时,第一分支排出管道(12)和第二分支排出管道(13)与气体流量控制阀(10)的相互相对的两侧连通,但是当液面达到 气量控制阀密封气体排出通道(9a)。 因此,不仅可以阻止液体进入第二分支排出管道(13),而且可以用精确选择量的液体填充容器(1)。

    Device for testing semiconductor devices
    2.
    发明授权
    Device for testing semiconductor devices 失效
    半导体器件测试装置

    公开(公告)号:US5323106A

    公开(公告)日:1994-06-21

    申请号:US886802

    申请日:1992-05-22

    申请人: Takeshi Saegusa

    发明人: Takeshi Saegusa

    CPC分类号: G01R1/0433 G01R1/07364

    摘要: A device for testing semiconductor devices includes a group of probes arranged to correspond to at least a row of electrode terminals which are formed on each of the semiconductor devices, a printed plate having an opening in which the semiconductor device is positioned and a conductive pattern, four guide members made of insulating material and having a face on which a plurality of grooves are formed to hole and arrange the probes at the same pitch as that of the electrode terminals, and a positioning member and an upper guide which position the guide members relative to the semiconductor device and the printed plate to electrically and detachably contact the probes with the electrode terminals and the conductive lines along the rim of the opening of the printed plate.

    摘要翻译: 用于测试半导体器件的器件包括一组探针,其被布置为对应于形成在每个半导体器件上的至少一行电极端子,具有半导体器件定位的开口的印刷板和导电图案, 由绝缘材料制成的四个引导构件,其上形成有多个沟槽的面,以与电极端子相同的间距对探针进行孔和排列;以及定位构件和上引导件,其将引导构件相对定位 到半导体器件和印刷电路板,以沿着印刷电路板的开口的边缘将电极端子和导电线电连接并可拆卸地接触探针。