Vertical GaN-based metal insulator semiconductor FET
    1.
    发明授权
    Vertical GaN-based metal insulator semiconductor FET 失效
    垂直GaN基金属绝缘体半导体FET

    公开(公告)号:US08558242B2

    公开(公告)日:2013-10-15

    申请号:US13315705

    申请日:2011-12-09

    IPC分类号: H01L29/20

    摘要: A semiconductor structure includes a III-nitride substrate having a top surface and an opposing bottom surface and a first III-nitride layer of a first conductivity type coupled to the top surface of the III-nitride substrate. The semiconductor structure also includes a second III-nitride layer of a second conductivity type coupled to the first III-nitride layer along a vertical direction and a third III-nitride layer of a third conductivity type coupled to the second III-nitride layer along the vertical direction. The semiconductor structure further includes a first trench extending through a portion of the third III-nitride layer to the first III-nitride layer, a second trench extending through another portion of the third III-nitride layer to the second III-nitride layer, and a first metal layer coupled to the second and the third III-nitride layers.

    摘要翻译: 半导体结构包括具有顶表面和相对底表面的III族氮化物衬底和与III族氮化物衬底的顶表面耦合的第一导电类型的第一III族氮化物层。 半导体结构还包括沿着垂直方向耦合到第一III族氮化物层的第二导电类型的第二III族氮化物层,以及沿着沿着垂直方向耦合到第二III族氮化物层的第三导电类型的第三III族氮化物层 垂直方向 半导体结构还包括延伸穿过第三III族氮化物层的一部分到第一III族氮化物层的第一沟槽,延伸穿过第三III族氮化物层的另一部分到第二III族氮化物层的第二沟槽,以及 耦合到第二和第三III族氮化物层的第一金属层。

    Vertical GaN-Based Metal Insulator Semiconductor FET
    2.
    发明申请
    Vertical GaN-Based Metal Insulator Semiconductor FET 失效
    垂直GaN基金属绝缘子半导体FET

    公开(公告)号:US20130146885A1

    公开(公告)日:2013-06-13

    申请号:US13315705

    申请日:2011-12-09

    IPC分类号: H01L29/20 H01L21/20

    摘要: A semiconductor structure includes a III-nitride substrate having a top surface and an opposing bottom surface and a first III-nitride layer of a first conductivity type coupled to the top surface of the III-nitride substrate. The semiconductor structure also includes a second III-nitride layer of a second conductivity type coupled to the first III-nitride layer along a vertical direction and a third III-nitride layer of a third conductivity type coupled to the second III-nitride layer along the vertical direction. The semiconductor structure further includes a first trench extending through a portion of the third III-nitride layer to the first III-nitride layer, a second trench extending through another portion of the third III-nitride layer to the second III-nitride layer, and a first metal layer coupled to the second and the third III-nitride layers.

    摘要翻译: 半导体结构包括具有顶表面和相对底表面的III族氮化物衬底和与III族氮化物衬底的顶表面耦合的第一导电类型的第一III族氮化物层。 半导体结构还包括沿着垂直方向耦合到第一III族氮化物层的第二导电类型的第二III族氮化物层,以及沿着沿着垂直方向耦合到第二III族氮化物层的第三导电类型的第三III族氮化物层 垂直方向 半导体结构还包括延伸穿过第三III族氮化物层的一部分到第一III族氮化物层的第一沟槽,延伸穿过第三III族氮化物层的另一部分到第二III族氮化物层的第二沟槽,以及 耦合到第二和第三III族氮化物层的第一金属层。