-
1.发明申请公开(公告)号：US20100313644A1
公开(公告)日：2010-12-16
申请号：US12482154
申请日：2009-06-10
CPC分类号： G01Q60/28
摘要： A system, method and device for measuring toner performance by randomly applying a toner sample having toner particles to a substrate, and positioning the substrate such that a force may be applied to individual particles of the measuring toner. A rolling resistance or rotation of the individual particles of the measuring toner is measured. The measurements may be analyzed to determine adhesion and distribution properties of individual toner particles of the measuring toner sample.
摘要翻译： 一种用于通过将具有调色剂颗粒的调色剂样品随机施加到基底来测量调色剂性能的系统，方法和装置，并且将基底定位成可以将力施加到测量调色剂的各个颗粒上。 测量测量调色剂的各个颗粒的滚动阻力或旋转。 可以分析测量以确定测量调色剂样品的各个调色剂颗粒的粘附和分布特性。
-
2.发明申请公开(公告)号：US20100011472A1
公开(公告)日：2010-01-14
申请号：US12497364
申请日：2009-07-02
申请人： Thorsten Hugel , Michael Geisler
发明人： Thorsten Hugel , Michael Geisler
CPC分类号： G01N33/54373 , G01Q30/04 , G01Q60/28 , G01Q60/42
摘要： A force microscope for the detection of forces in the sub-micronewton range has a measurement head which is used to carry out a relative movement with respect to a sample holder and to which a carrier molecule is attached on which probe molecules are placed.
摘要翻译： 用于检测亚微米范围内的力的力显微镜具有测量头，该测量头用于相对于样品保持器进行相对运动，并且载置分子附着在其上放置探针分子。
-
3.发明授权Method and device for simultaneously determining the adhesion, friction, and other material properties of a sample surface 有权用于同时测定样品表面的粘合性，摩擦性和其它材料性质的方法和装置公开(公告)号：US06880386B1
公开(公告)日：2005-04-19
申请号：US09869789
申请日：2000-01-04
申请人： Hans-Ulrich Krotil , Thomas Stifter , Othmar Marti
发明人： Hans-Ulrich Krotil , Thomas Stifter , Othmar Marti
IPC分类号： G01N13/00 , G01N19/02 , G01N19/04 , G01Q20/02 , G01Q60/26 , G01Q60/28 , G01N13/16 , G01B11/30 , G01B21/30
摘要： A process for the location-resolved simultaneous detection of the adhesion and friction as well as possibly of other material properties of a sample surface to be examined by means of a raster probe microscope comprising a raster probe. The raster probe and/or the sample with sample surface are moved until at a point of the sample surface to be examined the raster probe interacts in a determined manner with this surface. The raster probe and/or the sample are subjected to a vertical oscillation, and a first measuring signal characterized by the deformation of the raster probe is recorded. A second measuring signal characterizing the deformation of the raster probe is recorded, wherein the raster probe and/or the sample are subjected to a horizontal and/or vertical oscillation. From these two measuring signals the desired material properties are determined. For the detection of the entire surface area to be examined the raster probe and or the sample are again moved and for the repetition of the measuring process described brought into contact with the sample surface in the above described manner.
摘要翻译： 用于通过包括光栅探针的光栅探针显微镜同时检测粘合和摩擦以及可能通过待检查的样品表面的其它材料性质的位置分辨的方法。 光栅探针和/或具有样品表面的样品被移动直到待检测的样品表面的点处，光栅探针以确定的方式与该表面相互作用。 光栅探针和/或样品经受垂直振荡，并且记录由光栅探针的变形表征的第一测量信号。 记录表征光栅探针的变形的第二测量信号，其中光栅探针和/或样品经受水平和/或垂直振荡。 从这两个测量信号中，确定所需的材料性质。 为了检测待检查的整个表面区域，再次移动光栅探针和/或样品，并且以上述方式重复与描述的样品表面接触的测量过程。
-
公开(公告)号：US06578410B1
公开(公告)日：2003-06-17
申请号：US09927591
申请日：2001-08-10
申请人： Jacob Israelachvili
发明人： Jacob Israelachvili
IPC分类号： G01B528
CPC分类号： G01Q60/38 , G01Q20/04 , G01Q60/26 , G01Q60/28 , Y10S977/873
摘要： A dual- and triple-mode cantilever suitable for simultaneously measuring both normal (adhesion) and lateral (friction) forces independently in three orthogonal directions. The cantilever design allows the measurements to be performed at high sensitivity. The cantilever is useful in Scanning Probe Microscopes (SPM's) and other force-measuring devices, such as the Atomic Force Microscope (AFM), the Friction Force Microscope (FFM), and in probe attachments for the Surface Forces Apparatus (SFA) where both normal and lateral forces acting on a tip need to be accurately, and unambiguously measured. The cantilever structure may be used for both resistive and optical detection of tip deflections.
摘要翻译： 双模和三模悬臂适用于在三个正交方向上独立地同时测量正常（粘附）和侧向（摩擦）力。 悬臂设计允许以高灵敏度进行测量。 悬臂可用于扫描探针显微镜（SPM）和其他力测量装置，如原子力显微镜（AFM），摩擦力显微镜（FFM）和表面力装置（SFA）的探头附件中，其中两者 作用在尖端上的正常和侧向力需要准确和明确地测量。 悬臂结构可用于电极和光学检测尖端偏转。
-
5.发明申请MEASUREMENT OF SURFACE ENERGY COMPONENTS AND WETTABILITY OF RESERVOIR ROCK UTILIZING ATOMIC FORCE MICROSCOPY 有权表面能量组分的测量和使用原子力显微镜的储层岩石的湿度公开(公告)号：US20150204903A1
公开(公告)日：2015-07-23
申请号：US14158359
申请日：2014-01-17
IPC分类号： G01Q60/38
CPC分类号： G01Q60/38 , G01Q30/04 , G01Q30/14 , G01Q60/24 , G01Q60/28 , G01Q70/02 , G01Q70/08 , G01Q70/14 , G01Q70/16
摘要： An instrument (and corresponding method) performs AFM techniques to characterize properties of a sample of reservoir rock. The AFM instrument is configured to have a probe with a tip realized from reservoir rock that corresponds to the reservoir rock of the sample. The AFM instrument is operated to derive and store data representing adhesion forces between the tip and the sample at one or more scan locations in the presence of a number of different fluids disposed between the tip and the sample. The AFM instrument is further configured to perform computational operations that process the data representing the adhesion forces for a given scan location in order to characterize at least one property of the rock sample at the given scan location. The properties can include total surface energy of the rock sample as well as wettability of the rock sample.
摘要翻译： 仪器（和相应的方法）执行AFM技术来表征储层岩石样品的性质。 AFM仪器被配置为具有从储层岩石实现的具有对应于样品的储层岩石的尖端的探针。 操作AFM仪器以在存在位于尖端和样品之间的许多不同流体的情况下在一个或多个扫描位置导出和存储表示尖端和样品之间的粘附力的数据。 AFM仪器还被配置为执行计算操作，其处理表示给定扫描位置的粘附力的数据，以便表征给定扫描位置处的岩石样品的至少一个性质。 这些性质可以包括岩石样品的总表面能以及岩石样品的润湿性。
-
公开(公告)号：US20130205454A1
公开(公告)日：2013-08-08
申请号：US13726764
申请日：2012-12-26
申请人： Shuichi BABA , Masahiro WATANABE , Toshihiko NAKATA , Yukio KEMBO , Toru KURENUMA , Takafumi MORIMOTO , Manabu EDAMURA , Satoshi SEKINO
发明人： Shuichi BABA , Masahiro WATANABE , Toshihiko NAKATA , Yukio KEMBO , Toru KURENUMA , Takafumi MORIMOTO , Manabu EDAMURA , Satoshi SEKINO
IPC分类号： G01Q10/00
摘要： In the case of measuring a pattern having a steep side wall, a probe adheres to the side wall by the van der Waals forces acting between the probe and the side wall when approaching the pattern side wall, and an error occurs in a measured profile of the side wall portion. When a pattern having a groove width almost equal to a probe diameter is measured, the probe adheres to both side walls, the probe cannot reach the groove bottom, and the groove depth cannot be measured. When the probe adheres to a pattern side wall in measurements of a microscopic high-aspect ratio pattern using an elongated probe, the probe is caused to reach the side wall bottom by detecting the adhesion of the probe to the pattern side wall, and temporarily increasing a contact force between the probe and the sample. Also, by obtaining the data of the amount of torsion of a cantilever with the shape data of the pattern, a profile error of the side wall portion by the adhesion is corrected by the obtained data of the amount of torsion.
摘要翻译： 在测量具有陡峭侧壁的图案的情况下，当接近图案侧壁时，探针通过作用在探针和侧壁之间的范德华力附着在侧壁上，并且在测量的轮廓中发生错误 侧壁部分。 当测量具有几乎等于探针直径的槽宽度的图案时，探针粘附到两个侧壁，探针不能到达凹槽底部，并且不能测量凹槽深度。 当使用细长的探针测量微观高纵横比图案时探头粘附到图案侧壁上时，通过检测探针与图案侧壁的粘附力使探针到达侧壁底部，并暂时增加 探针和样品之间的接触力。 此外，通过利用图案的形状数据获得悬臂的扭转量的数据，通过获得的扭转量的数据来校正侧壁部分的粘附的轮廓误差。
-
公开(公告)号：US08132451B2
公开(公告)日：2012-03-13
申请号：US12482154
申请日：2009-06-10
CPC分类号： G01Q60/28
摘要： A system, method and device for measuring toner performance by randomly applying a toner sample having toner particles to a substrate, and positioning the substrate such that a force may be applied to individual particles of the measuring toner. A rolling resistance or rotation of the individual particles of the measuring toner is measured. The measurements may be analyzed to determine adhesion and distribution properties of individual toner particles of the measuring toner sample.
摘要翻译： 一种用于通过将具有调色剂颗粒的调色剂样品随机施加到基底来测量调色剂性能的系统，方法和装置，并且将基底定位成可以将力施加到测量调色剂的各个颗粒上。 测量测量调色剂的各个颗粒的滚动阻力或旋转。 可以分析测量以确定测量调色剂样品的各个调色剂颗粒的粘附和分布特性。
-
公开(公告)号：US07810382B2
公开(公告)日：2010-10-12
申请号：US11883900
申请日：2006-02-10
申请人： Thomas Schimmel , Matthias Müller
发明人： Thomas Schimmel , Matthias Müller
摘要： The invention relates to a method of determining material properties of a contact formed between a measurement tip of a microscopic probe and a sample surface of a sample material. According to the method, a distance modulation is applied for modulating a distance between a support of the microscopic probe end the sample surface in a direction essentially normal to the sample surface and wherein a normal force signal indicative of a normal force is measured and demodulated. In the method it is proposed that the material properties be determined using measurement data comprised in the demodulated normal force signal and related to a (concave) buckling deformation of the microscopic probe relative to and away from the sample surface.
摘要翻译： 本发明涉及一种确定在微观探针的测量尖端和样品材料的样品表面之间形成的接触材料特性的方法。 根据该方法，施加距离调制以在基本上垂直于样品表面的方向上调制微观探针端的样品表面的支撑体之间的距离，并且其中测量和解调表示法向力的法向力信号。 在该方法中，建议使用包含在解调的法向力信号中并与微观探针相对于和远离样品表面的（凹））屈曲变形相关的测量数据来确定材料性质。
-
公开(公告)号：US5477732A
公开(公告)日：1995-12-26
申请号：US314962
申请日：1994-09-29
申请人： Takao Yasue , Tadashi Nishioka
发明人： Takao Yasue , Tadashi Nishioka
IPC分类号： G01N19/00 , G01B21/30 , G01L1/00 , G01N13/00 , G01N19/04 , G01Q20/02 , G01Q60/24 , G01Q60/28 , H01L21/30 , H01L21/66
摘要： An adhesion measuring apparatus includes a measuring device for measuring a Force-Curve at each of multiple measuring points on a sample surface using a cantilever provided at its distal end with a probe which is made of a material to be formed on the sample surface, and a distribution image forming device for calculating adhesion between a material making up the sample surface and the material to be formed on the sample surface from an output of the measuring device, and forming an image of adhesion distribution on the sample surface. An adhesion measuring method includes the steps of adjusting the spacing between a probe which is provided at the distal end of a cantilever and made of a material to be formed on a sample surface and the sample surface to measure a Force-Curve at each of multiple measuring points on the sample surface, calculating adhesion between a material making up the sample surface and the material to be formed on the sample surface at each of the measuring points from the result of measuring the Force-Curve, and forming an image of adhesion distribution on the sample surface from the adhesion calculated for each of the measuring points. With the present adhesion measuring apparatus and method, the condition of the sample surface can be accurately determined at an atomic level.
摘要翻译： 附着测量装置包括：测量装置，用于在样品表面上的多个测量点的每个测量点上使用在其远端设置的悬臂，用由要在样品表面上形成的材料制成的探针来测量力曲线;以及 分布图像形成装置，用于从测量装置的输出计算构成样品表面的材料与样品表面上形成的材料之间的粘合力，并在样品表面上形成粘合分布图像。 附着测量方法包括以下步骤：调整设置在悬臂的远端并由要形成在样品表面上的材料制成的探针与样品表面之间的间隔，以在多个样品中的每一个处测量力曲线 测量样品表面的测量点，从测量力曲线的结果计算构成样品表面的材料与待测样品表面上待形成的材料之间的粘附力，并形成粘附分布图 在样品表面上从为每个测量点计算的粘附力。 利用本粘合测量装置和方法，能够以原子级准确地确定样品表面的状态。
-
10.发明授权公开(公告)号：US11846611B2
公开(公告)日：2023-12-19
申请号：US17473090
申请日：2021-09-13
申请人： NUTECH VENTURES , UT-BATTELLE, LLC
发明人： Ruiguo Yang , Nikolay V. Lavrik , Amir Monemian Esfahani , Jordan Daniel Rosenbohm , Bahareh Tajvidi Safa , Grayson Minnick
CPC分类号： G01N3/08 , G01N3/06 , G01N19/04 , G01Q60/26 , G01N2203/0089 , G01N2203/0286 , G01Q60/28
摘要： A method of measuring a stress-strain curve in a cell-cell adhesion interface, the method including: providing a structure including a first movable island supported by a first beam, a second movable island supported by a second beam, and a gap therebetween connected by a pair of cells forming a junction, the pair of cells comprising a cell-cell adhesion interface having an initial length defined by a distance between nuclei of the pair of cells; moving the second movable island with a defined displacement; determining a displacement of the first movable island based on moving the second movable island; calculating a difference between the displacement of the first movable island and the defined displacement of the second movable island based on moving the second movable island; determining an applied strain in the cell-cell adhesion interface between the pair of cells based on the difference divided by the initial length of the cell-cell adhesion interface; calculating a force between the cell-cell adhesion interface of the pair of cells based on the displacement of the first movable island; calculating a stress in the cell-cell adhesion interface between the pair of cells based on the force; and determining the stress-strain curve of the cell-cell adhesion interface between the pair of cells by plotting the calculated stress against the applied strain.
-
-
-
-
-
-
-
-
-
搜索结果
30 条记录 (耗时 0.016 秒)
