公开(公告)号：US20110148492A1

公开(公告)日：2011-06-23

申请号：US13015484

申请日：2011-01-27

申请人： Tokunori AKITA

发明人： Tokunori AKITA

IPC分类号： H03L7/00

CPC分类号： G01R31/31922

摘要： Provided is a test apparatus comprising a synchronization module that operates according to a reference clock and outputs a synchronization signal with a prescribed period, and a test module that operates according to a high-frequency clock with a frequency that is n times a frequency of the reference clock. The test module includes a period emulator that emulates the synchronization signal, a phase shifter that shifts a phase of the high-frequency clock by an amount equal to a result of (i) the product of n and the emulated synchronization phase data by (ii) a period of the reference clock, and a test period generating section that generates a test period pulse signal that transitions at an edge timing of the shifted high-frequency clock and test period phase data indicating a phase difference between the test period signal and an edge timing of the test period pulse signal.

摘要翻译： 提供了一种测试装置，其包括根据参考时钟操作并输出规定周期的同步信号的同步模块，以及测试模块，其根据频率为n倍频的频率工作的高频时钟 参考时钟。 测试模块包括仿真同步信号的周期仿真器，移相器，其将高频时钟的相位移位等于（i）乘积n和仿真同步相位数据的乘积的乘积（ii） ）参考时钟的周期，以及测试周期产生部分，其产生在移位的高频时钟的边缘定时处转变的测试周期脉冲信号和指示测试周期信号和测试周期信号之间的相位差的测试周期相位数据 测试周期脉冲信号的边沿定时。

公开(公告)号：US08949062B2

公开(公告)日：2015-02-03

申请号：US12963516

申请日：2010-12-08

申请人： Tokunori Akita

发明人： Tokunori Akita

IPC分类号： G06F19/00 ,  G01R31/317

CPC分类号： G01R31/31725

摘要： Provided is a test module comprising a specified pattern detecting section that detects a specified pattern output in response to a specified test pattern from a device under test outputting output patterns in response to test patterns; a timing detecting section that detects a timing at which the specified pattern is detected; and a phase adjusting section that adjusts phases of the output patterns to match phases of expected value patterns, which are expected from the device under test as responses to the test patterns, based on the timing detected by the timing detecting section.

摘要翻译： 提供了一种测试模块，包括：指定模式检测部分，响应于测试模式，从被测器件响应于指定的测试模式检测指定的模式输出，输出输出模式; 定时检测部，检测检测到指定图案的定时; 以及相位调整部，其基于由所述定时检测部检测出的定时，调整所述输出图案的相位，以将从所述被测器件预期的期望值图案的相位匹配为对所述测试图案的响应。

公开(公告)号：US08418011B2

公开(公告)日：2013-04-09

申请号：US13035835

申请日：2011-02-25

申请人： Masaru Goishi ,  Tokunori Akita

发明人： Masaru Goishi ,  Tokunori Akita

IPC分类号： G01R31/28 ,  G06F7/58

CPC分类号： G01R31/318385 ,  G01R31/31813 ,  G01R31/31919

摘要： There is provided a test module comprising a random number generator that generates a pseudo random pattern and includes a controller that generates a register selection signal based on a control instruction stored on an instruction memory, a plurality of polynomial configuration registers one of which is selected by the register selection signal, each polynomial configuration register having polynomial data stored therein, a plurality of initial value configuration registers one of which is selected by the register selection signal, each initial value configuration register having an initial value stored therein, and a random number generation shift register that loads the initial value from the selected one of the plurality of initial value configuration registers and sequentially generates the pseudo random pattern based on the polynomial data stored in the selected one of the plurality of polynomial configuration registers.

摘要翻译： 提供了一种测试模块，包括产生伪随机模式的随机数发生器，并且包括基于存储在指令存储器上的控制指令来生成寄存器选择信号的控制器，多个多项式配置寄存器，其中一个由 寄存器选择信号，存储有多项式数据的各个多项式配置寄存器，其中一个由寄存器选择信号选择的多个初始值配置寄存器，其中存储有初始值的每个初始值配置寄存器和随机数生成 移位寄存器，其从所述多个初始值配置寄存器中的所选择的一个配置寄存器中加载初始值，并且基于存储在所述多个多项式配置寄存器中的所选择的多项式配置寄存器中的多项式数据来顺序地生成所述伪随机模式。

公开(公告)号：US20110145664A1

公开(公告)日：2011-06-16

申请号：US13015481

申请日：2011-01-27

申请人： Tokunori AKITA

发明人： Tokunori AKITA

IPC分类号： G11C29/02

CPC分类号： G11C29/56 ,  G11C29/56008

摘要： Provided is a test module that tests a device under test, comprising a pattern generating section that generates a test pattern supplied to the device under test and an expected value pattern corresponding to the test pattern, based on a pattern program; an output pattern acquiring section that acquires an output pattern output by the device under test in response to the test pattern; a comparing section that compares the output pattern output and the expected value pattern; a fail counter that counts the number of times the comparing section indicates a mismatch between the output pattern and the expected value pattern; and a control section that controls operation of the fail counter according to control instructions in the pattern program.

摘要翻译： 提供了一种测试被测设备的测试模块，包括：模式生成部分，其基于模式程序生成提供给被测设备的测试模式和与测试模式对应的期望值模式; 输出模式获取部，其根据测试图案获取被被测设备输出的输出图案; 比较部分，其比较输出模式输出和期望值模式; 计数比较部分指示输出模式和期望值模式之间不匹配的次数的失败计数器; 以及根据图案程序中的控制指令来控制故障计数器的操作的控制部分。

公开(公告)号：US08756465B2

公开(公告)日：2014-06-17

申请号：US13015481

申请日：2011-01-27

申请人： Tokunori Akita

发明人： Tokunori Akita

IPC分类号： G11C29/00

CPC分类号： G11C29/56 ,  G11C29/56008

摘要： Provided is a test module that tests a device under test, comprising a pattern generating section that generates a test pattern supplied to the device under test and an expected value pattern corresponding to the test pattern, based on a pattern program; an output pattern acquiring section that acquires an output pattern output by the device under test in response to the test pattern; a comparing section that compares the output pattern output and the expected value pattern; a fail counter that counts the number of times the comparing section indicates a mismatch between the output pattern and the expected value pattern; and a control section that controls operation of the fail counter according to control instructions in the pattern program.

摘要翻译： 提供了一种测试被测设备的测试模块，包括：模式生成部分，其基于模式程序生成提供给被测设备的测试模式和与测试模式对应的期望值模式; 输出模式获取部，其根据测试图案获取被被测设备输出的输出图案; 比较部分，其比较输出模式输出和期望值模式; 计数比较部分指示输出模式和期望值模式之间不匹配的次数的失败计数器; 以及根据图案程序中的控制指令来控制故障计数器的操作的控制部分。

公开(公告)号：US08433964B2

公开(公告)日：2013-04-30

申请号：US13015484

申请日：2011-01-27

申请人： Tokunori Akita

发明人： Tokunori Akita

IPC分类号： G01R31/28

CPC分类号： G01R31/31922

摘要： Provided is a test apparatus comprising a synchronization module that operates according to a reference clock and outputs a synchronization signal with a prescribed period, and a test module that operates according to a high-frequency clock with a frequency that is n times a frequency of the reference clock. The test module includes a period emulator that emulates the synchronization signal, a phase shifter that shifts a phase of the high-frequency clock by an amount equal to a result of (i) the product of n and the emulated synchronization phase data by (ii) a period of the reference clock, and a test period generating section that generates a test period pulse signal that transitions at an edge timing of the shifted high-frequency clock and test period phase data indicating a phase difference between the test period signal and an edge timing of the test period pulse signal.

摘要翻译： 提供了一种测试装置，其包括根据参考时钟操作并输出规定周期的同步信号的同步模块，以及测试模块，其根据频率为n倍频的频率工作的高频时钟 参考时钟。 测试模块包括仿真同步信号的周期仿真器，移相器，其将高频时钟的相位移位等于（i）乘积n和仿真同步相位数据的乘积的乘积（ii） ）参考时钟的周期，以及测试周期产生部分，其产生在移位的高频时钟的边缘定时处转变的测试周期脉冲信号和指示测试周期信号和测试周期信号之间的相位差的测试周期相位数据 测试周期脉冲信号的边沿定时。

公开(公告)号：US20110276830A1

公开(公告)日：2011-11-10

申请号：US13035835

申请日：2011-02-25

申请人： Masaru GOISHI ,  Tokunori AKITA

发明人： Masaru GOISHI ,  Tokunori AKITA

IPC分类号： G01R31/00

CPC分类号： G01R31/318385 ,  G01R31/31813 ,  G01R31/31919

摘要： There is provided a test module comprising a random number generator that generates a pseudo random pattern and includes a controller that generates a register selection signal based on a control instruction stored on an instruction memory, a plurality of polynomial configuration registers one of which is selected by the register selection signal, each polynomial configuration register having polynomial data stored therein, a plurality of initial value configuration registers one of which is selected by the register selection signal, each initial value configuration register having an initial value stored therein, and a random number generation shift register that loads the initial value from the selected one of the plurality of initial value configuration registers and sequentially generates the pseudo random pattern based on the polynomial data stored in the selected one of the plurality of polynomial configuration registers.

摘要翻译： 提供了一种测试模块，包括产生伪随机模式的随机数发生器，并且包括基于存储在指令存储器上的控制指令来生成寄存器选择信号的控制器，多个多项式配置寄存器，其中一个由 寄存器选择信号，存储有多项式数据的各个多项式配置寄存器，其中一个由寄存器选择信号选择的多个初始值配置寄存器，其中存储有初始值的每个初始值配置寄存器和随机数生成 移位寄存器，其从所述多个初始值配置寄存器中的所选择的一个配置寄存器中加载初始值，并且基于存储在所述多个多项式配置寄存器中的所选择的多项式配置寄存器中的多项式数据来顺序地生成所述伪随机模式。

公开(公告)号：US20110137605A1

公开(公告)日：2011-06-09

申请号：US12963516

申请日：2010-12-08

申请人： Tokunori AKITA

发明人： Tokunori AKITA

IPC分类号： G06F19/00

CPC分类号： G01R31/31725

摘要： Provided is a test module comprising a specified pattern detecting section that detects a specified pattern output in response to a specified test pattern from a device under test outputting output patterns in response to test patterns; a timing detecting section that detects a timing at which the specified pattern is detected; and a phase adjusting section that adjusts phases of the output patterns to match phases of expected value patterns, which are expected from the device under test as responses to the test patterns, based on the timing detected by the timing detecting section.

摘要翻译： 提供了一种测试模块，包括：指定模式检测部分，响应于测试模式，从被测器件响应于指定的测试模式检测指定的模式输出，输出输出模式; 定时检测部，检测检测到指定图案的定时; 以及相位调整部，其基于由所述定时检测部检测出的定时，调整所述输出图案的相位，以将从所述被测器件预期的期望值图案的相位匹配为对所述测试图案的响应。