摘要:
A timing verification device for performing effective timing verification while correctly taking variation into account. The timing verification device receives a technology file and extracts a coefficient of variation for each cell based on conditions of the manufacturing process of a semiconductor integrated circuit. The timing verification device receives a timing list and computes the variation amounts corresponding to the rise and fall of a clock signal or a correction coefficient obtained by taking into account the correlation between the rise and the fall based on the extracted coefficients of variation. The timing verification device re-computes a delay time using the amount of variation or the correction coefficient and determines the pulse width and the timing based on the recomputed delay time to output the determination result as a timing report.
摘要:
A timing verification apparatus calculates a pulse width variation coefficient based on a pulse width of an input clock signal, a delay value of the clock signal, and an operation frequency. The apparatus then calculates the pulse width for a delayed clock signal provided to a clock input terminal of a flip flop (FF) using the pulse width variation coefficient. Further, the apparatus compares the calculated pulse width with a standard value. The timing verification apparatus calculates the pulse width of the delayed clock signal provided to the clock input terminal of the FF using the pulse width of the clock signal, and a rise delay and a fall delay of the path. The apparatus considers on-chip variations and accurately executes timing verification for signals.
摘要:
OCV coefficients in a path being an analysis target according to the number of gate stages are calculated in a coefficient arithmetically operating unit by canceling off a variation in delay in each gate in accordance with the number of gate stages in the target path, and timing analysis of the target path is performed in a timing analysis unit by using the OCV coefficient with the number of gate stages being considered, whereby a variation degree in the entire path is reduced in accordance with the number of gate stages in the target path, thus making it possible to carry out accurate timing analysis in consideration of the variation in a chip of a semiconductor integrated circuit.
摘要:
This invention intends to provide timing analysis methods, timing analysis programs, and timing analysis tools for the purpose of performing timing verification in optimum conditions without any excessive variations by statistically dealing with variations in elemental devices forming a semiconductor integrated circuit. In order to verify a timing between two signals, a delay value of a signal propagating through a signal path selected as a candidate for timing analysis is obtained, and with respect to a random variation amount of the delay value, a random variation amount corresponding to the number of gate circuit stages forming the signal path is obtained. Then, based on the delay value and the random variation amount, a most severe variation amount between the two signals in a most severe operating condition is obtained, and based on the most severe variation amount, a respective individual variation coefficient is allocated for each gate circuit, thereby performing a timing analysis.
摘要:
A library generation device determines a characteristic approximation function based on a characteristic extraction table to calculate characteristic data corresponding to a client's conditions in accordance with the characteristic approximation function. A library for verification including the calculated characteristic data and format information of a reference library is generated in the same format as the reference library.
摘要:
A timing verification apparatus calculates a pulse width variation coefficient based on a pulse width of an input clock signal, a delay value of the clock signal, and an operation frequency. The apparatus then calculates the pulse width for a delayed clock signal provided to a clock input terminal of a flip flop (FF) using the pulse width variation coefficient. Further, the apparatus compares the calculated pulse width with a standard value. The timing verification apparatus calculates the pulse width of the delayed clock signal provided to the clock input terminal of the FF using the pulse width of the clock signal, and a rise delay and a fall delay of the path. The apparatus considers on-chip variations and accurately executes timing verification for signals.
摘要:
A library generation device determines a characteristic approximation function based on a characteristic extraction table to calculate characteristic data corresponding to a client's conditions in accordance with the characteristic approximation function. A library for verification including the calculated characteristic data and format information of a reference library is generated in the same format as the reference library.
摘要:
A timing analysis device for preventing the amount of data and the number of analysis operations from increasing in a statistical analysis, while improving the timing convergence in a path included in a net under relatively strict timing conditions. The timing analysis device performs a static timing analysis to extract a net under relatively strict timing conditions from the analysis result and generate a timing list. The device further performs delay distribution calculation for the extracted net to analyze the delay variation in each of one or more instances included in the net. The device retrieves the timing list and sets a unique delay variation for each instance to calculate a delay distribution. The device further performs a statistical timing analysis based on the calculated delay distribution.
摘要:
A signal timing analysis method for analyzing timing of a signal propagated along a path including instances. The method includes performing a delay calculation, generating files storing delay information, input slew rate, and output capacitance, performing static timing analysis (STA) based on the delay information, and generating an analysis result. The method includes calculating a delay distribution based on the input slew rate and output capacitance, a probability distribution of a delay time, a probability distribution of a transition time, and a correlation between the delay time and the transition time. The calculation of the delay distribution includes inputting an input slew rate distribution taking into consideration a correlation between output delay and transition distributions for the instance in a preceding stage. The method includes performing STA on the signal propagated along the path based on the analysis result of the STA and delay distribution.
摘要:
This invention intends to provide timing analysis methods, timing analysis programs, and timing analysis tools for the purpose of performing timing verification in optimum conditions without any excessive variations by statistically dealing with variations in elemental devices forming a semiconductor integrated circuit. In order to verify a timing between two signals, a delay value of a signal propagating through a signal path selected as a candidate for timing analysis is obtained, and with respect to a random variation amount of the delay value, a random variation amount corresponding to the number of gate circuit stages forming the signal path is obtained. Then, based on the delay value and the random variation amount, a most severe variation amount between the two signals in a most severe operating condition is obtained, and based on the most severe variation amount, a respective individual variation coefficient is allocated for each gate circuit, thereby performing a timing analysis.