ANTENNA ALIGNMENT APPARATUS
    2.
    发明申请

    公开(公告)号:US20230112451A1

    公开(公告)日:2023-04-13

    申请号:US17663960

    申请日:2022-05-18

    IPC分类号: G01S19/53 H01Q3/08

    摘要: An antenna alignment apparatus may include magnetic field sensors as an alternative to or in addition to GNSS sensors. The magnetic field sensors may measure the earth's magnetic fields at corresponding locations, and a processor may use the measurements to calculate at least one of a roll, tilt, or azimuth of an antenna. A declination based on GNSS based alignment and magnetic field sensor alignment may be stored for an adjustment of magnetic field sensor based azimuth calculations. For an optical alignment, the antenna alignment apparatus may, additionally or alternately, include a reference object (e.g., a printed mark or a physical stud) located within a field of view of a camera. A location of the reference object may indicate the alignment of the antenna vis-à-vis the structures within the field of view.

    Modular test and measurement device

    公开(公告)号:US11601829B2

    公开(公告)日:2023-03-07

    申请号:US16938668

    申请日:2020-07-24

    IPC分类号: H04W24/08 H04M1/24 H04W88/06

    摘要: A modular test instrument for performing tests and measurements in a network is disclosed. The modular test instrument may include a modular processing unit comprising a processor and memory, the modular processing unit connectable to at least one modular test unit or modular test subunit. The modular test instrument may also include a modular display unit connectable to the modular processing unit or the modular test unit. Display modularity may enable quick and cost-efficient display replacement when damage, malfunction, or failure is incurred. Furthermore, the modular test instrument may include an additional modular test subunit connectable to at least one of the modular processing unit or the modular test unit. When the modular processing unit is fitted with the modular display unit, the modular least, or modular test subunit, for example, the modular test instrument may form an integrated test instrument for performing any number of tests and measurements associated with installation, troubleshooting, or maintenance of a long-term evolution (LTE) or 5G network.

    Alignment guide for inspecting a fiber optic end face

    公开(公告)号:US11585985B2

    公开(公告)日:2023-02-21

    申请号:US17305902

    申请日:2021-07-16

    发明人: Kevin Cassady

    IPC分类号: G02B6/36 G02B6/38

    摘要: An optical fiber inspection system may include an alignment guide having a sleeve portion and a mechanical key structure. The sleeve portion may comprise a first opening arranged to be proximal to one or more optical components in an inspection device and a second opening arranged to be distal to the one or more optical components when the alignment guide is removably engaged with the inspection device. The mechanical key structure may be located adjacent to the second opening and have a shape to engage a geometry of one or more recesses in a bulkhead. Accordingly, the alignment guide may stabilize the inspection device at a particular angle relative to an end face of an object in a field of view of the one or more optical components when a shaft of the inspection device is inserted into the bulkhead.

    BLIND SCAN FOR MULTI-CARRIERS AND MULTI-TECHNOLOGIES AND SEAMLESS SIGNAL ANALYSIS

    公开(公告)号:US20230052023A1

    公开(公告)日:2023-02-16

    申请号:US17885913

    申请日:2022-08-11

    IPC分类号: H04L43/0852 H04L41/22

    摘要: A test device for performing a bling scan includes a digital blind scan circuit. The blind scan circuit includes digital detectors for multiple cellular technologies that simultaneously perform correlation in a baseband frequency range to detect whether received RF signals include a channel of the technologies. The test device launches, responsive to detecting a channel from the blind scan, a signal analysis or a spectrum analysis application for the channel according to a carrier frequency and a technology identified for the channel by the blind scan.

    Focusing linear model correction and linear model correction for multivariate calibration model maintenance

    公开(公告)号:US11561166B2

    公开(公告)日:2023-01-24

    申请号:US17249572

    申请日:2021-03-05

    IPC分类号: G01N21/27 G06F17/18

    摘要: A device may obtain a master beta coefficient of a master calibration model associated with a master instrument. The master beta coefficient may be at a grid of a target instrument. The device may perform constrained optimization of an objective function, in accordance with a set of constraints, in order to determine a pair of transferred beta coefficients. The constrained optimization may be performed based on an initial pair of transferred beta coefficients, the master beta coefficient, and spectra associated with a scouting set. The device may determine, based on the pair of transferred beta coefficients, a transferred beta coefficient. The device may determine a final transferred beta coefficient based on a set of transferred beta coefficients including the transferred beta coefficient. The final transferred beta coefficient may be associated with generating a transferred calibration model, corresponding to the master calibration model, for use by the target instrument.