System and method for measuring a harvest quality parameter on a harvesting device
    1.
    发明授权
    System and method for measuring a harvest quality parameter on a harvesting device 有权
    用于测量收获装置上收获质量参数的系统和方法

    公开(公告)号:US07859674B2

    公开(公告)日:2010-12-28

    申请号:US11942293

    申请日:2007-11-19

    IPC分类号: G01N21/55

    摘要: A system and method for measuring a quality parameter of a harvested crop are provided. Specifically, the system is adapted to be carried by a harvesting device such that a sensor is enclosed in a controlled environment and such that the sensor is capable of precisely and reliably measuring the quality parameter while the harvesting device is in operation. The system includes a verification device and an actuator device contained within the controlled environment. The actuator device periodically conveys the sensor device to at least one of a verification position relative to the verification device and a measurement position. Thus, the sensor device may be periodically and reliably referenced and/or validated while in use in harsh agricultural environments such that the sensor device is capable of accurately measuring the quality parameter as the crop is harvested.

    摘要翻译: 提供了一种用于测量收获的作物的质量参数的系统和方法。 具体地,该系统适于由收获装置携带,使得传感器被封闭在受控的环境中,并且使得传感器能够在收获装置运行时精确而可靠地测量质量参数。 该系统包括验证装置和包含在受控环境内的致动器装置。 致动器装置周期性地将传感器装置传送到相对于验证装置的验证位置和测量位置中的至少一个。 因此,传感器装置可以在恶劣的农业环境中使用时周期性地和可靠地参考和/或验证,使得传感器装置在收获作物时能够精确地测量质量参数。

    Apparatus and method for presenting a particulate sample to the scanning field of a sensor device
    2.
    发明授权
    Apparatus and method for presenting a particulate sample to the scanning field of a sensor device 有权
    将颗粒样品呈现给传感器装置的扫描场的装置和方法

    公开(公告)号:US07765882B2

    公开(公告)日:2010-08-03

    申请号:US12024548

    申请日:2008-02-01

    IPC分类号: B01F15/02 G01N1/20

    摘要: An apparatus and method for presenting various surfaces of particles within a sample to a sensor device is provided. More particularly, embodiments of the present invention provide a pair of concentric counter-rotating surfaces and a dividing member fixed radially therebetween so as to form a scanning chamber wherein sample particles are reoriented relative to the scanning field of an adjacent sensor device by the counter-rotation of the surfaces and the consequent recirculation of the sample particles through the scanning chamber.

    摘要翻译: 提供了一种用于将样品内的颗粒的各种表面呈现给传感器装置的装置和方法。 更具体地,本发明的实施例提供一对同心的反向旋转表面和径向地固定在其间的分隔构件,以形成扫描室,其中相对于相邻传感器装置的扫描场,样品颗粒被重新定向, 表面的旋转和随后的样品颗粒通过扫描室的再循环。

    SYSTEM AND METHOD FOR MEASURING A HARVEST QUALITY PARAMETER ON A HARVESTING DEVICE
    3.
    发明申请
    SYSTEM AND METHOD FOR MEASURING A HARVEST QUALITY PARAMETER ON A HARVESTING DEVICE 有权
    用于测量收集设备上的收集质量参数的系统和方法

    公开(公告)号:US20080137087A1

    公开(公告)日:2008-06-12

    申请号:US11942293

    申请日:2007-11-19

    IPC分类号: G01N21/55

    摘要: A system and method for measuring a quality parameter of a harvested crop are provided. Specifically, the system is adapted to be carried by a harvesting device such that a sensor is enclosed in a controlled environment and such that the sensor is capable of precisely and reliably measuring the quality parameter while the harvesting device is in operation. The system includes a verification device and an actuator device contained within the controlled environment. The actuator device periodically conveys the sensor device to at least one of a verification position relative to the verification device and a measurement position. Thus, the sensor device may be periodically and reliably referenced and/or validated while in use in harsh agricultural environments such that the sensor device is capable of accurately measuring the quality parameter as the crop is harvested.

    摘要翻译: 提供了一种用于测量收获的作物的质量参数的系统和方法。 具体地,该系统适于由收获装置携带,使得传感器被封闭在受控的环境中,并且使得传感器能够在收获装置运行时精确而可靠地测量质量参数。 该系统包括验证装置和包含在受控环境内的致动器装置。 致动器装置周期性地将传感器装置传送到相对于验证装置的验证位置和测量位置中的至少一个。 因此,传感器装置可以在恶劣的农业环境中使用时周期性地和可靠地参考和/或验证,使得传感器装置在收获作物时能够精确地测量质量参数。

    Apparatus and method for presenting a particulate sample to the scanning field of a sensor device
    4.
    发明授权
    Apparatus and method for presenting a particulate sample to the scanning field of a sensor device 有权
    将颗粒样品呈现给传感器装置的扫描场的装置和方法

    公开(公告)号:US08122777B2

    公开(公告)日:2012-02-28

    申请号:US12775316

    申请日:2010-05-06

    IPC分类号: B01F15/02 G01N1/20

    摘要: A method for presenting various surfaces of particles within a sample to a sensor device is provided. More particularly, embodiments of the present invention provide a method for presenting a sample comprising a plurality of sample particles to a scanning field defined by a sensor device, the method including directing the sample into a scanning chamber configured to contain at least a portion of the scanning field of the sensor device, subjecting the sample to different relative velocities, and redirecting the sample into the scanning chamber such that the plurality of sample particles of the sample are reoriented relative to the scanning field defined by the sensor device. In some embodiments, at least one trait of the sample is measured with the sensor device.

    摘要翻译: 提供了一种用于将样品内的颗粒的各种表面呈现给传感器装置的方法。 更具体地,本发明的实施例提供了一种用于将包含多个样品颗粒的样品呈现到由传感器装置限定的扫描场的方法,所述方法包括将样品引导到扫描室中,所述扫描室被配置为容纳至少一部分 扫描场,对样品进行不同的相对速度,并将样品重定向到扫描室,使得样品的多个样品颗粒相对于由传感器装置限定的扫描场重新定向。 在一些实施例中,用传感器装置测量样品的至少一个性状。

    APPARATUS AND METHOD FOR PRESENTING A PARTICULATE SAMPLE TO THE SCANNING FIELD OF A SENSOR DEVICE
    5.
    发明申请
    APPARATUS AND METHOD FOR PRESENTING A PARTICULATE SAMPLE TO THE SCANNING FIELD OF A SENSOR DEVICE 有权
    将传感器装置的扫描场的分析样品呈现的装置和方法

    公开(公告)号:US20100212408A1

    公开(公告)日:2010-08-26

    申请号:US12775316

    申请日:2010-05-06

    IPC分类号: G01N1/28

    摘要: A method for presenting various surfaces of particles within a sample to a sensor device is provided. More particularly, embodiments of the present invention provide a method for presenting a sample comprising a plurality of sample particles to a scanning field defined by a sensor device, the method including directing the sample into a scanning chamber configured to contain at least a portion of the scanning field of the sensor device, subjecting the sample to different relative velocities, and redirecting the sample into the scanning chamber such that the plurality of sample particles of the sample are reoriented relative to the scanning field defined by the sensor device. In some embodiments, at least one trait of the sample is measured with the sensor device.

    摘要翻译: 提供了一种用于将样品内的颗粒的各种表面呈现给传感器装置的方法。 更具体地,本发明的实施例提供了一种用于将包含多个样品颗粒的样品呈现到由传感器装置限定的扫描场的方法,所述方法包括将样品引导到扫描室中,所述扫描室被配置为容纳至少一部分 扫描场,对样品进行不同的相对速度,并将样品重定向到扫描室,使得样品的多个样品颗粒相对于由传感器装置限定的扫描场重新定向。 在一些实施例中,用传感器装置测量样品的至少一个性状。

    APPARATUS AND METHOD FOR PRESENTING A PARTICULATE SAMPLE TO THE SCANNING FIELD OF A SENSOR DEVICE
    6.
    发明申请
    APPARATUS AND METHOD FOR PRESENTING A PARTICULATE SAMPLE TO THE SCANNING FIELD OF A SENSOR DEVICE 有权
    将传感器装置的扫描场的分析样品呈现的装置和方法

    公开(公告)号:US20080184821A1

    公开(公告)日:2008-08-07

    申请号:US12024548

    申请日:2008-02-01

    IPC分类号: G01N3/08

    摘要: An apparatus and method for presenting various surfaces of particles within a sample to a sensor device is provided. More particularly, embodiments of the present invention provide a pair of concentric counter-rotating surfaces and a dividing member fixed radially therebetween so as to form a scanning chamber wherein sample particles are reoriented relative to the scanning field of an adjacent sensor device by the counter-rotation of the surfaces and the consequent recirculation of the sample particles through the scanning chamber.

    摘要翻译: 提供了一种用于将样品内的颗粒的各种表面呈现给传感器装置的装置和方法。 更具体地,本发明的实施例提供一对同心的反向旋转表面和径向地固定在其间的分隔构件,以便形成扫描室,其中相对于相邻传感器装置的扫描场,样品颗粒被重新定向, 表面的旋转和随后的样品颗粒通过扫描室的再循环。