公开(公告)号：US20080136431A1

公开(公告)日：2008-06-12

申请号：US12069814

申请日：2008-02-13

Applicant: Kuang-Jung Li ,  Chin-Chen Hsu ,  Yi-Li Lin ,  Shyan-l Wu

Inventor： Kuang-Jung Li ,  Chin-Chen Hsu ,  Yi-Li Lin ,  Shyan-l Wu

IPC: G01R31/02

CPC classification number: G01R31/2889

Abstract: An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit. The switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles.

公开(公告)号：US20100109692A1

公开(公告)日：2010-05-06

申请号：US12685745

申请日：2010-01-12

Applicant: Kuang-Jung LI ,  Chin-Chen HSU ,  Yi-Li Lin ,  Shyan-I Wu

Inventor： Kuang-Jung LI ,  Chin-Chen HSU ,  Yi-Li Lin ,  Shyan-I Wu

IPC: G01R31/02

CPC classification number: G01R31/2889

Abstract: An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit. The switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles.

Abstract translation: 一种用于多个探针的电子元件测试装置。 每个探头都有一个下极和一个上极。 该装置包括：具有第一侧和第二侧的第一板，所述第一侧具有布置在其周围的下极区的阵列，每个下极区被配置为接收探针的下极; 以及设置在下极区阵列附近的多个信号导体区域，每个信号导体区域布置成在下极区域和开关电路之间提供非电缆电路径。 切换电路可操作以经由上极和下极顺序地将每个电子元件连接到测试电路。

公开(公告)号：US07671611B2

公开(公告)日：2010-03-02

申请号：US12069814

申请日：2008-02-13

Applicant: Kuang-Jung Li ,  Chin-Chen Hsu ,  Yi-Li Lin ,  Shyan-I Wu

Inventor： Kuang-Jung Li ,  Chin-Chen Hsu ,  Yi-Li Lin ,  Shyan-I Wu

IPC: G01R31/02 ,  G01R31/28

CPC classification number: G01R31/2889

Abstract: An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit. The switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles.

Abstract translation: 一种用于多个探针的电子元件测试装置。 每个探头都有一个下极和一个上极。 该装置包括：具有第一侧和第二侧的第一板，所述第一侧具有布置在其周围的下极区的阵列，每个下极区被配置为接收探针的下极; 以及设置在下极区阵列附近的多个信号导体区域，每个信号导体区域布置成在下极区域和开关电路之间提供非电缆电路径。 切换电路可操作以经由上极和下极顺序地将每个电子元件连接到测试电路。

公开(公告)号：US07374293B2

公开(公告)日：2008-05-20

申请号：US11090900

申请日：2005-03-25

Applicant: Kuang-Jung Li ,  Chin-Chen Hsu ,  Yi-Li Lin ,  Shyan-I Wu

Inventor： Kuang-Jung Li ,  Chin-Chen Hsu ,  Yi-Li Lin ,  Shyan-I Wu

IPC: G01R31/02 ,  G01R31/26

CPC classification number: G01R31/2889

Abstract: An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit. The switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles.

Abstract translation: 一种用于多个探针的电子元件测试装置。 每个探头都有一个下极和一个上极。 该装置包括：具有第一侧和第二侧的第一板，所述第一侧具有布置在其周围的下极区的阵列，每个下极区被配置为接收探针的下极; 以及设置在下极区阵列附近的多个信号导体区域，每个信号导体区域布置成在下极区域和开关电路之间提供非电缆电路径。 切换电路可操作以经由上极和下极顺序地将每个电子元件连接到测试电路。

公开(公告)号：US08130006B2

公开(公告)日：2012-03-06

申请号：US12685745

申请日：2010-01-12

Applicant: Kuang-Jung Li ,  Chin-Chen Hsu ,  Yi-Li Lin ,  Shyan-I Wu

Inventor： Kuang-Jung Li ,  Chin-Chen Hsu ,  Yi-Li Lin ,  Shyan-I Wu

IPC: G01R31/02 ,  G01R31/26

CPC classification number: G01R31/2889

Abstract: An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit. The switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles.

Abstract translation: 一种用于多个探针的电子元件测试装置。 每个探头都有一个下极和一个上极。 该装置包括：具有第一侧和第二侧的第一板，所述第一侧具有布置在其周围的下极区的阵列，每个下极区被配置为接收探针的下极; 以及设置在下极区阵列附近的多个信号导体区域，每个信号导体区域布置成在下极区域和开关电路之间提供非电缆电路径。 切换电路可操作以经由上极和下极顺序地将每个电子元件连接到测试电路。