摘要:
The present invention is a semiconductor integrated circuit device including a target circuit, a voltage supply circuit that supplies the power supply voltage to the target circuit, a control circuit that controls an output voltage of the voltage supply circuit, and a target voltage prediction circuit that predicts a voltage value of the power supply voltage. The control circuit changes the output voltage of the voltage supply circuit by a predetermined voltage value. The target voltage prediction circuit detects a change amount of an operating frequency of the target circuit along with the change of the predetermined voltage value, and calculates a target voltage value based on a relation between the change amount of the operating frequency and the predetermined voltage value. The voltage supply circuit supplies a power supply voltage corresponding to the target voltage value to the target circuit.
摘要:
A semiconductor integrated circuit is capable of accurately detecting the characteristics of a chip. The semiconductor integrated circuit includes a monitor circuit and a control circuit. The control circuit generates a clock pulse signal having M successive pulses (M is 2 or a greater integer), and outputs the clock pulse signal to the monitor circuit. The monitor circuit includes a frequency divider and a ring oscillator. The frequency divider frequency divides the clock pulse signal by M and generates the resulting signal as an enable signal. The ring oscillator generates an oscillation signal as a monitor output value during a period defined in accordance with the enable signal.
摘要:
A substrate bias is controlled such that a leakage current is minimum. A semiconductor integrated circuit device comprises a leakage detecting circuit which detects a leakage current by using leakage detecting MOSFETs, a control circuit which generates a control signal depending on an output from the leakage detecting circuit, a substrate bias generating circuit which changes a substrate bias depending on the control signal, and a controlled circuit including a MOSFET having the same characteristics as that of each of the leakage detecting MOSFETs. The leakage detecting circuit detects a substrate leakage current which includes as the substrate bias becomes deep and a subthreshold leakage current which decreases as the substrate bias becomes deep. A control signal is transmitted to the substrate bias generating circuit such that the substrate bias is made deep when the substrate leakage current is smaller than the subthreshold leakage current and such that the substrate bias is made shallow when the substrate leakage current is larger than the subthreshold leakage current.
摘要:
The present invention is a semiconductor integrated circuit device including a target circuit, a voltage supply circuit that supplies the power supply voltage to the target circuit, a control circuit that controls an output voltage of the voltage supply circuit, and a target voltage prediction circuit that predicts a voltage value of the power supply voltage. The control circuit changes the output voltage of the voltage supply circuit by a predetermined voltage value. The target voltage prediction circuit detects a change amount of an operating frequency of the target circuit along with the change of the predetermined voltage value, and calculates a target voltage value based on a relation between the change amount of the operating frequency and the predetermined voltage value. The voltage supply circuit supplies a power supply voltage corresponding to the target voltage value to the target circuit.
摘要:
A semiconductor integrated circuit device includes: a target circuit whose at least power supply voltage is variable; a power supply voltage providing circuit feeding the target circuit with a power supply voltage; and a minimum energy point monitor circuit detecting an energy-minimizing power supply voltage which minimizes a change in the energy consumed by the target circuit upon a change in the power supply voltage. The power supply voltage delivered by the power supply voltage providing circuit is controlled so as to be equal to the energy-minimizing power supply voltage detected by the minimum energy point monitor circuit.
摘要:
A semiconductor integrated circuit device includes: a target circuit whose at least power supply voltage is variable; a power supply voltage providing circuit feeding the target circuit with a power supply voltage; and a minimum energy point monitor circuit detecting an energy-minimizing power supply voltage which minimizes a change in the energy consumed by the target circuit upon a change in the power supply voltage. The power supply voltage delivered by the power supply voltage providing circuit is controlled so as to be equal to the energy-minimizing power supply voltage detected by the minimum energy point monitor circuit.
摘要:
A substrate bias is controlled such that a leakage current is minimum. A semiconductor integrated circuit device comprises a leakage detecting circuit which detects a leakage current by using leakage detecting MOSFETs, a control circuit which generates a control signal depending on an output from the leakage detecting circuit, a substrate bias generating circuit which changes a substrate bias depending on the control signal, and a controlled circuit including a MOSFET having the same characteristics as that of each of the leakage detecting MOSFETs. The leakage detecting circuit detects a substrate leakage current which includes as the substrate bias becomes deep and a subthreshold leakage current which decreases as the substrate bias becomes deep. A control signal is transmitted to the substrate bias generating circuit such that the substrate bias is made deep when the substrate leakage current is smaller than the subthreshold leakage current and such that the substrate bias is made shallow when the substrate leakage current is larger than the subthreshold leakage current.
摘要:
A power supply voltage control circuit controls power supply voltage supplied to a target circuit that performs certain signal processing. The power supply voltage control circuit includes a control signal generation circuit that selectively generates first and second control signals when the power supply voltage supplied to the target circuit is increased from a first power supply voltage to a second power supply voltage, the second power supply voltage being higher than the first power supply voltage, and a power supply circuit that increases the power supply voltage toward a voltage level of the second power supply voltage based on the first control signal, or increases the power supply voltage to a voltage level higher than the second power supply voltage first and subsequently decreases the power supply voltage to the second power supply voltage based on the second control signal.
摘要:
When an operation of a specified one of monitor circuits is defective or any of elements forming a ring oscillator in each of the monitor circuits has characteristic abnormality, if voltage control is performed based on a result from the monitor operating at a lowest speed, a required voltage may be overestimated. This results in an increase in power consumption, and also causes an accuracy reduction when the average value of detection results from the multiple monitors is calculated. The multiple monitor circuits are provided. Of the detection results therefrom, any detection result falling outside a predetermined range is ignored, and the average value of the remaining monitor results is used as a final monitor detection value.
摘要:
When an operation of a specified one of monitor circuits is defective or any of elements forming a ring oscillator in each of the monitor circuits has characteristic abnormality, if voltage control is performed based on a result from the monitor operating at a lowest speed, a required voltage may be overestimated. This results in an increase in power consumption, and also causes an accuracy reduction when the average value of detection results from the multiple monitors is calculated. The multiple monitor circuits are provided. Of the detection results therefrom, any detection result falling outside a predetermined range is ignored, and the average value of the remaining monitor results is used as a final monitor detection value.