摘要:
An absolute position measurement apparatus measures an absolute position of an object to be measured using a first light source and a second light source which has coherency lower than that of the first light source. The absolute position measurement apparatus includes a measurement part which measures a point where phases of interference signals from the first and the second light sources coincide with each other or a point where an intensity of the interference signal from the second light source is maximized, an origin defining part which defines the point measured by the measurement part as an origin position, a phase storing part which stores the phase of the interference signal from the first light source at the origin position, an origin redefining part which redefines the origin position, and a position calculating part which calculates the absolute position of the object to be measured.
摘要:
A detection apparatus detecting an error component contained in two signals (A, B) approximated by a cosine and sine functions representing an object position, the detection apparatus including an arithmetic portion (3, 4) which reduces an error contained in the signals (A, B) based on an error prediction value to output two error correction signals (A*, B*), a phase arithmetic portion (5) which calculates a phase (θ) based on the error correction signals (A*, B*), an arithmetic storage unit (9, 10) which stores the error correction signals (A*, B*) and a plurality of sampling values of the phase (θ), and a Fourier transform portion (11, 12) which obtains coefficients αk, βk, γk, and δk in the following two expressions: A*=α0+α1 cos θ+β1 sin θ+ . . . +αk cos kθ+βk sin kθ B*=γ0+γ1 cos θ+δ1 sin θ+ . . . +γk cos kθ+δk sin kθ (k≧2) wherein the arithmetic portion (3, 4) updates the error prediction value using the coefficients.
摘要翻译:一种检测装置,其检测由表示物体位置的余弦和正弦函数近似的两个信号(A,B)中包含的误差分量,所述检测装置包括运算部(3,4),其减少包含在信号(A ,B)基于误差预测值输出两个误差校正信号(A *,B *),相位运算部分(5),其根据纠错信号(A *,B *)计算相位(theta) ,存储纠错信号(A *,B *)和相位(theta)的多个采样值的算术存储单元(9,10)以及获得系数alphak的傅立叶变换部分(11,12) ,betak,gammak和deltak在以下两个表达式中:A * = alpha0 + alpha1cosθ+ beta1sinθ+。 。 。 + alphak cos ktheta + betak sin ktata B * = gamma0 + gamma1cosθ+ delta1sinθ+。 。 。 + gammak cos ktheta + deltak sin ktheta(k> = 2)其中运算部分(3,4)使用系数更新误差预测值。
摘要:
A method for forming a magnetic pattern by applying a first external magnetic field to a magnetic recording medium having a magnetic layer to magnetize uniformly the magnetic layer in a predetermined direction and heating locally the magnetic layer while a second external magnetic field is applied thereto, whereby the heated portion is magnetized in the direction opposite to the predetermined direction, wherein the second external magnetic field has a pulse-like magnetic field component. The method can form a fine magnetic pattern efficiently in a medium for high density recording, and a magnetic recording medium and a magnetic recording device capable of recording with high density can be provided economically in a short time.
摘要:
A detection apparatus detecting an error component contained in two signals (A, B) approximated by a cosine and sine functions representing an object position, the detection apparatus including an arithmetic portion (3, 4) which reduces an error contained in the signals (A, B) based on an error prediction value to output two error correction signals (A*, B*), a phase arithmetic portion (5) which calculates a phase (θ) based on the error correction signals (A*, B*), an arithmetic storage unit (9, 10) which stores the error correction signals (A*, B*) and a plurality of sampling values of the phase (θ), and a Fourier transform portion (11, 12) which obtains coefficients αk, βk, γk, and δk in the following two expressions: A*=α0+α1 cos θ+β1 sin θ+ . . . +αk cos kθ+βk sin kθ B*=γ0+γ1 cos θ+δ1 sin θ+ . . . +γk cos kθ+δk sin kθ (k≧2) wherein the arithmetic portion (3, 4) updates the error prediction value using the coefficients.
摘要:
A measurement apparatus of the present invention is configured to measure a position of an object to be measured using two signals approximated by a cosine function and a sine function representing the position of the object to be measured, the measurement apparatus including a regression arithmetic unit (7-1, 7-2) configured to perform a regression calculation for corresponding one of the two signals, an interpolation arithmetic unit (8-1, 8-2) configured to obtain a value at a specific phase of the corresponding one of the two signals using information calculated by the regression arithmetic unit, and an error correction portion (6-1, 6-2) configured to correct an error estimated from the value at the specific phase of the corresponding one of the two signals obtained by the interpolation arithmetic unit.
摘要:
A method and device for forming a magnetic pattern in a magnetic recording medium, a magnetic recording medium formed thereby and a magnetic recording device that includes a magnetic recording medium formed by this method and/or device. The magnetic recording medium has a magnetic layer, a protective layer, and a lubricant layer formed on a substrate in this order, and the magnetic pattern is formed by locally heating the magnetic layer and applying an external magnetic field to the magnetic layer.
摘要:
A backelectromotive force of an aluminum electrolysis cell is measured by the steps of: (a) repeatedly measuring voltage V and current I of the cell at a short interval; (b) forming groups of data each including measured values thus obtained within a relative short period; (c) calculating a constant e and its variance Ve with reference to each data group according to a linear regression expressed by an equation:V=r.multidot.I+ewhere r represents an internal resistance of the cell; (d) calculating a backelectromotive force E and its variance V.sub.E at a given time based on the constant e and its variance Ve calculated at the step (c), a backelectromotive force E' and its variance V'.sub.E with reference to a data group preceding the given time and a constant V.sub.T, and according to the following equations:P=(V'.sub.E +V.sub.T)/(Ve+V'.sub.E +V.sub.T)E=P.multidot.e+(1-P).multidot.E'V.sub.E =P.sup.2 .multidot.Ve+(1-P).sup.2 .multidot.(V'.sub.E +V.sub.T);and (e) repeating the steps (b), (c) and (d) at a relatively short interval.
摘要:
The apparatus corrects multi-phase signals for detecting a position of an object and obtains a phase corresponding to the position of the object. The apparatus includes a correcting unit correcting the multi-phase signals with error coefficients, respectively, a phase calculating unit performing calculation for the corrected multi-phase signals to obtain the phase, a regression unit performing regression for the calculated phases to obtain reference phases, a Fourier transform unit respectively performing Fourier transform for the corrected multi-phase signals whose phases having been respectively changed into the reference phases, and an updating unit updating, using Fourier coefficients obtained by the Fourier transform unit, the error coefficients respectively corresponding to the Fourier coefficients. The updating unit updates the error coefficients if a regression error in the regression performed by the regression unit satisfies a predetermined condition.
摘要:
An absolute position measurement apparatus measures an absolute position of an object to be measured using a first light source and a second light source which has coherency lower than that of the first light source. The absolute position measurement apparatus includes a measurement part which measures a point where phases of interference signals from the first and the second light sources coincide with each other or a point where an intensity of the interference signal from the second light source is maximized, an origin defining part which defines the point measured by the measurement part as an origin position, a phase storing part which stores the phase of the interference signal from the first light source at the origin position, an origin redefining part which redefines the origin position, and a position calculating part which calculates the absolute position of the object to be measured.
摘要:
An absolute position measurement apparatus includes an output unit outputting a plurality of first signals and a plurality of superimposed signals formed by superimposing each of plural second signals on each of the plural first signals, a phase computing unit calculating phases of the first signals during a first period in which the output means outputs the plural first signals, and calculating phases of the second signals during a second period in which the output means outputs the plural superimposed signals, a regression computing unit calculating a regression coefficient of the phase of the first signals calculated during the first period, a subtracter calculating a phase difference between the phase of the first signals and the phase of the second signals during the second period, a phase difference computing unit determining an origin position of the object to be measured based on a position where a sign of the phase difference output from the subtracter is inverted, and an absolute position calculating unit calculating an absolute position of the object to be measured based on the origin position.