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公开(公告)号：US20240263936A1
公开(公告)日：2024-08-08
申请号：US18600690
申请日：2024-03-09
IPC分类号： G01B9/02001
CPC分类号： G01B9/02007 , G01B2290/55
摘要： A method for identifying three entangled photons includes generating a set of first, second, and third entangled photons correlated in time and interfering the first and second entangled photons based on a difference between a first optical path from an output of an optical source that generates the first entangled photon to a first optical input to an interferometric beam splitter and a second optical path from an output of the optical source that generates the second entangled photon to a second input of the interferometric beam splitter. A first electrical signal is generated in response to detection of a first photon generated by the interfering of the first and second entangled photons. A second electrical signal is generated in response to detection of a second photon generated by the interfering of the first and second entangled photons. A third electrical signal is generated in response to detection of the third entangled photon. The first photon coincidence is determined from the first, second and their electrical signals, thereby identifying three entangled photons.
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公开(公告)号：US11933608B2
公开(公告)日：2024-03-19
申请号：US17749079
申请日：2022-05-19
IPC分类号： G01B9/02001
CPC分类号： G01B9/02007 , G01B2290/55
摘要： A method for identifying three entangled photons includes generating a set of first, second, and third entangled photons correlated in time and interfering the first and second entangled photons based on a difference between a first optical path from an output of an optical source that generates the first entangled photon to a first optical input to an interferometric beam splitter and a second optical path from an output of the optical source that generates the second entangled photon to a second input of the interferometric beam splitter. A first electrical signal is generated in response to detection of a first photon generated by the interfering of the first and second entangled photons. A second electrical signal is generated in response to detection of a second photon generated by the interfering of the first and second entangled photons. A third electrical signal is generated in response to detection of the third entangled photon. The first photon coincidence is determined from the first, second and their electrical signals, thereby identifying three entangled photons.
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公开(公告)号：US20240003672A1
公开(公告)日：2024-01-04
申请号：US18037819
申请日：2021-11-22
发明人： Christof PRUß , Christian SCHOBER
IPC分类号： G01B9/02001
CPC分类号： G01B9/02007 , G01B9/02039
摘要： An interferometer for the measurement of a surface or an optical thickness of an optically smooth test object is provided, wherein the interferometer is configured to illuminate the optically smooth test object simultaneously with a plurality of object waves, which have different wavelengths from one another, and to superimpose the object waves 10 deformed by the illuminated test object onto coherent reference waves on an image capture device, and to spectrally decompose the interferograms resulting from the superposition into wavelength-specific partial interferograms.
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公开(公告)号：US20230375327A1
公开(公告)日：2023-11-23
申请号：US17749079
申请日：2022-05-19
IPC分类号： G01B9/02001
CPC分类号： G01B9/02007 , G01B2290/55
摘要： A method for identifying three entangled photons includes generating a set of first, second, and third entangled photons correlated in time and interfering the first and second entangled photons based on a difference between a first optical path from an output of an optical source that generates the first entangled photon to a first optical input to an interferometric beam splitter and a second optical path from an output of the optical source that generates the second entangled photon to a second input of the interferometric beam splitter. A first electrical signal is generated in response to detection of a first photon generated by the interfering of the first and second entangled photons. A second electrical signal is generated in response to detection of a second photon generated by the interfering of the first and second entangled photons. A third electrical signal is generated in response to detection of the third entangled photon. The first photon coincidence is determined from the first, second and their electrical signals, thereby identifying three entangled photons.
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公开(公告)号：US20230243636A1
公开(公告)日：2023-08-03
申请号：US18160381
申请日：2023-01-27
发明人： Kohei YAMADA
IPC分类号： G01B9/02001 , G01B9/02
CPC分类号： G01B9/02007 , G01B9/02049
摘要： A laser interferometer includes: a laser light source configured to emit first laser light; an optical modulator including a vibration element that generates a vibration component in a direction intersecting an incident surface of the first laser light, and configured to modulate the first laser light by using the vibration element to generate second laser light including a modulation signal; a photodetector configured to receive the second laser light and third laser light that includes a sample signal generated by the first laser light being reflected by an object, and output a light reception signal; a demodulation circuit configured to demodulate the sample signal from the light reception signal based on a reference signal; and an oscillation circuit configured to operate using the vibration element as a signal source and output the reference signal to the demodulation circuit.
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公开(公告)号：US20190033056A1
公开(公告)日：2019-01-31
申请号：US16045603
申请日：2018-07-25
发明人： Thomas JENSEN
CPC分类号： G01B11/005 , G01B5/008 , G01B9/02004 , G01B9/02007 , G01B9/02055 , G01B9/02091 , G01B11/007 , G01B11/2441 , G01B11/303 , G01B21/04
摘要： An optical roughness sensor for a coordinate measuring machine, comprising a beam coupling unit for coupling and decoupling optical radiation, a local reference oscillator element for providing a reference path and an interferometric reference signal by means of a reference radiation component of the radiation, a first decoupling path comprising a first beam passage window for bidirectional transmission of a measuring radiation component of the radiation such that the measuring radiation component is aligned onto an object surface to be measured and a reflection of the measuring radiation component is acquired and a surface signal is provided by the reflected measuring radiation component. The reference path and the decoupling path interact such that the reference signal and the surface signal interfere and a roughness signal is derivable.
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公开(公告)号：US10060720B2
公开(公告)日：2018-08-28
申请号：US15386692
申请日：2016-12-21
申请人： Bioptigen, Inc.
CPC分类号： G01B9/02044 , A61B3/102 , A61B3/1225 , A61B5/0066 , G01B9/02004 , G01B9/02007 , G01B9/02008 , G01B9/02091 , G01B2290/45 , G01N21/4795
摘要： Frequency domain optical coherence imaging systems have an optical source, an optical detector and an optical transmission path between the optical source and the optical detector. The optical transmission path between the optical source and the optical detector reduces an effective linewidth of the imaging system. The optical source may be a broadband source and the optical transmission path may include a periodic optical filter.
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公开(公告)号：US20180202794A1
公开(公告)日：2018-07-19
申请号：US15919003
申请日：2018-03-12
申请人： Applejack 199 L.P.
CPC分类号： G01B9/02011 , G01B9/02007 , G01B9/02025 , G01B9/02044 , G01B11/06 , G01B11/2441 , G01B2290/70
摘要： A system for inspecting a slab of material may include a polarization maintaining single mode optical-fiber, a linearly polarized broadband light-source configured to emit a polarized-light over the optical fiber, a beam-assembly configured to receive the light over the optical fiber and direct the light toward a slab of material; a polarization-rotator for controlling polarization of the light directed to the slab of material from the beam-assembly; a computer-controlled etalon filter configured to receive the light over the optical fiber, filter the light, and direct the light over the optical fiber; and a computer-controlled spectrometer configured to receive the light over the optical fiber after the light has been filtered by the etalon filter and after the light has been reflected from or transmitted through the slab of material and spectrally analyze the light.
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公开(公告)号：US20180195852A1
公开(公告)日：2018-07-12
申请号：US15866892
申请日：2018-01-10
IPC分类号： G01B9/02 , G01D21/02 , G05D23/19 , G05B19/042 , H01L27/08
CPC分类号： G01B9/02007 , G01D3/0365 , G01D21/02 , G01R33/0052 , G05B19/042 , G05D23/1917 , H01L25/0657 , H01L27/0802
摘要： A multi-element sensor includes a substrate having a surface. A first sensing element for sensing an environmental attribute is disposed on or over the substrate surface. A second sensing element is disposed over the same substrate surface as the first sensing element, above the first sensing element in a direction orthogonal to the substrate surface. The second sensing element is arranged for sensing the same environmental attribute. In one configuration, the first and second sensing elements sense the same environmental attribute at a location between the first and second sensing elements.
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公开(公告)号：US09982997B2
公开(公告)日：2018-05-29
申请号：US14895991
申请日：2015-01-22
发明人： Qibo Feng , Bin Zhang , Cunxing Cui
CPC分类号： G01B11/272 , G01B9/02003 , G01B9/02007 , G01B9/02021 , G01B11/002 , G01B21/042 , G01B2290/70
摘要： A laser measurement system for measuring up to 21 geometric errors, in which a six-degree-of-freedom geometric error simultaneous measurement unit and a beam-turning unit are mounted on either the clamping workpiece or the clamping tool, while an error-sensitive unit is mounted on the remaining one, the beam-turning unit has several switchable working postures and multi-component combinations in its installation state, it can split or turn the laser beam from the six-degree-of-freedom geometric error simultaneous measurement unit to the X, Y, and Z directions in a proper order, or the beam-turning unit can split or turn a beam from the error-sensitive unit to the six-degree-of-freedom geometric error simultaneous measurement unit. The present invention is of simple configuration and convenient operation. Up to 21 geometric errors of three mutual perpendicular linear motion guides are obtained by a single installation and step-by-step measurement.
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