High frequency deflection measurement of IR absorption
    6.
    发明申请
    High frequency deflection measurement of IR absorption 有权
    红外吸收的高频偏转测量

    公开(公告)号:US20080283755A1

    公开(公告)日:2008-11-20

    申请号:US11803421

    申请日:2007-05-15

    IPC分类号: G01N21/84 G01N25/16 G01N13/16

    摘要: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that cab be made generally available to the scientific community.

    摘要翻译: 已经证明了基于AFM的技术用于在样品表面上进行高度局部化的IR光谱。 在商业可行的分析仪器中实施的这种技术将是非常有用的。 必须改变实验设置的各个方面,以创建商业版本。 本发明解决了许多这些问题,从而产生了一般可用于科学界的驾驶室的分析技术的版本。