公开(公告)号：US11436114B2

公开(公告)日：2022-09-06

申请号：US17379442

申请日：2021-07-19

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： Amitabh Mehra ,  Anil Harwani ,  William R. Alverson ,  Grant E. Ley ,  Jerry A. Ahrens ,  Mustansir M. Pratapgarhwala ,  Scott E. Swanstrom

IPC: G06F11/22

Abstract: Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more expected characteristics; and modifying one or more operational parameters of a central processing unit of the part based on the comparison.

公开(公告)号：US11068368B2

公开(公告)日：2021-07-20

申请号：US16715831

申请日：2019-12-16

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： Amitabh Mehra ,  Anil Harwani ,  William R. Alverson ,  Grant E. Ley ,  Jerry A. Ahrens ,  Mustansir M. Pratapgarhwala ,  Scott E. Swanstrom

IPC: G06F11/22

Abstract: Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more expected characteristics; and modifying one or more operational parameters of a central processing unit of the part based on the comparison.