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公开(公告)号：US11720266B2
公开(公告)日：2023-08-08
申请号：US17591924
申请日：2022-02-03
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor： William R. Alverson , Amitabh Mehra , Anil Harwani , Jerry A. Ahrens , Grant E. Ley , Jayesh Joshi
CPC classification number: G06F3/0632 , G06F3/0604 , G06F3/0673 , G11C29/10
Abstract: Automatic memory overclocking, including: increasing a memory frequency setting for a memory module until a memory stability test fails; determining an overclocked memory frequency setting including a highest memory frequency setting passing the memory stability test; and generating a profile including the overclocked memory frequency setting.
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公开(公告)号：US11435806B2
公开(公告)日：2022-09-06
申请号：US16715184
申请日：2019-12-16
Applicant: ADVANCED MICRO DEVICES, INC. , ATI TECHNOLOGIES ULC
Inventor： Jerry A. Ahrens , Amitabh Mehra , Anil Harwani , William R. Alverson , Grant E. Ley , Charles Sy Lee
IPC: G06F1/3234
Abstract: Automatic voltage reconfiguration in a computer processor including one or more cores includes executing one or more user-specified workloads; determining, based on the user-specified workloads, a respective minimum safe voltage for each core of one or more cores; and modifying a respective voltage configuration for each core of the one or more cores based on the respective minimum safe voltage.
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公开(公告)号：US11436114B2
公开(公告)日：2022-09-06
申请号：US17379442
申请日：2021-07-19
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor： Amitabh Mehra , Anil Harwani , William R. Alverson , Grant E. Ley , Jerry A. Ahrens , Mustansir M. Pratapgarhwala , Scott E. Swanstrom
IPC: G06F11/22
Abstract: Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more expected characteristics; and modifying one or more operational parameters of a central processing unit of the part based on the comparison.
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Patent Agency Ranking
公开(公告)号：US11262924B2
公开(公告)日：2022-03-01
申请号：US16729702
申请日：2019-12-30
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor： William R. Alverson , Amitabh Mehra , Anil Harwani , Jerry A. Ahrens , Grant E. Ley , Jayesh Joshi
Abstract: Automatic memory overclocking, including: increasing a memory frequency setting for a memory module until a memory stability test fails; determining an overclocked memory frequency setting including a highest memory frequency setting passing the memory stability test; and generating a profile including the overclocked memory frequency setting.
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公开(公告)号：US11068368B2
公开(公告)日：2021-07-20
申请号：US16715831
申请日：2019-12-16
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor： Amitabh Mehra , Anil Harwani , William R. Alverson , Grant E. Ley , Jerry A. Ahrens , Mustansir M. Pratapgarhwala , Scott E. Swanstrom
IPC: G06F11/22
Abstract: Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more expected characteristics; and modifying one or more operational parameters of a central processing unit of the part based on the comparison.
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公开(公告)号：US12008401B2
公开(公告)日：2024-06-11
申请号：US16723427
申请日：2019-12-20
Applicant: ADVANCED MICRO DEVICES, INC.
Inventor： Anil Harwani , Amitabh Mehra , William R. Alverson , Grant E. Ley , Jerry A. Ahrens , Kenneth Mitchell
CPC classification number: G06F9/5005 , G06F3/065 , G06F3/0656 , G06F9/48 , G06F9/50 , G06F9/5027 , G06F9/54 , G06F9/544 , G06F11/3024 , G06F11/3433
Abstract: Automatic central processing unit (CPU) usage optimization includes: monitoring performance activity of a workload comprising a plurality of threads; and modifying a resource allocation of a plurality of cores for the plurality of threads based on the performance activity.
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7.发明授权公开(公告)号：US11835998B2
公开(公告)日：2023-12-05
申请号：US17362231
申请日：2021-06-29
Applicant: Advanced Micro Devices, Inc.
Inventor： Amitabh Mehra , Jerry A. Ahrens , Anil Harwani , Richard Martin Born , Dirk J. Robinson , William R. Alverson , Joshua Taylor Knight
CPC classification number: G06F1/08 , G06F1/28 , H03K5/00006
Abstract: Methods and apparatuses control the clock rate of a processing unit. The methods and apparatus control the clock rate by generating an output clock rate based on the determined frequency adjustment such that the processing unit maintains the overclocking. The methods include: receiving an analog voltage supply in response to detecting overclocking in the processing unit; dynamically sensing measurements of an output voltage from a voltage generator based on the received analog voltage supply; determining characteristics of a voltage droop in the output voltage based on the dynamically sensed output voltage measurements; determining a frequency adjustment for the clock rate of the processing unit based on the determined characteristics of the voltage droop; and generating an output clock rate based on the determined frequency adjustment such that the processing unit maintains the overclocking.
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8.发明申请公开(公告)号：US20220413543A1
公开(公告)日：2022-12-29
申请号：US17362231
申请日：2021-06-29
Applicant: Advanced Micro Devices, Inc.
Inventor： Amitabh Mehra , Jerry A. Ahrens , Anil Harwani , Richard Martin Born , Dirk J. Robinson , William R. Alverson , Joshua Taylor Knight
Abstract: Methods and apparatuses control the clock rate of a processing unit. The methods and apparatus control the clock rate by generating an output clock rate based on the determined frequency adjustment such that the processing unit maintains the overclocking. The methods include: receiving an analog voltage supply in response to detecting overclocking in the processing unit; dynamically sensing measurements of an output voltage from a voltage generator based on the received analog voltage supply; determining characteristics of a voltage droop in the output voltage based on the dynamically sensed output voltage measurements; determining a frequency adjustment for the clock rate of the processing unit based on the determined characteristics of the voltage droop; and generating an output clock rate based on the determined frequency adjustment such that the processing unit maintains the overclocking.
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