公开(公告)号：US12008401B2

公开(公告)日：2024-06-11

申请号：US16723427

申请日：2019-12-20

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： Anil Harwani ,  Amitabh Mehra ,  William R. Alverson ,  Grant E. Ley ,  Jerry A. Ahrens ,  Kenneth Mitchell

IPC: G06F9/48 ,  G06F3/06 ,  G06F9/50 ,  G06F9/54 ,  G06F11/30 ,  G06F11/34

CPC classification number: G06F9/5005 ,  G06F3/065 ,  G06F3/0656 ,  G06F9/48 ,  G06F9/50 ,  G06F9/5027 ,  G06F9/54 ,  G06F9/544 ,  G06F11/3024 ,  G06F11/3433

Abstract: Automatic central processing unit (CPU) usage optimization includes: monitoring performance activity of a workload comprising a plurality of threads; and modifying a resource allocation of a plurality of cores for the plurality of threads based on the performance activity.

公开(公告)号：US11720266B2

公开(公告)日：2023-08-08

申请号：US17591924

申请日：2022-02-03

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： William R. Alverson ,  Amitabh Mehra ,  Anil Harwani ,  Jerry A. Ahrens ,  Grant E. Ley ,  Jayesh Joshi

IPC: G06F3/06 ,  G11C29/10

CPC classification number: G06F3/0632 ,  G06F3/0604 ,  G06F3/0673 ,  G11C29/10

Abstract: Automatic memory overclocking, including: increasing a memory frequency setting for a memory module until a memory stability test fails; determining an overclocked memory frequency setting including a highest memory frequency setting passing the memory stability test; and generating a profile including the overclocked memory frequency setting.

公开(公告)号：US11435806B2

公开(公告)日：2022-09-06

申请号：US16715184

申请日：2019-12-16

Applicant: ADVANCED MICRO DEVICES, INC. ,  ATI TECHNOLOGIES ULC

Inventor： Jerry A. Ahrens ,  Amitabh Mehra ,  Anil Harwani ,  William R. Alverson ,  Grant E. Ley ,  Charles Sy Lee

IPC: G06F1/3234

Abstract: Automatic voltage reconfiguration in a computer processor including one or more cores includes executing one or more user-specified workloads; determining, based on the user-specified workloads, a respective minimum safe voltage for each core of one or more cores; and modifying a respective voltage configuration for each core of the one or more cores based on the respective minimum safe voltage.

公开(公告)号：US11436114B2

公开(公告)日：2022-09-06

申请号：US17379442

申请日：2021-07-19

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： Amitabh Mehra ,  Anil Harwani ,  William R. Alverson ,  Grant E. Ley ,  Jerry A. Ahrens ,  Mustansir M. Pratapgarhwala ,  Scott E. Swanstrom

IPC: G06F11/22

Abstract: Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more expected characteristics; and modifying one or more operational parameters of a central processing unit of the part based on the comparison.

公开(公告)号：US11262924B2

公开(公告)日：2022-03-01

申请号：US16729702

申请日：2019-12-30

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： William R. Alverson ,  Amitabh Mehra ,  Anil Harwani ,  Jerry A. Ahrens ,  Grant E. Ley ,  Jayesh Joshi

IPC: G06F3/06 ,  G11C29/10

Abstract: Automatic memory overclocking, including: increasing a memory frequency setting for a memory module until a memory stability test fails; determining an overclocked memory frequency setting including a highest memory frequency setting passing the memory stability test; and generating a profile including the overclocked memory frequency setting.

公开(公告)号：US11068368B2

公开(公告)日：2021-07-20

申请号：US16715831

申请日：2019-12-16

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： Amitabh Mehra ,  Anil Harwani ,  William R. Alverson ,  Grant E. Ley ,  Jerry A. Ahrens ,  Mustansir M. Pratapgarhwala ,  Scott E. Swanstrom

IPC: G06F11/22

Abstract: Automatic part testing includes: booting a part under testing into a first operating environment; executing, via the first operating environment, one or more test patterns on the part; performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more expected characteristics; and modifying one or more operational parameters of a central processing unit of the part based on the comparison.