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公开(公告)号:US11800619B2
公开(公告)日:2023-10-24
申请号:US17575607
申请日:2022-01-13
Applicant: ADVANTEST CORPORATION
Inventor: Kotaro Hasegawa , Kouji Miyauchi , Go Utamaru
IPC: H05B45/20 , G09G3/32 , H05B45/50 , H05B45/345 , H05B45/34
CPC classification number: H05B45/50 , H05B45/20 , H05B45/34 , H05B45/345
Abstract: A test apparatus includes: an electrical connection unit configured to be electrically connected to a light emitting device panel having a plurality of cells each including a light emitting device and arranged in a row direction and a column direction; a light source unit configured to collectively irradiate the plurality of cells with light; a reading unit configured to read, for each row of the light emitting device panel, a photoelectric signal obtained by photoelectrically converting the light in each of two or more of the cells arranged in the column direction by the light emitting device; a measuring unit configured to measure a photoelectric signal read from each of the plurality of cells; and a determination unit configured to determine a quality of each of the plurality of cells on a basis of a measurement result of the measuring unit.
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公开(公告)号:US12130324B2
公开(公告)日:2024-10-29
申请号:US17573581
申请日:2022-01-11
Applicant: ADVANTEST CORPORATION
Inventor: Kotaro Hasegawa , Kouji Miyauchi , Go Utamaru
IPC: G01R31/26 , G01R31/317 , H05B45/12 , H05B45/22 , H05B45/50
CPC classification number: G01R31/2635 , G01R31/31728 , H05B45/12 , H05B45/22 , H05B45/50
Abstract: A test apparatus includes: an electrical connection unit to be electrically connected to a terminal of each of a plurality of light emitting devices to be tested; a light source unit for collectively irradiating the plurality of light emitting devices with light; a measuring unit for measuring a photoelectric signal obtained by photoelectrically converting light irradiated by the light source unit and output via the electrical connection unit by each light emitting device; an acquisition unit for acquiring a correction map including a correction value for correcting a variation in intensity of light with which a position of each light emitting device is irradiated by the light source unit; and a determination unit for determining a quality of each light emitting device on a basis of a measurement result by the measuring unit and the correction map acquired by the acquisition unit.
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公开(公告)号:US11788885B2
公开(公告)日:2023-10-17
申请号:US17577385
申请日:2022-01-18
Applicant: ADVANTEST CORPORATION
Inventor: Kotaro Hasegawa , Kouji Miyauchi , Go Utamaru
CPC classification number: G01J1/44 , G01J2001/4252
Abstract: A test apparatus includes: an electrical connection unit electrically connected to a terminal of each of a plurality of light emitting devices to be tested; a light source unit for collectively irradiating the plurality of light emitting devices with light; an electrical measurement unit for measuring a photoelectric signal obtained by photoelectrically converting the light irradiated from the light source unit by each light emitting device; a light emission control unit for causing at least one light emitting device to be subjected to light emission processing to emit light; a light measuring unit for measuring light emitted by the at least one light emitting device to be subjected to the light emission processing; and a determination unit determining a quality of each light emitting device on the basis of a measurement result of the electrical measurement unit and a measurement result of the light measuring unit.
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公开(公告)号:US11293966B2
公开(公告)日:2022-04-05
申请号:US16817642
申请日:2020-03-13
Applicant: ADVANTEST CORPORATION
Inventor: Kotaro Hasegawa , Kouji Miyauchi , Go Utamaru
Abstract: A test apparatus includes an electrical connection unit electrically connected to respective terminal of each of a plurality of LEDs to be tested, a light source unit which collectively irradiates the plurality of LEDs with light, a measuring unit which measures a photoelectric signal that each of the plurality of LEDs outputs via the electrical connection unit after photoelectrically converting the light with which the light source unit irradiates the plurality of LEDs, and a determination unit which determines pass or fail of each of the plurality of LEDs based on the measurement results by the measuring unit.
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