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公开(公告)号：US10114075B2
公开(公告)日：2018-10-30
申请号：US14796871
申请日：2015-07-10
发明人： Matthias Werner
IPC分类号： G01R31/319 , G01R31/3185 , G01R31/3177 , G01R31/317 , G01R31/28
摘要： System and method for performing scan test on multiple IC devices by site-multiplexing. Multiple test sites of an ATE are coupled to multiple DUTs through a multiplexer. A scan test includes a scan-in/out phase and consecutive launch/capture cycles. Each site performs scan in/out in parallel on the corresponding DUT. In each launch/capture cycle, a respective site drives/captures data from a DUT while the remaining sites are inactive. The multiplexer allows the active site to borrow test channels assigned to other test sites such that all the test data of a DUT can be driven/captured in the launch capture cycle despite the test channel limitation of the active test site. As the tester channels receive interleaved data of the multiple sites, each strobe edge of a receive channel is assigned to a particular test site and used to quickly identify a failure site without post-processing test data.
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公开(公告)号：US20160011262A1
公开(公告)日：2016-01-14
申请号：US14796871
申请日：2015-07-10
发明人： Matthias Werner
IPC分类号： G01R31/3177
CPC分类号： G01R31/31926 , G01R31/2851 , G01R31/31723 , G01R31/31727 , G01R31/3177 , G01R31/318536 , G01R31/318547 , G01R31/318558 , G01R31/318563 , G01R31/318569 , G01R31/318575
摘要： System and method for performing scan test on multiple IC devices by site-multiplexing. Multiple test sites of an ATE are coupled to multiple DUTs through a multiplexer. A scan test includes a scan-in/out phase and consecutive launch/capture cycles. Each site performs scan in/out in parallel on the corresponding DUT. In each launch/capture cycle, a respective site drives/captures data from a DUT while the remaining sites are inactive. The multiplexer allows the active site to borrow test channels assigned to other test sites such that all the test data of a DUT can be driven/captured in the launch capture cycle despite the test channel limitation of the active test site. As the tester channels receive interleaved data of the multiple sites, each strobe edge of a receive channel is assigned to a particular test site and used to quickly identify a failure site without post-processing test data.
摘要翻译： 通过站点复用对多个IC器件执行扫描测试的系统和方法。 ATE的多个测试站点通过多路复用器耦合到多个DUT。 扫描测试包括扫描/输出阶段和连续的发射/捕获周期。 每个站点在相应的DUT上并行执行扫描/输出。 在每个启动/捕获周期中，相应的站点驱动/捕获来自DUT的数据，而其余站点处于非活动状态。 复用器允许活动站点借用分配给其他测试站点的测试通道，使得DUT的所有测试数据可以在发射捕获周期中被驱动/捕获，尽管活动测试站点的测试通道受限。 当测试者通道接收多个站点的交织数据时，接收通道的每个选通边缘被分配给特定的测试站点，并用于快速识别故障站点，而无需后处理测试数据。
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公开(公告)号：US10101392B2
公开(公告)日：2018-10-16
申请号：US14796322
申请日：2015-07-10
发明人： Matthias Werner
IPC分类号： G01R31/319 , G01R31/3185 , G01R31/3177 , G01R31/317 , G01R31/28
摘要： System and method for performing scan test on multiple IC devices by site-multiplexing. Multiple test sites of an ATE are coupled to multiple DUTs through a multiplexer. A scan test includes a scan-in/out phase and consecutive launch/capture cycles. Each site performs scan in/out in parallel on the corresponding DUT. In each launch/capture cycle, a respective site drives/captures data from a DUT while the remaining sites are inactive. The multiplexer allows the active site to borrow test channels assigned to other test sites such that all the test data of a DUT can be driven/captured in the launch capture cycle despite the test channel limitation of the active test site. As the tester channels receive interleaved data of the multiple sites, each strobe edge of a receive channel is assigned to a particular test site and used to quickly identify a failure site without post-processing test data.
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4.发明公开公开(公告)号：US20230417826A1
公开(公告)日：2023-12-28
申请号：US18036821
申请日：2020-11-30
发明人： Matthias Werner , Takashi Hashimoto
CPC分类号： G01R31/2867 , G01R31/2875 , G01R31/2877 , G01R35/005
摘要： An electronic component handling apparatus pressing the DUT against a socket electrically connected to a tester, includes: a first receiver that receives, from the tester, a first signal indicating a detection value of a temperature detection circuit; a calculator that calculates a temperature of the DUT based on the first signal; a calibrator that calibrates the calculated temperature; a second receiver that receives, from the tester, a second signal that causes the calibrator to start a first calibration; and a temperature adjuster that adjusts the temperature of the DUT. The second receiver receives the second signal before the tester turns on the DUT, once the second signal is received, the calibrator calculates a first calibrated temperature by executing the first calibration with respect to the calculated temperature, and the temperature adjuster adjusts the temperature of the DUT based on the first calibrated temperature.
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公开(公告)号：US20160011261A1
公开(公告)日：2016-01-14
申请号：US14796322
申请日：2015-07-10
发明人： Matthias Werner
IPC分类号： G01R31/3177 , G01R31/317
CPC分类号： G01R31/31926 , G01R31/2851 , G01R31/31723 , G01R31/31727 , G01R31/3177 , G01R31/318536 , G01R31/318547 , G01R31/318558 , G01R31/318563 , G01R31/318569 , G01R31/318575
摘要： System and method for performing scan test on multiple IC devices by site-multiplexing. Multiple test sites of an ATE are coupled to multiple DUTs through a multiplexer. A scan test includes a scan-in/out phase and consecutive launch/capture cycles. Each site performs scan in/out in parallel on the corresponding DUT. In each launch/capture cycle, a respective site drives/captures data from a DUT while the remaining sites are inactive. The multiplexer allows the active site to borrow test channels assigned to other test sites such that all the test data of a DUT can be driven /captured in the launch capture cycle despite the test channel limitation of the active test site. As the tester channels receive interleaved data of the multiple sites, each strobe edge of a receive channel is assigned to a particular test site and used to quickly identify a failure site without post-processing test data.
摘要翻译： 通过站点复用对多个IC器件执行扫描测试的系统和方法。 ATE的多个测试站点通过多路复用器耦合到多个DUT。 扫描测试包括扫描/输出阶段和连续的发射/捕获周期。 每个站点在相应的DUT上并行执行扫描/输出。 在每个启动/捕获周期中，相应的站点驱动/捕获来自DUT的数据，而其余站点处于非活动状态。 复用器允许活动站点借用分配给其他测试站点的测试通道，使得DUT的所有测试数据可以在发射捕获周期中被驱动/捕获，尽管活动测试站点的测试通道受限。 当测试者通道接收多个站点的交织数据时，接收通道的每个选通边缘被分配给特定的测试站点，并用于快速识别故障站点，而无需后处理测试数据。
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