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1.
公开(公告)号:US11807572B2
公开(公告)日:2023-11-07
申请号:US17138118
申请日:2020-12-30
Applicant: AGC INC.
Inventor: Misa Inamoto , Satoru Tomeno , Yuki Aoshima
IPC: C03C19/00 , C03C17/34 , G02F1/1333 , G06F1/16
CPC classification number: C03C19/00 , C03C17/3417 , C03C2217/734 , C03C2218/154 , G02F1/133302 , G02F1/133331 , G06F1/1652 , Y10T428/24355
Abstract: The present invention relates to a glass sheet including a first main surface and a second main surface opposing the first main surface, in which the glass sheet has an affected layer directly below the first main surface, in at least a part of the first main surface, an average element length RSm is from 2500 nm to 6000 nm, a root-mean-square height Sq is from 3 nm to 45 nm, and a skewness Ssk is a negative value.
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公开(公告)号:US10474283B2
公开(公告)日:2019-11-12
申请号:US15584596
申请日:2017-05-02
Applicant: AGC Inc.
Inventor: Misa Inamoto , Takashi Shibuya
Abstract: A transparent plate includes a transparent substrate and an antifouling layer. A surface of the transparent substrate includes a fine projecting and recessed structure with a surface roughness of 2.0-100 nm. The antifouling layer includes fluorine, and at least a part of the antifouling layer is formed on a position of the fine projecting and recessed structure. A haze value of the transparent plate at the position of the fine projecting and recessed structure is 2% or less. A value of X defined by (S1−S2)/(S3−S2) is 0.5 or more, where S1, S2 and S3 are F-Kα line strengths of the transparent plate at the position of the fine projecting and recessed structure, a reference glass plate that does not include fluorine, and a reference aluminosilicate glass plate that includes fluorine of 2 wt %, respectively, and S1, S2 and S3 are measured by a fluorescent X-ray measurement device.
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公开(公告)号:US10590030B2
公开(公告)日:2020-03-17
申请号:US15989252
申请日:2018-05-25
Applicant: AGC Inc.
Inventor: Misa Inamoto , Naoki Okahata , Takashi Shibuya
Abstract: A glass plate includes a main surface, and a microscopic asperity surface disposed on the main surface, the microscopic asperity surface forming peaks and valleys. When a reference plane is defined as a plane at a center, in a direction of height, of an interval of highest frequency in a histogram of height of shape data of a square region having 2 μm per side in the microscopic asperity surface, the number of peaks that are higher than the reference plane by 20% or more of a maximum height difference in the square region is in a range between 1 or more and 300 or less.
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