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公开(公告)号:US10216102B2
公开(公告)日:2019-02-26
申请号:US15894223
申请日:2018-02-12
Applicant: ASML NETHERLANDS B.V.
Inventor: Jan Steven Christiaan Westerlaken , Gerardus Arnoldus Hendricus Franciscus Janssen , Peter Paul Steijaert , Engelbertus Antonius Fransiscus Van Der Pasch , Franciscus Van De Mast
IPC: G03F7/20
Abstract: A lithographic apparatus having a first outlet to provide a thermally conditioned fluid with a first flow characteristic to at least part of a sensor beam path, and a second outlet associated with the first outlet and to provide a thermally conditioned fluid with a second flow characteristic, different to the first flow characteristic, adjacent the thermally conditioned fluid from the first outlet.
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公开(公告)号:US09529277B2
公开(公告)日:2016-12-27
申请号:US14657772
申请日:2015-03-13
Applicant: ASML NETHERLANDS B.V.
Inventor: Jan Steven Christiaan Westerlaken , Gerardus Arnoldus Hendricus Franciscus Janssen , Peter Paul Steijaert , Engelbertus Antonius Fransiscus Van Der Pasch , Franciscus Van De Mast
CPC classification number: G03F7/70916 , G03F7/70341 , G03F7/70608 , G03F7/70683 , G03F7/70775 , G03F7/7085 , G03F7/70908
Abstract: A lithographic apparatus having a first outlet to provide a thermally conditioned fluid with a first flow characteristic to at least part of a sensor beam path, and a second outlet associated with the first outlet and to provide a thermally conditioned fluid with a second flow characteristic, different to the first flow characteristic, adjacent the thermally conditioned fluid from the first outlet.
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公开(公告)号:US09891542B2
公开(公告)日:2018-02-13
申请号:US15387461
申请日:2016-12-21
Applicant: ASML NETHERLANDS B.V.
Inventor: Jan Steven Christiaan Westerlaken , Gerardus Arnoldus Hendricus Franciscus Janssen , Peter Paul Steijaert , Engelbertus Antonius Fransiscus Van Der Pasch , Franciscus Van De Mast
CPC classification number: G03F7/70916 , G03F7/70341 , G03F7/70608 , G03F7/70683 , G03F7/70775 , G03F7/7085 , G03F7/70908
Abstract: A lithographic apparatus having a first outlet to provide a thermally conditioned fluid with a first flow characteristic to at least part of a sensor beam path, and a second outlet associated with the first outlet and to provide a thermally conditioned fluid with a second flow characteristic, different to the first flow characteristic, adjacent the thermally conditioned fluid from the first outlet.
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公开(公告)号:US20170242349A1
公开(公告)日:2017-08-24
申请号:US15387461
申请日:2016-12-21
Applicant: ASML NETHERLANDS B.V.
Inventor: Jan Steven Christiaan Westerlaken , Gerardus Arnoldus Hendricus Franciscus Janssen , Peter Paul Steijaert , Engelbertus Antonius Fransiscus Van Der Pasch , Franciscus Van De Mast
IPC: G03F7/20
CPC classification number: G03F7/70916 , G03F7/70341 , G03F7/70608 , G03F7/70683 , G03F7/70775 , G03F7/7085 , G03F7/70908
Abstract: A lithographic apparatus having a first outlet to provide a thermally conditioned fluid with a first flow characteristic to at least part of a sensor beam path, and a second outlet associated with the first outlet and to provide a thermally conditioned fluid with a second flow characteristic, different to the first flow characteristic, adjacent the thermally conditioned fluid from the first outlet.
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