公开(公告)号：US20140030757A1

公开(公告)日：2014-01-30

申请号：US13954235

申请日：2013-07-30

Applicant: ASPECT IMAGING LTD

Inventor： Yael S. SCHIFFENBAUER

IPC: G01N1/28

CPC classification number: G01N1/286 ,  G01N1/06 ,  G01N1/312

Abstract: Systems and methods for providing guided slicing of histological samples. The samples are acquired, spacially labeled with a fiducial marker, and imaged with a scanning system. The images are analyzed, either manually, semi-automatically or automatically, and likely locations of pathologies are identified. A slicing program is then generated and the sample sliced according to the slicing program, thereby ensuring that likely locations of pathologies are analyzed.

Abstract translation: 提供组织学样本引导切片的系统和方法。 采集样本，用基准标记进行空间标记，并用扫描系统成像。 手动，半自动或自动地分析图像，并且识别出可能的病理位置。 然后产生切片程序，并根据切片程序切片样品，从而确保分析可能的病理位置。