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公开(公告)号：US12055728B2
公开(公告)日：2024-08-06
申请号：US18283349
申请日：2022-03-25
Applicant: ABBERIOR INSTRUMENTS GMBH
Inventor： Roman Schmidt , Benjamin Harke , Matthias Reuss , Lars Kastrup
CPC classification number: G02B27/58 , G02B21/0072 , G02B21/0076 , G02B21/008
Abstract: The present specification relates to a method for light microscopic examination of a sample (6), in particular by means of laser scanning or MINFLUX microscopy, in which a drift of the sample (6) or of an object in a sample (6) with respect to the light microscope (26) is detected and, if necessary, corrected. In particular, the present specification relates to a corresponding method for examining the sample (6) using laser scanning or MINFLUX microscopy. For this purpose, reference markers (8, 13) are located in the sample, the position of which is repeatedly determined according to the MINFLUX principle in order to determine the drift.
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公开(公告)号：US11131630B2
公开(公告)日：2021-09-28
申请号：US16285522
申请日：2019-02-26
Applicant: Abberior Instruments GmbH
Inventor： Joern Heine , Matthias Reuss , Benjamin Harke , Lars Kastrup
Abstract: For setting a laser-scanning fluorescence microscope to a correct alignment in which an intensity maximum of excitation light and an intensity minimum of fluorescence inhibition light coincide in a focal area of an objective lens, a structure in a sample marked with a fluorescent dye is scanned with the intensity maximum of the excitation light to generate first and second pictures of the sample, the first picture corresponding to a higher and the second picture corresponding to a lower intensity of the fluorescence inhibition light. A spatial offset of a first image of the structure in the first picture with regard to a second image of the structure in the second picture is calculated; and the intensity maximum of the excitation light is shifted with regard to the intensity minimum of the fluorescence inhibition light in the direction of the offset calculated to set the microscope to the correct alignment.
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公开(公告)号：US20210223528A1
公开(公告)日：2021-07-22
申请号：US17223074
申请日：2021-04-06
Applicant: Abberior Instruments GmbH
Inventor： Joachim Fischer , Matthias Henrich , Andreas Schoenle , Lars Kastrup
Abstract: A bandpass filter for light has variable lower and upper cut-off wavelengths. The bandpass filter comprises an areal long-pass filter defining the variable lower cut-off wavelength and an areal short-pass filter defining the variable upper cut-off wavelength. The long-pass filter has different lower cut-off wavelengths in different first area regions which follow to one another in a first direction, and the short-pass filter has different upper cut-off wavelengths in different second area regions which follow to one another in a second direction. The long-pass filter and the short-pass filter are connected in series and spatially fixed relative to one another. The first direction and the second direction are oriented crosswise to one another.
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公开(公告)号：US20190195800A1
公开(公告)日：2019-06-27
申请号：US16285522
申请日：2019-02-26
Applicant: Abberior Instruments GmbH
Inventor： Joern Heine , Matthias Reuss , Benjamin Harke , Lars Kastrup
CPC classification number: G01N21/6458 , G01N21/636 , G02B21/0072 , G02B21/0076 , G02B21/008
Abstract: For setting a laser-scanning fluorescence microscope to a correct alignment in which an intensity maximum of excitation light and an intensity minimum of fluorescence inhibition light coincide in a focal area of an objective lens, a structure in a sample marked with a fluorescent dye is scanned with the intensity maximum of the excitation light to generate first and second pictures of the sample, the first picture corresponding to a higher and the second picture corresponding to a lower intensity of the fluorescence inhibition light. A spatial offset of a first image of the structure in the first picture with regard to a second image of the structure in the second picture is calculated; and the intensity maximum of the excitation light is shifted with regard to the intensity minimum of the fluorescence inhibition light in the direction of the offset calculated to set the microscope to the correct alignment.
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公开(公告)号：US11947097B2
公开(公告)日：2024-04-02
申请号：US17223074
申请日：2021-04-06
Applicant: Abberior Instruments GmbH
Inventor： Joachim Fischer , Matthias Henrich , Andreas Schoenle , Lars Kastrup
CPC classification number: G02B21/0032 , G02B5/20 , G02B21/0048 , G02B26/101
Abstract: A bandpass filter for light has variable lower and upper cut-off wavelengths. The bandpass filter comprises an areal long-pass filter defining the variable lower cut-off wavelength and an areal short-pass filter defining the variable upper cut-off wavelength. The long-pass filter has different lower cut-off wavelengths in different first area regions which follow to one another in a first direction, and the short-pass filter has different upper cut-off wavelengths in different second area regions which follow to one another in a second direction. The long-pass filter and the short-pass filter are connected in series and spatially fixed relative to one another. The first direction and the second direction are oriented crosswise to one another.
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Patent Agency Ranking
公开(公告)号：US10795140B2
公开(公告)日：2020-10-06
申请号：US15437770
申请日：2017-02-21
Applicant: Abberior Instruments GmbH
Inventor： Andreas Schoenle , Lars Kastrup
Abstract: In order to generate rasterized images of a sample, a pixel size of image points of a rasterized image is set and photons emitted out of the sample which were detected, and for each of which a position of an effective local excitation of the sample for emitting the respective detected photon has been recorded are assigned to that image point of the rasterized image into which the position of the effective local excitation recorded for the respective detected photon falls. To set the pixel size of the image points to an optimized pixel size, the positions of the effective local excitation of the sample for emitting the detected photons are evaluated.
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公开(公告)号：US20170248778A1
公开(公告)日：2017-08-31
申请号：US15437770
申请日：2017-02-21
Applicant: Abberior Instruments GmbH
Inventor： Andreas Schoenle , Lars Kastrup
Abstract: In order to generate rasterized images of a sample, a pixel size of image points of a rasterized image is set and photons emitted out of the sample which were detected, and for each of which a position of an effective local excitation of the sample for emitting the respective detected photon has been recorded are assigned to that image point of the rasterized image into which the position of the effective local excitation recorded for the respective detected photon falls. To set the pixel size of the image points to an optimized pixel size, the positions of the effective local excitation of the sample for emitting the detected photons are evaluated.
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公开(公告)号：US12111455B2
公开(公告)日：2024-10-08
申请号：US17482752
申请日：2021-09-23
Applicant: Abberior Instruments GmbH
Inventor： Roman Schmidt , Lars Kastrup
CPC classification number: G02B21/008 , G02B5/3083 , G02B21/0032 , G02B21/02 , G02B21/365 , G02B27/283
Abstract: An apparatus for detecting movements of a sample with respect to an objective includes imaging optics which include the objective, which have an image plane and which are configured to image light from at least one reference object that is connected to the sample arranged in front of the objective into reference object images in the image plane. The apparatus further includes a camera which is arranged in the image plane of the imaging optics and which is configured to record the reference object images at consecutive points in time, and an optical device arranged between the objective and the camera in a plane that is Fourier-conjugated with respect to the image plane. The optical device is configured to mask out low spatial frequencies of reference object images which the imaging optics image into the image plane.
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公开(公告)号：US20220011559A1
公开(公告)日：2022-01-13
申请号：US17482752
申请日：2021-09-23
Applicant: Abberior Instruments GmbH
Inventor： Roman Schmidt , Lars Kastrup
Abstract: An apparatus for detecting movements of a sample with respect to an objective comprises imaging optics which include the objective, which have an image plane and which are configured to image light from at least one reference object that is connected to the sample arranged in front of the objective into reference object images in the image plane. The apparatus further comprises a camera which is arranged in the image plane of the imaging optics and which is configured to record the reference object images at consecutive points in time, and an optical device arranged between the objective and the camera in a plane that is Fourier-conjugated with respect to the image plane. The optical device is configured to mask out low spatial frequencies of reference object images which the imaging optics image into the image plane.
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10.发明申请公开(公告)号：US20170212340A1
公开(公告)日：2017-07-27
申请号：US15413890
申请日：2017-01-24
Applicant: Abberior Instruments GmbH
Inventor： Benjamin Harke , Matthias Reuss , Lars Kastrup
CPC classification number: G02B21/0032 , G01N21/6458 , G02B21/0076 , G02B21/16 , G02B27/58
Abstract: A high resolution laser scanning microscope has beam shaping elements configured to shape a beam of fluorescence inhibiting light which is directed into a back aperture of an objective connected to form an intensity minimum delimited by intensity maxima of the fluorescence inhibiting light in a focus of the objective. A plurality of optical elements including the objective and the beam shaping elements are arranged in a beam path of the beam to the focus. Using the microscope includes removing or exchanging or altering or adding at least one of the optical elements arranged in the beam path of the beam of fluorescence inhibiting light, and compensating a variation of polarization varying properties of the plurality of the optical elements, that is caused by removing or exchanging or altering or adding the at least one optical element, by adapting the beam shaping elements to the variation.
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