公开(公告)号：US20240019493A1

公开(公告)日：2024-01-18

申请号：US17866342

申请日：2022-07-15

Applicant: Advanced Micro Devices, Inc.

Inventor： SongGan Zang ,  Qi Shao ,  Lifeng Zhang ,  Ahmet Tokuz ,  Lu Lu

IPC: G01R31/3185 ,  G01R31/28

CPC classification number: G01R31/318583 ,  G01R31/318572 ,  G01R31/2834

Abstract: A system and method for efficiently routing scan data between two dies used in three-dimensional packaging are described. In various implementations, a computing system includes at least a first semiconductor die (or first die) and a second die connected to one another within a three-dimensional (3D) package. The first die and the second die have multiple non-scan input/output (I/O) data channels between them for data transfer. The non-scan I/O data channels are partitioned into groups. The first die receives a given scan input data bit for testing a device under test (DUT) on the second die. The first die selects a first group of non-scan I/O data channels, and sends, to the second die, a copy of the given scan input data bit on each non-scan I/O data channel of the first group. The second die uses a voter circuit to determine the value of the given scan input data bit.

公开(公告)号：US12216162B2

公开(公告)日：2025-02-04

申请号：US18364568

申请日：2023-08-03

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： Ahmet Tokuz ,  Saurabh B. Upadhyay

IPC: G01R31/3185 ,  G01R31/3177 ,  G06F11/22

Abstract: A system for performing a scan test of a processor core includes a scan test module and a processor including a processor core and an input/output die, where the input/output die is coupled to the processor core. The scan test module transmits, in parallel to the input/output die, scan test input data. A serializer/deserializer module of the input/output die receives the input data, serializes the input data, and transmits the serialized input data to the processor core. A serializer/deserializer module of the processor core receives the serialized scan test input data, deserializes the input data, receives result data generated in dependence upon the input data, serializes the result data, and transmits the serialized result data to the input/output die. The input/output die serializer/deserializer module receives the result data, deserializes the result data, and provides the result data to the scan test module. Error detection can be carried out through redundancy.

公开(公告)号：US12099091B2

公开(公告)日：2024-09-24

申请号：US17866342

申请日：2022-07-15

Applicant: Advanced Micro Devices, Inc.

Inventor： Songgan Zang ,  Qi Shao ,  Lifeng Zhang ,  Ahmet Tokuz ,  Lu Lu

IPC: G01R31/3185 ,  G01R31/28

CPC classification number: G01R31/318583 ,  G01R31/2834 ,  G01R31/318513 ,  G01R31/318572

Abstract: A system and method for efficiently routing scan data between two dies used in three-dimensional packaging are described. In various implementations, a computing system includes at least a first semiconductor die (or first die) and a second die connected to one another within a three-dimensional (3D) package. The first die and the second die have multiple non-scan input/output (I/O) data channels between them for data transfer. The non-scan I/O data channels are partitioned into groups. The first die receives a given scan input data bit for testing a device under test (DUT) on the second die. The first die selects a first group of non-scan I/O data channels, and sends, to the second die, a copy of the given scan input data bit on each non-scan I/O data channel of the first group. The second die uses a voter circuit to determine the value of the given scan input data bit.

公开(公告)号：US11762017B2

公开(公告)日：2023-09-19

申请号：US17532469

申请日：2021-11-22

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： Ahmet Tokuz ,  Saurabh Upadhyay

IPC: G01R31/3185 ,  G01R31/3177 ,  G06F11/22

CPC classification number: G01R31/318583 ,  G01R31/3177 ,  G01R31/318572 ,  G06F11/2236

Abstract: A system for performing a scan test of a processor core includes a scan test module and a processor including a processor core and an input/output die, where the input/output die is coupled to the processor core. The scan test module transmits, in parallel to the input/output die, scan test input data. A serializer/deserializer module of the input/output die receives the input data, serializes the input data, and transmits the serialized input data to the processor core. A serializer/deserializer module of the processor core receives the serialized scan test input data, deserializes the input data, receives result data generated in dependence upon the input data, serializes the result data, and transmits the serialized result data to the input/output die. The input/output die serializer/deserializer module receives the result data, deserializes the result data, and provides the result data to the scan test module. Error detection can be carried out through redundancy.

公开(公告)号：US11181579B2

公开(公告)日：2021-11-23

申请号：US16658514

申请日：2019-10-21

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： Ahmet Tokuz ,  Saurabh Upadhyay

IPC: G01R31/00 ,  G01R31/3185 ,  G01R31/3177 ,  G06F11/22

Abstract: A system for performing a scan test of a processor core includes a scan test module and a processor including a processor core and an input/output die, where the input/output die is coupled to the processor core. The scan test module transmits, in parallel to the input/output die, scan test input data. A serializer/deserializer module of the input/output die receives the input data, serializes the input data, and transmits the serialized input data to the processor core. A serializer/deserializer module of the processor core receives the serialized scan test input data, deserializes the input data, receives result data generated in dependence upon the input data, serializes the result data, and transmits the serialized result data to the input/output die. The input/output die serializer/deserializer module receives the result data, deserializes the result data, and provides the result data to the scan test module. Error detection can be carried out through redundancy.