公开(公告)号：US20250096136A1

公开(公告)日：2025-03-20

申请号：US18471114

申请日：2023-09-20

Applicant: Advanced Micro Devices, Inc. ,  Xilinx, Inc.

Inventor： Divya Madapusi Srinivas Prasad ,  Gabriel H. Loh ,  Richard Schultz ,  Jeffrey Richard Rearick ,  Shidhartha Das ,  Suresh Ramalingam

IPC: H01L23/528 ,  H01L23/48

Abstract: A disclosed semiconductor device includes (1) a silicon stack comprising a front-side Back-End-of-Line (BEOL) stack and a back side BEOL stack, the front-side BEOL stack comprising a plurality of signal routes and the back-side BEOL stack comprising a plurality of power delivery routes, and (2) a plurality of auxiliary power paths formed within the front-side BEOL stack and electrically coupled to the plurality of power delivery routes of the back-side BEOL stack via a plurality of programmable switches, the plurality of power delivery routes, the plurality of programmable switches, and the plurality of auxiliary power paths forming a programmable power delivery network (PDN). Various other apparatuses, systems, and methods of operation are also disclosed.

公开(公告)号：US11966283B1

公开(公告)日：2024-04-23

申请号：US18072650

申请日：2022-11-30

Applicant: Advanced Micro Devices, Inc.

Inventor： Divya Madapusi Srinivas Prasad ,  Sudhanva Gurumurthi ,  Yasuko Eckert ,  Jeffrey Richard Rearick ,  Sankaranarayanan Gurumurthy ,  Amitabh Mehra ,  Shidhartha Das ,  Alex W. Schaefer ,  Vikram Ramachandra ,  Vilas Sridharan

IPC: G06F11/07 ,  G06F1/30

CPC classification number: G06F11/0793 ,  G06F11/07 ,  G06F1/30 ,  G06F11/0721

Abstract: An exemplary computing device includes a plurality of circuits and/or a plurality of in-situ monitors configured to generate outputs that indicate one or more operating conditions of the circuits. The computing device also includes a system management unit configured to detect a potentially faulty voltage-to-frequency ratio implemented by one of the circuits based at least in part on one or more of the outputs. The system management unit is also configured to modify the potentially faulty voltage-to-frequency ratio based at least in part on one or more of the outputs. Various other devices, systems, and methods are also disclosed.

公开(公告)号：US20240264900A1

公开(公告)日：2024-08-08

申请号：US18625417

申请日：2024-04-03

Applicant: Advanced Micro Devices, Inc.

Inventor： Divya Madapusi Srinivas Prasad ,  Sudhanva Gurumurthi ,  Yasuko Eckert ,  Jeffrey Richard Rearick ,  Sankaranarayanan Gurumurthy ,  Amitabh Mehra ,  Shidhartha Das ,  Alex W. Schaefer ,  Vikram Ramachandra ,  Vilas Sridharan

IPC: G06F11/07 ,  G06F1/30

CPC classification number: G06F11/0793 ,  G06F11/07 ,  G06F1/30 ,  G06F11/0721

Abstract: An exemplary computing device includes a plurality of circuits and/or a plurality of in-situ monitors configured to generate outputs that indicate one or more operating conditions of the circuits. The computing device also includes a system management unit configured to detect a potentially faulty voltage-to-frequency ratio implemented by one of the circuits based at least in part on one or more of the outputs. The system management unit is also configured to modify the potentially faulty voltage-to-frequency ratio based at least in part on one or more of the outputs. Various other devices, systems, and methods are also disclosed.