公开(公告)号：US20170363682A1

公开(公告)日：2017-12-21

申请号：US15183253

申请日：2016-06-15

Applicant: Advanced Semiconductor Engineering, Inc.

Inventor： Yu-Jung CHANG ,  Wei-Kai LIAO ,  Ming-Ching LIN ,  Kuei-Hao TSENG

IPC: G01R31/28

CPC classification number: G01R31/2896 ,  G01R31/046 ,  G01R31/2853 ,  G01R31/31715

Abstract: A testing system includes a subtractor and a divider. The subtractor is configured to receive a first voltage of a circuit being tested and a second voltage of the circuit, and to derive a difference between the first voltage and the second voltage. The divider is configured to receive the difference between the first voltage and the second voltage, and to derive a resistance of the circuit by dividing (i) the difference between the first voltage and the second voltage by (ii) a difference between a first current applied to the circuit and a second current applied to the circuit. The first voltage is corresponding to the first current, and the second voltage is corresponding to the second current.