摘要:
A method of manufacturing an electronic circuit with an integrally formed capability of providing information indicative of a value of a current flowing in the electronic circuit, wherein the method comprises forming an electrically conductive wiring structure on a substrate, configuring a first section of the wiring structure for contributing to a predefined use function of the electronic circuit, and configuring a second section of the wiring structure for providing information indicative of the value of the current flowing in the electronic circuit upon applying a stimulus signal to the second section, wherein at least a part of the configuring of the first section and the configuring of the second section is performed simultaneously.
摘要:
The present invention is directed to methods and apparatuses for performing temporal scanning using ultra-short pulsewidth lasers in which only minimal (micro-scale) mechanical movement is required. The invention also relates to methods for obtaining high-accuracy timing calibration, on the order of femtoseconds. A dual laser system is disclosed in which the cavity of one or more of the lasers is dithered, by using a piezoelectric element. A Fabry-Perot etalon is used to generate a sequence of timing pulses used in conjunction with a laser beam produced by the laser having the dithered laser cavity. A correlator correlates a laser pulse from one of the lasers with the sequence of timing pulses to produce a calibrated time scale. The methods and apparatuses of the present invention are applicable to many applications requiring rapid scanning and time calibration, including, but not limited to metrology, characterization of charge dynamics in semiconductors, electro-optic testing of ultrafast electronic and optoelectronic devices, optical time domain reflectometry, and electro-optic sampling oscilloscopes.
摘要:
A method and device for sampling ultra-fast optical signals by generating a sampling signal comprising a train of short pulses and coupling the sampling signal together with an optical data signal to be sampled into a highly non-linear optical fibre. Four-wave mixing (FWM) occurs between the two signals resulting in a secondary signal output from the fibre consisting of pulsed components having energy proportional to the instantaneous power of points along the data signal. An analysis of this secondary signal can be carried out to create a normal trace or eye-diagram of the data signal.
摘要:
A signal acquisition probing system uses an optical cavity to acquire a signal under test. The probing system has an optical transmitter and receiver that are coupled to the optical cavity via an optical transmission system. The optical cavity has an electrode structure having apertures formed in the optical cavity that are parallel to propagation path of the optical signal within the cavity. A modulated optical signal is generated by the optical cavity in response to the signal under test creating an electro-magnetic field distribution in electro-optic material in the optical cavity that overlaps the optical path of the optical signal propagating in the optical cavity which varies the index of refraction of electro-optic material in the optical path. The signal acquisition probing system is connected to a measurement instrument to form a voltage measurement system.
摘要:
A sampling device that samples a first signal by modulating a second signal using the first signal, comprising: a holding circuit that holds a value of the first signal; a modulator that modulates the second signal using a difference between the value held by the holding circuit and a present value of the first signal to produce a third signal indicating the difference; and an adder that adds the difference indicated by the third signal to the value held by the holding circuit. Preferably, the first signal is an electric signal, the second signal is an optical signal, and the modulator modulates the optical signal by applying to the optical signal an electric field formed by the electric signal.
摘要:
The present invention relates to an electro-optic sampling oscilloscope. This electro-optic sampling oscilloscope carries out measurement of measured signal by using an optical pulse generated based on a timing signal generated from a timing generation circuit synchronous with a trigger signal, providing: a timing generation circuit comprising a fast ramp circuit that outputs a ramp waveform using said trigger signal as a trigger, a slow ramp circuit that increases stepwise and sequentially the output value according to said timing signal; a comparator circuit that compares the output of said fast ramp circuit and the output of said slow ramp circuit and outputs the results of this comparison; and a gate circuit that limits the output of said comparator circuit by closing a gate only when the output of said comparator circuit is unstable based on the input trigger signal and timing signal.
摘要:
The present invention is directed to methods and apparatuses for performing temporal scanning using ultra-short pulsewidth lasers in which only minimal (micro-scale) mechanical movement is required. The invention also relates to methods for obtaining high-accuracy timing calibration, on the order of femtoseconds. A dual laser system is disclosed in which the cavity of one or more of the lasers is dithered, by using a piezoelectric element. A Fabry-Perot etalon is used to generate a sequence of timing pulses used in conjunction with a laser beam produced by the laser having the dithered laser cavity. A correlator correlates a laser pulse from one of the lasers with the sequence of timing pulses to produce a calibrated time scale. The methods and apparatuses of the present invention are applicable to many applications requiring rapid scanning and time calibration, including, but not limited to metrology, characterization of charge dynamics in semiconductors, electro-optic testing of ultrafast electronic and optoelectronic devices, optical time domain reflectometry, and electro-optic sampling oscilloscopes.
摘要:
A device and a process for enabling an incident wide bandwidth (greater than about 1 GHz) short duration (less than about 10 microseconds) individual pulse of electromagnetic radiation to be digitally sampled at a sampling rate that is achievable by available digital sampling circuits. The incident pulse is modulated onto an optical signal to form a modulated optical signal and the whole, or successive or randomly selected parts, of the modulated optical signal are replicated using optical time delay means. The resulting plurality of modulated optical signal representations of the whole or parts of the incident pulse can then be digitally sampled at a sampling rate which is reduced in proportion to the number of replications to obtain a complete digital representation of the incident pulse.
摘要:
An electrooptic effect element of this invention has first, second, and third electrodes. The first and second electrodes are formed on a substrate having an electrooptic effect, in order to form a high-frequency electric field for polarizing a light beam, thus constituting a microstrip line, as in the conventional element. The third electrode is spaced apart from the second electrode on the substrate in order to form another electric field for canceling the polarized light by the high-frequency electric field. In an electrical signal waveform measuring apparatus of this invention, an electrical signal obtained from an optical detection system coupled to the electrooptic effect element is fed back to form a closed loop in the third electrode.
摘要:
A high speed test system for performing tests on various electrical devices including integrated circuits and semiconductor wafers at device operating speeds in the Gigahertz range. The test system including a test head having a test platform for receiving an adapter board that holds the device under test. The test platform is exposed on one side of the test head to facilitate readily changing the tested devices and easy coupling with conventional wafer prober machines. A plurality of pin driver boards are positioned radially about the test platform to minimize the distance between the device under test and the pin driver boards. Electrical signals presented at specific locations on the device under test are measured in response to the inputted signals form the pin drivers using an electro-optic sensor preferably located central of the pin driver boards and within 1.0 cm of the device under test to minimize pin capacitance. A cooling system is provided to maintain the pin drivers at a substantially constant temperature during operation to minimize pin driver timing drift. An optical system directs light towards the electro-optic sensor through an optical path located centrally of the pin driver boards.