摘要:
Methods are provided for improving the efficiency of clock gating within low power clock trees. In a first aspect, a correlation level between a plurality of clock gating signals and their corresponding gates which gate a source clock is determined. The clock gating signals and their corresponding gates are combined into a single clock gating signal and a single corresponding gate if a preselected level of correlation exists therebetween. In a second aspect, an area overlap is determined for a plurality of sinks, and one of the gated drovers of the sinks is removed. The sinks of the removed gated driver then are connected to a remaining gated driver driven by a single clock gating signal and a single corresponding gate. In a third aspect, physically proximate sink clusters are rewired to generate a pure clock gating group within each sink cluster if rewiring the clusters increases wiring length by less than a predetermined amount. In a fourth aspect, a clock gating group is selected and the power dissipation is computed for all sinks within the selected group assuming all the sinks therein are wired without clock gating. The power dissipation also is computed assuming all the sinks therein are gated. If the power dissipation for all sinks within the selected group is reduced by individually wiring the sinks therein, the group is ungated. A computer program product also is provided having a computer readable medium with means for performing the first, second, third and/or fourth aspects of the invention.
摘要:
A differential sinusoidal signal pair is generated on an integrated circuit (IC). The differential sinusoidal signal pair is distributed to clock receiver circuits, which may be differential amplifiers. The clock receiver circuits receive the differential sinusoidal signal pair and convert the differential sinusoidal pair to local clock signals. Power consumption and noise generation are reduced as compared to conventional clock signal distribution arrangements.
摘要:
A test board includes a plurality of sockets for connection to a plurality of integrated circuit chips to be tested. A test control device on the board turns on at least one test engine for testing the plurality of chips simultaneously. A checking circuit verifies the functionality of each chip by comparing outputs of chips with each other or with a golden chip. Failing Chips are disconnected from further testing and passing or failing chips are recorded.
摘要:
An electrical wiring structure and a computer system for designing the electrical wiring structure. The electrical wiring structure includes a wire pair. The wire pair includes a first wire and a second wire. The second wire is slated for being tri-stated. The wire pair has a same-direction switching probability φSD per clock cycle that is no less than a pre-selected minimum same-direction switching probability φSD,MIN or has an opposite-direction switching probability φOD per clock cycle that is no less than a pre-selected minimum opposite-direction switching probability φOD,MIN. The first wire and the second wire satisfies at least one mathematical relationship involving LCOMMON and WSPACING, where WSPACING is defined as a spacing between the first wire and the second wire, and LCOMMON is defined as a common run length of the first wire and the second wire.
摘要:
An electrical wiring structure and method of designing thereof. The method identifies at least one wire pair having a first wire and a second wire. The second wire is already tri-stated or can be tri-stated. The wire pair may have a same-direction switching probability per clock cycle that is no less than a predetermined or user-selected minimum same-direction switching probability. Alternatively, the wire pair may have an opposite-direction switching probability per clock cycle that is no less than a predetermined or user-selected minimum opposite-direction switching probability. The first wire and the second wire satisfy at least one mathematical relationship involving: a spacing between the first wire and the second wire; and a common run length of the first wire and the second wire.
摘要:
A logic circuit device and circuit design methodology includes a “split-book” logic circuit design having different active device sizes with outputs for connections to both critical and non-critical digital circuit paths. By using “split” book designs with separate input and output stages, better silicon utilization, power optimization, and performance results. This is because each split book is designed with multiple output buffers that may be configured to optimally drive critical and non-critical paths. During the power/performance optimization phase of the design, timing critical paths of the design are first identified, with each path being optimized on its own basis. First the input stage of the strand may be improved with a stronger drive on the input port of the book. Only the input port that has been linked to a critical path is updated. The other input pins are left at their default setting. Then, the output buffers may then be connected together according to criticality of the path and net capacitive load they are driving. Different split book input/output circuit combinations may be attempted during the design phase until an optimal tradeoff between power optimization and performance is reached.