Assisted sideband traffic management

    公开(公告)号:US10917362B1

    公开(公告)日:2021-02-09

    申请号:US16009141

    申请日:2018-06-14

    Abstract: Disclosed is a network device, comprising a first network interface port, a second network interface port, and a processor coupled to the first network interface port and the second network interface port. The processor can be configured to operate in a first switching mode to receive network control packets via the first network interface port and transmit the received network control packets via the second network interface port. The processor can also be configured operate in a second communications mode to receive and transmit network communication packets using the first network interface independently of the operation in the first switching mode.

    Assisted sideband traffic management

    公开(公告)号:US10003554B1

    公开(公告)日:2018-06-19

    申请号:US14979319

    申请日:2015-12-22

    CPC classification number: H04L49/25 H04L49/30

    Abstract: Disclosed is a network device, comprising a first network interface port, a second network interface port, and a processor coupled to the first network interface port and the second network interface port. The processor can be configured to operate in a first switching mode to receive network control packets via the first network interface port and transmit the received network control packets via the second network interface port. The processor can also be configured operate in a second communications mode to receive and transmit network communication packets using the first network interface independently of the operation in the first switching mode.

    Cross-platform device testing through low level drivers

    公开(公告)号:US09791506B1

    公开(公告)日:2017-10-17

    申请号:US14925044

    申请日:2015-10-28

    CPC classification number: G01R31/31907 G01R31/31919

    Abstract: In one example case, a cross-platform system includes a first automated test platform having a first test instrument and a first glue layer interface that exposes test functions to direct testing by the first test instrument. The system further includes a second automated test platform having a second test instrument and a second glue layer interface that exposes the same test functions to direct testing by the second test instrument. In the system, the glue layers abstract the respective and different control commands used by the different, first and second test instruments. Using the glue layers, the same higher-level test code can be executed by the control computers of both the first and second automated test platforms.

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