Abstract:
A method for imaging a surface, including scanning a first region of the surface with a primary charged particle beam at a first scan rate so as to generate a first secondary charged particle beam from the first region, and scanning a second region of the surface with the primary charged particle beam at a second scan rate faster than the first scan rate so as to generate a second secondary charged particle beam from the second region. The method also includes receiving the first secondary charged particle beam and the second secondary charged particle beam at a detector configured to generate a signal in response to the beams, and forming an image of the first and the second regions in response to the signal.
Abstract:
A method for imaging a surface, including scanning a first region of the surface with a primary charged particle beam at a first scan rate so as to generate a first secondary charged particle beam from the first region, and scanning a second region of the surface with the primary charged particle beam at a second scan rate faster than the first scan rate so as to generate a second secondary charged particle beam from the second region. The method also includes receiving the first secondary charged particle beam and the second secondary charged particle beam at a detector configured to generate a signal in response to the beams, and forming an image of the first and the second regions in response to the signal.
Abstract:
A method and an inspection system that exhibiting speckle reduction characteristics includes a light source arranged to generate input light pulses, and diffuser-free speckle reduction optics that include a beam splitter, for splitting an input light pulse from the light source into multiple light pulses that are oriented at angles in relation to each other when exiting the beam splitter, and at least one optical element for directing the multiple light pulses to impinge on an inspected object at different angles.
Abstract:
An apparatus for providing a light beam with spatially varying polarization. The apparatus includes: two circumferentially curved reflectors positioned substantially opposite each other, a polarizer positioned in an optical path between the two reflectors, for polarizing light reflected from one reflector before it reaches the other. A non-polarized light beam incident along a given axis on one of the reflectors is radially reflected off that reflector, acquires predetermined polarization from the polarizer and is then reflected off the second reflector to a light beam of spatially varying polarization.
Abstract:
A method and an inspection system that exhibiting speckle reduction characteristics includes a light source arranged to generate input light pulses, and diffuser-free speckle reduction optics that include a beam splitter, for splitting an input light pulse from the light source into multiple light pulses that are oriented at angles in relation to each other when exiting the beam splitter, and at least one optical element for directing the multiple light pulses to impinge on an inspected object at different angles.
Abstract:
An apparatus for providing a light beam with spatially varying polarization. The apparatus comprises: two circumferentially curved reflectors positioned substantially opposite each other, a polarizer positioned in an optical path between the two reflectors, for polarizing light reflected from one reflector before it reaches the other. A non-polarized light beam incident along a given axis on one of the reflectors is radially reflected off that reflector, acquires predetermined polarization from the polarizer and is then reflected off the second reflector to a light beam of spatially varying polarization.