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    VARIABLE RATE SCANNING IN AN ELECTRON MICROSCOPE
    4.
    发明申请
    VARIABLE RATE SCANNING IN AN ELECTRON MICROSCOPE 有权
    电子显微镜中的可变速率扫描

    公开(公告)号：US20100072365A1

    公开(公告)日：2010-03-25

    申请号：US12237364

    申请日：2008-09-24

    Applicant: Amir Shoham ,  Benzion Sender ,  Alon Litman

    Inventor： Amir Shoham ,  Benzion Sender ,  Alon Litman

    IPC: G01N23/00

    CPC classification number: H01J37/28 ,  G01N23/2208 ,  G01N23/2251 ,  H01J37/222 ,  H01J2237/221 ,  H01J2237/24495 ,  H01J2237/2809 ,  H01J2237/2823

    Abstract: A method for imaging a surface, including scanning a first region of the surface with a primary charged particle beam at a first scan rate so as to generate a first secondary charged particle beam from the first region, and scanning a second region of the surface with the primary charged particle beam at a second scan rate faster than the first scan rate so as to generate a second secondary charged particle beam from the second region. The method also includes receiving the first secondary charged particle beam and the second secondary charged particle beam at a detector configured to generate a signal in response to the beams, and forming an image of the first and the second regions in response to the signal.

    Abstract translation: 一种用于对表面进行成像的方法，包括以第一扫描速率用初级带电粒子束扫描表面的第一区域，以便产生来自第一区域的第一次级带电粒子束，以及扫描表面的第二区域， 所述初级带电粒子束以比所述第一扫描速率快的第二扫描速率，以便从所述第二区域产生第二次级带电粒子束。 该方法还包括在被配置为响应于光束产生信号的检测器处接收第一次级带电粒子束和第二次级带电粒子束，并且响应于该信号形成第一和第二区域的图像。

    Method for rapid analysis of gold
    9.
    发明授权
    Method for rapid analysis of gold 有权
    黄金快速分析方法

    公开(公告)号：US09528951B2

    公开(公告)日：2016-12-27

    申请号：US15104279

    申请日：2014-12-16

    Applicant: COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION

    Inventor： James Tickner ,  Greg Roach

    IPC: G01N23/221 ,  G01N23/22 ,  A61B6/00

    CPC classification number: G01N23/221 ,  A61B6/4258 ,  G01N23/2208 ,  G01N2223/07 ,  G01N2223/072 ,  G01N2223/074 ,  G01N2223/1016 ,  G01N2223/3037 ,  G01N2223/616 ,  G21G1/12

    Abstract: A method to determine a concentration of a target element in a sample is provide. The method comprises (i) positioning a sample containing a target element with respect to a reference material containing a reference element, (ii) simultaneously irradiating the sample and the reference material with Bremsstrahlung X-rays to thereby produce activated nuclei in the target element and to produce activated nuclei in the reference element, (iii) detecting deactivation gamma-rays' from the irradiated sample and deactivation gamma-rays from the irradiated reference material, (iv) determining a first number of detected deactivation gamma-rays from the irradiated sample and a second number of detected deactivation gamma-rays from the reference material, and (v) determining the concentration of the target element in the sample by first normalising the first number of detected deactivation gamma-rays from the irradiated sample by the second number of detected deactivation gamma-rays from the reference material. The variation of the reference element to target element cross section ratio over a range of electron beam energies is less than a predetermined measurement accuracy.

    Abstract translation: 提供了确定样品中目标元素浓度的方法。 该方法包括（i）相对于包含参考元件的参考材料定位包含目标元素的样品，（ii）用Bre致辐射X射线同时照射样品和参考物质，从而在目标元素中产生活化的核， 在参考元件中产生活化的核，（iii）从照射的样品中检测去激活的γ射线，以及从照射的参考物质中去激活γ射线，（iv）从被照射样品中确定检测到的去激活γ射线的第一数量 和来自所述参考物质的检测到的去激活γ射线的第二数量，以及（v）通过首先将来自被照射的样品的检测到的去激活γ射线的第一数量归一化来确定样品中目标元素的浓度第二数目 检测到来自参考物质​​的失活γ射线。 参考元件与目标元件截面比在电子束能量范围内的变化小于预定的测量精度。

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