公开(公告)号：US12216164B2

公开(公告)日：2025-02-04

申请号：US17904935

申请日：2021-02-24

Applicant: Analog Devices, Inc.

Inventor： Michael E. Harrell ,  Anthony Eric Turvey ,  Stefano I D'Aquino ,  Jennifer W. Pierdomenico

IPC: G01R31/28 ,  G01R31/319 ,  H03F1/52 ,  H03F3/04 ,  H03F3/16

Abstract: A clamp circuit comprises an output transistor and a replica transistor coupled as a current minor pair, wherein the replica transistor is scaled in size to the output transistor by a size ratio; a first current source configured to set a current in the replica transistor, wherein the output current is set at a clamped output current value that is a sum of current of the first current source and a scaled value of the current of the first current source determined according to the size ratio; and a register circuit, wherein a register value stored in the register circuit sets the clamped output current value.

公开(公告)号：US11940496B2

公开(公告)日：2024-03-26

申请号：US17904931

申请日：2021-02-24

Applicant: Analog Devices, Inc.

Inventor： Michael E. Harrell ,  Anthony Eric Turvey ,  Stefano I D'Aquino ,  Jennifer W. Pierdomenico

IPC: G01R31/319 ,  G01R31/28 ,  H03F1/52 ,  H03F3/04 ,  H03F3/16

CPC classification number: G01R31/31924 ,  G01R31/2834 ,  H03F1/523 ,  H03F3/04 ,  H03F3/16 ,  H03F2200/441

Abstract: An automated testing system comprises a high side switch circuit coupled to an input/output (I/O) connection, a low side switch circuit coupled to the I/O connection, a high side force amplifier (HFA) coupled to the high side switch, a low side force amplifier (LFA) coupled to the low side switch, an adjusting circuit coupled to the HFA and the LFA, and a control circuit configured to change the adjusting circuit to change control of current at the I/O connection from one of the HFA or LFA to the other of the HFA or LFA.

公开(公告)号：US20230176110A1

公开(公告)日：2023-06-08

申请号：US17904935

申请日：2021-02-24

Applicant: Analog Devices, Inc.

Inventor： Michael E. Harrell ,  Anthony Eric Turvey ,  Stefano I D'Aquino ,  Jennifer W. Pierdomenico

IPC: G01R31/28 ,  H03F3/16 ,  H03F1/52

CPC classification number: G01R31/2834 ,  H03F3/16 ,  H03F1/523 ,  H03F2200/441

Abstract: A clamp circuit comprises an output transistor and a replica transistor coupled as a current minor pair, wherein the replica transistor is scaled in size to the output transistor by a size ratio; a first current source configured to set a current in the replica transistor, wherein the output current is set at a clamped output current value that is a sum of current of the first current source and a scaled value of the current of the first current source determined according to the size ratio; and a register circuit, wherein a register value stored in the register circuit sets the clamped output current value.

公开(公告)号：US20230114208A1

公开(公告)日：2023-04-13

申请号：US17904931

申请日：2021-02-24

Applicant: Analog Devices, Inc.

Inventor： Michael E. Harrell ,  Anthony Eric Turvey ,  Stefano I D'Aquino ,  Jennifer W. Pierdomenico

IPC: G01R31/319 ,  H03F3/04

Abstract: An automated testing system comprises a high side switch circuit coupled to an input/output (I/O) connection, a low side switch circuit coupled to the I/O connection, a high side force amplifier (HFA) coupled to the high side switch, a low side force amplifier (LFA) coupled to the low side switch, an adjusting circuit coupled to the HFA and the LFA, and a control circuit configured to change the adjusting circuit to change control of current at the I/O connection from one of the HFA or LFA to the other of the HFA or LFA.