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Patent Agency Ranking
公开(公告)号：US20250150037A1
公开(公告)日：2025-05-08
申请号：US18504753
申请日：2023-11-08
Applicant: Analog Devices, Inc.
Inventor： Wei Wang , Michael E. Harrell , Thomas A. Spargo , Angel Rael
Abstract: A capacitive load, an inductive load, or a transmission line coupled to an output of a closed-loop amplifier circuit can cause undesirable oscillations in a feedback signal of the amplifier circuit. The oscillations in the feedback signal can cause the amplifier circuit to exhibit instability and unpredictable behavior. Techniques are described that allow an amplifier circuit to provide a stable response while driving a capacitive load.
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公开(公告)号：US12216164B2
公开(公告)日：2025-02-04
申请号：US17904935
申请日：2021-02-24
Applicant: Analog Devices, Inc.
IPC: G01R31/28 , G01R31/319 , H03F1/52 , H03F3/04 , H03F3/16
Abstract: A clamp circuit comprises an output transistor and a replica transistor coupled as a current minor pair, wherein the replica transistor is scaled in size to the output transistor by a size ratio; a first current source configured to set a current in the replica transistor, wherein the output current is set at a clamped output current value that is a sum of current of the first current source and a scaled value of the current of the first current source determined according to the size ratio; and a register circuit, wherein a register value stored in the register circuit sets the clamped output current value.
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公开(公告)号：US11940496B2
公开(公告)日：2024-03-26
申请号：US17904931
申请日：2021-02-24
Applicant: Analog Devices, Inc.
IPC: G01R31/319 , G01R31/28 , H03F1/52 , H03F3/04 , H03F3/16
CPC classification number: G01R31/31924 , G01R31/2834 , H03F1/523 , H03F3/04 , H03F3/16 , H03F2200/441
Abstract: An automated testing system comprises a high side switch circuit coupled to an input/output (I/O) connection, a low side switch circuit coupled to the I/O connection, a high side force amplifier (HFA) coupled to the high side switch, a low side force amplifier (LFA) coupled to the low side switch, an adjusting circuit coupled to the HFA and the LFA, and a control circuit configured to change the adjusting circuit to change control of current at the I/O connection from one of the HFA or LFA to the other of the HFA or LFA.
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公开(公告)号：US20230176110A1
公开(公告)日：2023-06-08
申请号：US17904935
申请日：2021-02-24
Applicant: Analog Devices, Inc.
CPC classification number: G01R31/2834 , H03F3/16 , H03F1/523 , H03F2200/441
Abstract: A clamp circuit comprises an output transistor and a replica transistor coupled as a current minor pair, wherein the replica transistor is scaled in size to the output transistor by a size ratio; a first current source configured to set a current in the replica transistor, wherein the output current is set at a clamped output current value that is a sum of current of the first current source and a scaled value of the current of the first current source determined according to the size ratio; and a register circuit, wherein a register value stored in the register circuit sets the clamped output current value.
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公开(公告)号：US20230114208A1
公开(公告)日：2023-04-13
申请号：US17904931
申请日：2021-02-24
Applicant: Analog Devices, Inc.
IPC: G01R31/319 , H03F3/04
Abstract: An automated testing system comprises a high side switch circuit coupled to an input/output (I/O) connection, a low side switch circuit coupled to the I/O connection, a high side force amplifier (HFA) coupled to the high side switch, a low side force amplifier (LFA) coupled to the low side switch, an adjusting circuit coupled to the HFA and the LFA, and a control circuit configured to change the adjusting circuit to change control of current at the I/O connection from one of the HFA or LFA to the other of the HFA or LFA.
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